OPHIR-SPIRICON INC. 1 January 2009 OPHIR-SPIRICON INC. The True Measure of Laser Performance™ What’s New for 2009

OPHIR-SPIRICON INC. 2 January 2009 How do I Measure MY Laser? ■Power / Energy (Continuous or Pulsed) ■Temporal Profile (for pulsed lasers) ■Beam Profile ■Beam Variations Over Time □Beam Wander □Size and Shape □Power and Energy

OPHIR-SPIRICON INC. 3 January 2009 What Can We Provide You? ■Ophir-Spiricon Offers Instruments for Measuring □Power- from Picowatts to Kilowatts □Energy- from Pico Joules to Hundreds of Joules □Temporal Profile- from sub µs to ms □Wavelength- from 157 nm to 20um □Laser Beam Profiling ▪Any laser ▪ Any Wavelength ( from soft X-ray to THz) ▪Any power (from sub nW to over 150 kW) ▪Any size beam (from micron to meters)

OPHIR-SPIRICON INC. 4 January 2009 What’s NEW in Power/Energy for 2009? ■PULSAR- Multi Channel High Speed USB II Interface □Up to 25,000 Hz on ALL Channels Simultaneously □Now supports ALL SmartHeads ■Ideal for Multi-Head Applications

OPHIR-SPIRICON INC. 5 January 2009 What’s NEW in Power/Energy for 2009? ■Vega- NEW COLOR Hand- Held Display □Bright 320X240 Color TFT Display ▪Optimize your display for various laser glasses □ILLUMINATED KEYS ▪Easy to use in dim light □New Ergonomic Design

OPHIR-SPIRICON INC. 6 January 2009 What’s NEW in Power/Energy for 2009? ■100 mm Diameter Pyroelectric Head □96 mm Clear Aperture for extra large beams □Supplied with removable diffuser for higher powers and energies □Comes with broadband coating

OPHIR-SPIRICON INC. 7 January 2009 What’s NEW in Power/Energy for 2009? ■PE50 Pyroelectric with new diffuser ■Rep rates to 3000Hz ■TEN TIMES the previous damage limit. □40J/cm for 1ms pulses □1J/cm for <100ns pulses

OPHIR-SPIRICON INC. 8 January 2009 What’s NEW in Power/Energy for 2009? ■New High Damage Threshold Coating for Long Pulse Lasers. ■FIVE TIMES the previous limit. □50 J/cm 2 for 2ms pulses □250 J/cm 2 for 10ms pulses

OPHIR-SPIRICON INC. 9 January 2009 What’s NEW in Power/Energy for 2009? ■Energy Head specially made for IPL applications □Can be used with and without gels □Easy clean design

OPHIR-SPIRICON INC. 10 January 2009 What’s NEW in Power/Energy for 2009? ■250W Long Pulse Power Head □Large (33 mm) Aperture □Up to 600J Total Energy ■High Energy Density □>400 J/cm 2 for >2ms pulses

OPHIR-SPIRICON INC. 11 January 2009 What’s NEW in Power/Energy for 2009? ■300W Low-Profile Long-Pulse Head □ONLY 20 mm Thick ■High Power Density Coating □Up to 150 J/cm 2 for 20 ms pulses

OPHIR-SPIRICON INC. 12 January 2009 What’s NEW in Power/Energy for 2009? ■500W FAN-COOLED Head for Long Pulse Lasers □65 mm aperture for larger beams □600J Total Energy ■High Energy Density □200 J/cm 2 for 10 ms pulses

OPHIR-SPIRICON INC. 13 January 2009 What’s NEW in Power/Energy for 2009? ■100/500W Convection- Cooled Head □75W continuous, up to 500W intermittent. □65 mm aperture for large beams □Can be used with IPL Sources up to 600 J! □30 J/cm 2 for 10ms pulses

OPHIR-SPIRICON INC. 14 January 2009 What’s NEW in Power/Energy for 2009? ■1,500 Watt Long- Pulse RP Head □Measures CW Power & PULSE ENERGY □Also Measures Temporal Pulse shape! ■Patented “RP” Technology

OPHIR-SPIRICON INC. 15 January 2009 BEAM PROFILING ■The QUANTITATIVE way To Characterize Your Laser □NO Guesswork! □All characteristics of your beam □ISO Beam Widths-No arguments □Easy to use □No operator error!

