1 Confidential Reliability of Spring Contacts n Basics of electrical spring contacts n Micro-vibration n Temperature cycling n Industrial atmosphere n.

Slides:



Advertisements
Similar presentations
Spring Terminal Technology
Advertisements

PAGE 1 Product Quality & Reliability Drop, Tumble Seal & Accelerated Failure Mode (AFM) MC95 Andrew Biondo Director Quality Engineering.
1 CTIS # Prepared By John Yurtin Updated Connection Systems Training Terminal Plating.
ENIG Finishing and „Black Pad“ Phenomenon
Thermal properties of laser crystal Rui Zhang ACCL Division V, RF-Gun Group Feb 20, 2015 SuperKEKB Injector Laser RF Gun Review.
Explosive joining of dissimilar metals: experiment and numerical modeling Anan’ev S.Yu., Andreev A.V., Deribas A.A., Yankovskiy B.D. Joint Institute for.
A No-Power MEMS Shock Sensor Luke Currano U.S. Army Research Laboratory September 12, 2005.
Wafer Level Packaging: A Foundry Perspective
3441 Industrial Instruments 1 Chapter 5 Mechanical Sensors
Thermal Analysis of Two Braze Alloys to Improve the Performance of a Contactor During the Temperature Rise Test G. Contreras 1, E. Gutierrez-Miravete 2.
UN Informal Working Group Meeting on Lithium Battery Tests Ideas to Address Problems Testing Large and Small Cells and Batteries George A. Kerchner Executive.
PND Connector Purpose: JST is proud to Introduce the PND disconnectable crimp style connector. Responding to the needs of the ever expanding market, this.
Wendell Johnson Applications Engineer, Resistance and Solid- State Welding Phone: Reversible Battery.
ECE5320 Mechatronics Assignment#01: Literature Survey on Sensore and Actuators Topic: Quartz Crystal Microbalances Prepared by: Jack J Stepan Dept. of.
JEDEC Standards -Nicole Okamoto and Widah Saied
Customized equipment for Printed circuit board industry Microelectronic industry Solar cell industry.
CHE/ME 109 Heat Transfer in Electronics LECTURE 7 – EXAMPLES OF CONDUCTION MODELS.
Thermal Analysis of Two Braze Alloys to Improve the Performance of a Contactor During the Temperature Rise Test G. Contreras 1, E. Gutierrez-Miravete 2.
Proton Source Workshop December 7 & 8, 2010 John Reid December 8, 2010.
Regional Sales Manager
ENVIRONMENTAL TESTING OVERVIEW QUALIFICATION TESTS MIL-STD-810 F PRODUCTION SCREENING HIGH ACCELERATED TESTS (HALT & HASS) ENVIRONMENTAL STRESSES SCREENING.
Commercial Portfolio Overview – Rev. 1 Commercial Portfolio Minitek Pwr™ Hybrid 4.2 & 3.0 March 2015.
Model Continuous Workstation Monitor, Dual Wire ©Copyright 2003 DESCO INDUSTRIES INC.
EKT314/4 Electronic Instrumentation
Ian Frank Matt Walter Jesse Steiner Luke Spencer Mike Celentano Nick Balducci Team Lead Chief Engineer Electrical Engineer Industrial Engineer Electrical.
1 CTIS # Prepared By John Yurtin Updated Connection Systems Training Vibration & Fretting Corrosion Vibration.
1 High Speed Interconnect Solutions Page 1 High Speed Interconnect Solutions © , HIROSE ELECTRIC CO., LTD. All rights reserved. Rev RSM – April,
Transducer Device when activated from one form energy converted to another quantity or Device which converts one physical quantity or condition to another.
Cooling of power semiconductor devices
ISAT 303-Lab3-1  Measurement of Condition: Lab #3 (2005):  List of parameters of condition: –Linear distance, angular displacement, vibration, displacement,
Cooling design of the frequency converter for a wind power station
