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ECE 342 Electronic Circuits 2. MOS Transistors

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Presentation on theme: "ECE 342 Electronic Circuits 2. MOS Transistors"— Presentation transcript:

1 ECE 342 Electronic Circuits 2. MOS Transistors
Jose E. Schutt-Aine Electrical & Computer Engineering University of Illinois

2 NMOS Transistor sedr42021_0401a.jpg Typically L = 0.1 to 3 mm, W = 0.2 to 100 mm, and the thickness of the oxide layer (tox) is in the range of 2 to 50 nm.

3 NMOS Transistor NMOS Transistor N-Channel MOSFET
Built on p-type substrate MOS devices are smaller than BJTs MOS devices consume less power than BJTs

4 NMOS Transistor - Layout
Top View Cross Section

5 MOS Regions of Operation
Resistive Triode Nonlinear Saturation Active

6 MOS Transistor Operation
As VG increases from zero Holes in the p substrate are repelled from the gate area leaving negative ions behind A depletion region is created No current flows since no carriers are available As VG increases The width of the depletion region and the potential at the oxide-silicon interface also increase When the interface potential reaches a sufficiently positive value, electrons flow in the “channel”. The transistor is turned on As VG rises further The charge in the depletion region remains relatively constant The channel current continues to increase

7 MOS – Triode Region - 1 Cox: gate oxide capacitance
m: electron mobility L: channel length W: channel width VT: threshold voltage

8 MOS – Triode Region FET is like a linear resistor with

9 MOS – Triode Region - 2 Charge distribution is nonuniform across channel Less charge induced in proximity of drain

10 MOS – Active Region Saturation occurs at pinch off when (saturation)

11 NMOS – Drain Current sedr42021_0406.jpg

12 NMOS – Circuit Symbols sedr42021_0410a.jpg

13 NMOS – IV Characteristics
sedr42021_0411a.jpg characteristics for a device with k’n (W/L) = 1.0 mA/V2.

14 MOS Threshold Voltage The value of VG for which the channel is “inverted” is called the threshold voltage VT (or Vt ). Characteristics of the threshold voltage Depends on equilibrium potential Controlled by inversion in channel Adjusted by implantation of dopants into the channel Can be positive or negative Influenced by the body effect

15 nMOS Device Types Enhancement Mode
Normally off & requires positive potential on gate Good at passing low voltages Cannot pass full VDD (pinch off) Depletion Mode Normally on (negative threshold voltage) Channel is implanted with positive ions (VT ) Provides inverter with full output swings

16 Types of MOSFETS sedr42021_0462.jpg

17 MOS – Active Region Channel is pinched off
Saturation Channel is pinched off Increase in VDS has little effect on iD Square-law behavior wrt (VGS-VT) Acts like a current source

18 Diode-Connected Transistor
When the drain and gate of a MOSFET are connected together the result is a two-terminal device known as a diode-connected transistor sedr42021_p04018a.jpg for saturation region. Since VGD is zero, then the device is always in the saturation region.

19 Diode-Connected Transistor
incremental resistance

20 Example Find Cox and kn’= mnCox
An MOS process technology has Lmin= 0.4 mm, tox= 8 nm, m = 450 cm2/V.s, VT = 0.7V Find Cox and kn’= mnCox W/L = 8 mm/0.8mm. Calculate VGS, VDSmin for operation in saturation with ID= 100 mA Find VGS for the device in (b) to operate as a 1 kW resistor for small vDS

21 Example - Solution For operation in saturation region

22 Example – (con’t) Triode region with vDS very small

23 Body Effect The body effect
VT varies with bias between source and body Leads to modulation of VT Potential on substrate affects threshold voltage Fermi potential of material Body bias coefficient

24 Channel-Length Modulation
With depletion layer widening, the channel length is in effect reduced from L to L-DL  Channel-length modulation This leads to the following I-V relationship Where l is a process technology parameter

25 Channel-Length Modulation
Channel-length modulation causes iD to increase with vDS in saturation region

26 Problem A MOSFET has VT = 1 V with measured data: VGS(V) VDS(V) ID(mA)
Find l

27 Problem (cont’) Find iD at pinchoff VDSP = VGS-VT =1V

28 Problem (cont’)

29 NMOS IV Curves

30 NMOS IV Curves sedr42021_0427.jpg

31 MOSFET Circuit at DC – Problem 1
The MOSFET in the circuit shown has Vt = 1V, kn’= 100mA/V2 and l = 0. Find the required values of W/L and of R so that when vI=VDD=+5 V, rDS=50 W and vo= 50 mV. sedr42021_p04041.jpg

32 MOSFET Circuit at DC – Problem 1 (cont’)
sedr42021_p04038.jpg

33 MOSFET Circuit at DC – Problem 2
The NMOS transistors in the circuit shown have Vt = 1V, mnCox = 120mA/V2, l = 0 and L1=L2=1mm. Find the required values of gate width for each of Q1 and Q2 and the value of R, to obtain the voltage and current values indicated. sedr42021_p04037.jpg

34 Gate Capacitance Depends on bias Fringing fields are present
Account for overlap C

35 Capacitance Gate Capacitance
CG determines the amount of charge to switch gate Several distributed components Large discontinuity as device turns on At saturation capacitance is entirely between gate and source Define

36 MOS Capacitances Expect capacitance between every two of the four terminals.

37 MOS Parasitics Capacitance from gate to other 3 terminals
Diodes to body Series resistance Wiring parasitics

38 PMOS Transistor All polarities are reversed from nMOS
vGS, vDS and Vt are negative Current iD enters source and leaves through drain Hole mobility is lower  low transconductance nMOS favored over pMOS

39 PMOS Circuit The PMOS transistor in the circuit shown has Vt = -0.7 V, mpCox = 60mA/V2, l = 0 and L=0.8mm. Find the values required for W and R, in order to establish a drain current of 115 mA and a voltage VD of 3.5 V. sedr42021_p04036.jpg


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