OPHIR-SPIRICON INC. 16 January 2009 Laser Profiling Equipment for Lab Use ■Compact ■USB-II AND FireWire! ■From nm and nm ■Can even measure focused spots! ■Any Wavelength-all you do is change detector arrays

OPHIR-SPIRICON INC. 17 January 2009 Laser Profiling Equipment for Lab Use ■PYROCAM III ■IR to THz Wavelengths ■Patented Pyroelectric uncooled detector ■Stable, robust, easy to use ■FireWire interface

OPHIR-SPIRICON INC. 18 January 2009 Laser Profiling Equipment for Lab Use ■Accessories □Wide range for almost every application ▪Range extenders for UV ▪Beam Expanders and reducers ▪Attenuation kits

OPHIR-SPIRICON INC. 19 January 2009 What’s NEW in Profiling for 2009? ■BEAMGAGE □A whole NEW way of looking at your beam ■Totally New Software □Supported by Microsoft VISTA

OPHIR-SPIRICON INC. 20 January 2009 NEW BeamGage Profiling Software for 2009 ■New Functionality ■Ability to Test your Beam Calculations with Theoretical Beams! ■Better 3D!

OPHIR-SPIRICON INC. 21 January 2009 What’s NEW in Profiling for 2009? ■New Beam Creator lets you see how a Theoretical Beam should appear. ■Can be used to ‘calibrate’ beam widths ■Will Revolutionize the Science of Spatial Beam Profiling!

OPHIR-SPIRICON INC. 22 January 2009 What’s NEW in Profiling for 2009? ■LBS-300 Integrated Focused Spot SYSTEM □Measures focused spots as small as 60 um □UP to 400 W total power □Works with short focal length lenses! ■Image your FOCUSED SPOT!

OPHIR-SPIRICON INC. 23 January 2009 What’s NEW in Profiling for 2009? ■LARGE Format Profiling Camera □24 mm X 36 mm Array □11.2 Mpixels □FireWire Interface □190 nm to 1100 nm range ■Directly Image Large Beams!

OPHIR-SPIRICON INC. 24 January 2009 What’s NEW in Profiling for 2009? ■BeamCube Integrated Beam Characterization SYSTEM □Measures spatial profile, focal spots, temporal pulse shape and power all in one unit! □UP to 150 W total power ■Know your Beam Totally!

OPHIR-SPIRICON INC. 25 January 2009 What’s NEW in Profiling for 2009? ■M2-200s ■FAST new Smaller M 2 system ■Industrial design-even for continuous use ■M 2 in as little as 45 seconds! ■TRUE ISO 11146!

OPHIR-SPIRICON INC. 26 January 2009 What’s NEW in Profiling for 2009? ■SP 503/620 USB-II MiniCameras ■Built-in Pulse Sync operation ■Small footprint ■High density Pixels ■Lower cost

OPHIR-SPIRICON INC. 27 January 2009 Industrial Beam Profiling Equipment ■For nm Lasers ■Power up to 4 kW ■Integrated systems □Some measure power and temporal profile as well as Beam Profile

OPHIR-SPIRICON INC. 28 January 2009 Industrial Beam Profiling Equipment ■Now for high power CO 2 as well as Near IR applications □Up to 48 mm diameter beams □Up to 8 kW continuous power □Can be permanently installed for on-line beam monitoring ▪Totally transparent to the process

OPHIR-SPIRICON INC. 29 January 2009 SUMMARY ■New Technology Makes Diagnostics Easier ■Results in: □More Reliable Operation □Better Beam Quality □Less Waste □Higher Profits

OPHIR-SPIRICON INC. 30 January 2009 For More Information… ■Contact your local representative ■Find us on the web: □ THANK YOU FOR WATCHING