PACKAGING SOLUTIONS Christian Ganninger Product Manager MicroTCA, Backplanes and PSU EMEA  : : Rugged.
LEAR Terminals & Connectors
Structural Dynamics & Vibration Control Lab 1 December Department of Civil & Environmental Engineering K orea A dvanced I nstitute of S cience.
PT.YOKOGAWA INDONESIA Environment Diagnosis ( ED ) by Service & Business Department.
Module 1, Part 3: Process validation Slide 1 of 22 © WHO – EDM – 12/2001 Validation Part 3: Process validation Supplementary Training Modules on Good Manufacturing.
Table of Content – High Power Connector Power + Signal, Blade Style Contact Table of Content – High Power Connector Power + Signal, Blade Style Contact.
National Highway Traffic Safety Administration Shock/Vibration/ Thermal Cycling Nha Nguyen NHTSA 1.
Outdoor (ISO ) and indoor (ISO 11844) classification
T.Schneider/LHCb Muon EDR
IPC Vibration Design The design of printed boards that will be subjected to vibration while in service requires that special consideration be.
1 HD SIGNAL CONDITIONER SERIES POWER DISTRIBUTOR TRANSMITTER MODEL HD-IPC MODEL & SUFFIX CODE SELECTION HD-IPC MODEL ■ Input signal ■ Output1 signal ■
Effect of Humidity on Partial Discharge Characteristics Zainuddin Nawawi* Yuji Muramoto Naohiro Hozumi and Masayuki Nagao Proceedings of the 7 th International.
Project logo / LP logo EUROPEAN UNION GOVERNMENT OF ROMANIA SERBIAN GOVERNMENT Structural Funds Common borders. Common solutions. Romania – Republic.
1 HD SIGNAL CONDITIONER SERIES SAMPLE HOLD TRANSMITTER MODEL HD-SHC MODEL & SUFFIX CODE SELECTION HD-SHC MODEL ■ Output2 signal Availability as Output1.
SPIE'031 Evaluation of Micromachined Relays for Space Applications Alexander Teverovsky, QSS/Goddard Operations
Page 1 WIMA Snubber / GTO Capacitors.
1 HD SIGNAL CONDITIONER SERIES LIMITER TRANSMITTER MODEL HD-LIM MODEL & SUFFIX CODE SELECTION HD-LIM MODEL ■ Output1 signal ■ Output2 signal Availability.
SPECIFICATIONS FOR APPROVAL CUSTOMER : LG 전자 ( 주 ) GSM 사업부 No. : 01(OR)SA-022 EDIT : 0 (1/9) DATE : 2001/11/09 PRODUCT : 1608 BLUE SMD LED MODEL NAME :
Cooling of GEM detector CFD _GEM 2012/03/06 E. Da RivaCFD _GEM1.
Programmable Logic Controller & Distributed Control System Yoon-Je Choi 17 th June 2006.
CORP3397 Clarification Meeting Technical Evaluation of Meters Enquiry Date: 5 February 2016 Presenter: Mohamed Omar.
E Control Devices have a wide range of Latching Relays. The range of latching includes Relays, 16 Amp Latching Relays, 30Amp Latching Relays, 80 Amp Latching.
Copyright © 2012 Rockwell Automation, Inc. All rights reserved.Rev 5058-CO900B Integrated Linear Thruster Steve Feketa June 2012.
Measurement of Pressure , Velocity, Acceleration Mass and Weight
Kinetix® 350 Single Axis Ethernet/IP Servo Drive
ESD Stress Models.
Influence of Depth of Cathode Arc-remelted Layer on Vacuum Insulation
ULTRASONIC DISTANCE METER USING 8051
Electron Beam Welding Welding Technology/4.3 Electron Beam Welding.
Sensors May 25, 2013.
A General Overview of Sensors
Webinar Notes Please use the Q & A utility to ask us any questions concerning the material being presented. Please contact Brittany Socha- chat line.
IEEE SC-2 International Standard Review
Vibration Basics and Shaker Selection
THERMODYNAMIC IN ELECTRONICS
HALT: Notebook Computer Case Study
Vibration Basics and Shaker Selection
Power Sensors Ltd – Introducing PQube 3 Power Sensors Ltd –
Manufacture of Alloy Powder
Presentation transcript:

1 Confidential Reliability of Spring Contacts n Basics of electrical spring contacts n Micro-vibration n Temperature cycling n Industrial atmosphere n Shock & Vibration

2 Confidential Comparison Spring contact / Solder contact General Considerations

3 Confidential SEMIKRON Standard Qualification Test Program Qualification Standards – SEMiX™

4 Confidential Failure Criteria for Module Qualification Qualification Standards - SEMiX™ R th(j-c)

5 Confidential SEMIKRON Additional Reliability Test Program Qualification Standards - SEMiX™

6 Confidential Contents n Basics of electrical spring contacts n Micro-vibration n Temperature cycling n Industrial atmosphere n Shock & Vibration

7 Confidential Types of electrical pressure contact contact force mating and unmating force Rc Basics on electrical spring contacts typ. 50N/mm² typ. 10N/mm² N/mm²

8 Confidential Plating systems for different pressure ranges nContact forces in pressure contacts of power modules: uMini SKiiP 5-6 N uSEMiX 3-5 N nMetallic platings (Mating/un-mating forces & contact forces): uSnPb or Sn N uAg N uNi / Au flash- 1-2 N uNi / AuCo 0.2%- 1-2 N Basics on electrical spring contacts

9 Confidential Electrical contact is formed by A-Spots (P. Slade, Electrical Contacts, 1999) Basics on electrical spring contacts

10 Confidential a-Spot radius on Cu for different currents (P. Slade, Electrical Contacts, 1999) Basics on electrical spring contacts

11 Confidential Different application ranges for electrical pressure contacts Basics on electrical spring contacts

12 Confidential MiniSKiiP II Contact spring MiniSKiiP contact spring: The contact springs for MiniSKiiP II are made of “K88”, a copper alloy by German supplier “Wieland”. Thickness of the spring material: 0.3 mm  0.05 mm The contact spring is silver plated. The thickness of that plating is varying over the springs surface and given in the sketch below. To reduce tarnishing, the silver plating is passivated by an additional inorganic conversion layer (SnCl2) or a metallic plating with a thickness << 1µm.

13 Confidential Contents n Basics of electrical spring contacts n Micro-vibration n Temperature cycling n Industrial atmosphere n Shock & Vibration

14 Confidential Tribometer Test – Schematic Set-up contact force piezo actuator spring pins fixing screw R clamping fixture PCB module housing mounting plate PCB IV DBC ΔRcΔRc Micro-vibration

15 Confidential Classification of micro-vibration test results Source: P.G.Slade: Electrical contacts: principles and application, Marcel Dekker, Inc. 1999, pp Micro-vibration

16 Confidential Tribometer (A) - Test equipment for micro-vibration Travel range  100 µm Frequencies  20 Hz Typical test conditions: µm 5-10 Hz Micro-vibration

17 Confidential Micro-vibration test result on Ag-Spring contact system Test conditions: Frequency: 1 Hz Amplitude: 50µm Sample Rate: 5s Cycles: 4,65 Mio. (Test time: ~54 days) Micro-vibration

18 Confidential Contents n Basics of electrical spring contacts n Micro-vibration n Temperature cycling n Industrial atmosphere n Shock & Vibration

19 Confidential General set-up of TC contact resistance tests PCB Al2O3 Cu Al SnPb IV R c1 R c4 R c2 R c3 DBC K88 Ag plated FR4 Initial R depends on R c of 4 pressure contacts current paths Experimental parameters Temperature cycling test: -40°C to +125°C During T-cycling: no current load on contacts R c test: 10mA, 5V voltage limitation in open circuit Testing current over a pair of spring pins  R c limit: 400m   per pair of spring pins (after 100 cycles) Temperature cycling of contact system

