Electronic CAD & Reliability Group
DESIGN PROTOTYPE Tape out Pre-silicon Post-silicon
AF56ED90 AF96FB90
µGP XML asm
XML
Candidate test master slave Frequency/Voltage Results optimization evaluation
IEEE Computer, 2004
CORE [V]Prime95IBTLinXOCCTµGP ”2’ 3”≤ 1” ”2’ 4”2” ’ 2’7’2” 7’ 10” 8’
CORE [V]Prime95IBTLinXOCCTµGP ’1’2’4’<1’’ 4’5’<1’’ <1’’ <1’’ <1’’ <1’’ <1’’ 1’’ 1’’ 3’’ 3’’ 3’’ 5’’ 30’’ 2’ 5’
CPU Freq. [GHz]IBTLinXOCCTPrime95µGP ’3’5’30”29” ’4’ 9’29” 5’ 29” 6’ 29” 30” 30” 30” 30” 77”
CPU Freq. [GHz]IBTLinXOCCTPrime95µGP ’ 8’3’28” 6’ 28” 29” 29” 29” 30” 30” 30”
CPU Frequency V-CoreIBTLinXOCCTµGP NA i FAIL -PASS i FAIL- i PASS- FAIL i PASS i PASS--FAIL i PASS-- i FAIL- - i FAIL -- i PASS i PASS-FAIL i PASS i PASS i PASS-- i FAIL-- i PASS - FAIL i PASS -FAIL i PASS -FAIL i PASS
Giovanni Squillero Politecnico di Torino Dipartimento di Automatica e Informatica Corso Duca degli Abruzzi, 24 I Torino ITALY Tel: Fax: