FIG. 2. X-ray θ-2θ diffraction scans of SIO-214 films grown on GSO, STO, LSAT, NGO, and LAO (from top to bottom). 00l peaks from the SIO-214 films (l = 4,

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FIG. 2. X-ray θ-2θ diffraction scans of SIO-214 films grown on GSO, STO, LSAT, NGO, and LAO (from top to bottom). 00l peaks from the SIO-214 films (l = 4, 8, 12, 16, 24, 28) are clearly observed. The left panel shows zoomed-in scans near the 0012-reflections of the films and the pseudo-cubic 002-reflections of the substrates. The dashed line indicates the 0012-peak position of SIO-214 single crystals. The asterisks (*) indicate peaks from the substrates. Appl. Phys. Lett. 102, 141908 (2013); http://dx.doi.org/10.1063/1.4801877 © 2013 AIP Publishing LLC