20 Confidential Temperature cycling results for contact resistance tests Temperature cycling of contact system Standard Lead PCB

21 Confidential Temperature cycling results for contact resistance tests Temperature cycling of contact system RoHS compatible

22 Confidential Temperature cycling results for contact resistance tests Temperature cycling of contact system

23 Confidential Contents n Basics of electrical spring contacts n Micro-vibration n Temperature cycling n Industrial atmosphere n Shock & Vibration

24 Confidential Corrosive atmosphere conditions ISA-S Standard: Environmental Conditions for Process Measurement and Control Systems: Airborne Contaminants There are four classes of industrial atmospheres with respect to copper reactivity. G1 – Mild An environment sufficiently well-controlled such that corrosion is not a factor in determining equipment reliability. G2 – ModerateAn environment in which the effects of corrosion are measurable and may be a factor in determining equipment reliability. G3 – HarshAn environment in which there is a high probability that corrosive attack will occur. These harsh levels should prompt further evaluation resulting in environmental controls or specially designed and packed equipment. GX – SevereAn environment in which only specially designed and packaged equipment would be expected to survive. Specifications for equipment in this class are a matter of negotiations between user and supplier. Industrial atmosphere

25 Confidential SEMiX with HAL SnPb PCB in industrial atmosphere IEC Atmosphere: 10 ppm H 2 S Temperature:25°C Relative humidity: 75 % Volume flow: >volume*3/h Duration:10 days No current load during storage Industrial atmosphere

26 Confidential SEMiX with HAL SnPb PCB in industrial atmosphere Corrosive atmosphere results: IEC Industrial atmosphere

27 Confidential Corrosive atmosphere test: SEMIKRON Conditions SEMIKRON Test Conditions Industrial atmosphere Atmosphere: 0.5 ppm NO ppm H 2 S 0.1 ppm Cl ppm NO 2 Temperature:25°C Relative humidity: 75 % Volume flow: >volume*3/h Duration:21 days No current load during storage

28 Confidential SEMiX with HAL SnPb PCB in industrial atmosphere Industrial atmosphere

29 Confidential Contents n Basics of electrical spring contacts n Micro-vibration n Temperature cycling n Industrial atmosphere n Shock & Vibration

30 Confidential Vibration Test (external test lab) - Test conditions Standard test conditions: Sinusoidal sweep Hz Hz: constant amplitude = 17.5mm (pp) Hz: constant acceleration = 5g 1 Octave/min.  6:40 min per sweep 20 sweeps per axis  2:20 hrs per axis Vibration & Shock on contact system

31 Confidential Vibration test (external test lab) – Monitoring for contact break Vibration & Shock on contact system Current Monitoring MV 200 Contact Monitoring (detects contact breaks >1µs) DUT 1 DUT 2 DUT n 10  100  10  100  10  100  +12V -

32 Confidential Vibration test (external test lab) – Test results SEMiX No contact interruption >1µs detected Vibration & Shock on contact system

33 Confidential Vibration test (external test lab) – Test results MiniSKiiP Vibration & Shock on contact system

34 Confidential Shock Test (external test lab) - Test conditions Standard test conditions: half-sinusoidal pulse peak acceleration 30g shock width 18ms 3 shocks in each direction (±x, ±y, ±z) 18 shocks in total Vibration & Shock on contact system

35 Confidential Vibration & shock test - Results MiniSKiiP ® II 6 devices tested I GES in spec. I CES in spec. V GE(th) in spec. V CE(sat) in spec. V iso 3.6kV o.k. R th(j-h) not tested (V F in spec.) Qualification of functional modules

36 Confidential Thank You Very Much For Your Kind Attention