Maki KUROSAWA VTX Group 2014 Feb 20 VTX Status Maki KUROSAWA VTX Group 2014 Feb 20

Run 14 We will have a 22 week run. 15 GeV/n AuAu is running (3 weeks). First collision on 13th Feb 200 GeV/n AuAu will start second week of Mar (~Jul 7th).

VTX Status Commissioning started on Feb 3rd. Found one ladder (B1-L11) didn’t work. Current consumption is low. It was working before the installation of VTX FEM is working. Optical cable connection is good. No broken cables. We inspected visually the connection of connectors except for bus connector at detector side. There were no loose connectors. Out put voltage of LV cable was nominal voltage. Possible cause Bus connector were loose. Regulator on SPIRO board. … For more inspection, it is required to disassemble barrel. Nothing to do for this ladder for now.

No Change from Run13 and a test at Chemistry Lab Chip Map of WEST (Commissioning in Run-14 20140205) Pulse Test (sent pulse to col10 and 20) Good Chip 50% Dead Chip 100% Dead Chip 50 CNT acceptance LADDER SPIRO WEST   South North 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 49 Barrel 0 B0-L4 58 51 B0-L3 59 71 B0-L2 27 36 48 B0-L1 28 17 47 B0-L0 29 34 37 Barrel 1 B1-L9 30 31 B1-L8 16 35 38 B1-L7 78 32 46 B1-L6 24 39 B1-L5 61 53 B1-L4 18 40 B1-L3 56 55 B1-L2 20 41 B1-L1 57 60 B1-L0 67 Col 0 is always hot for two chips. should be masked. No Change from Run13 and a test at Chemistry Lab

No Change from a test at Chemistry Lab except for B1-L11 Chip Map of EAST (Commissioning in Run-14 20140205) Pulse Test (sent pulse to col10 and 20) Good Chip 50% Dead Chip 100% Dead Chip 50 CNT acceptance  LADDER SPIRO EAST   North South 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 25 Barrel 0 B0-L5 72 39 B0-L6 73 B0-L7 74 23 69 B0-L8 76 19 68 B0-L9 77 18  32 Barrel 1 B1-L10 21 30 54 B1-L11 62 33 B1-L12 22 31 52 B1-L13 63 70 B1-L14 24 27 50 B1-L15 64 35 B1-:16 26 43 B1-L17 65  14 36  B1-L18  21 42  B1-L19 66 No Change from a test at Chemistry Lab except for B1-L11 current of B1-L11 is less than 2A before and after initialization of read out chips. Ordinal current consumption of ladder is from 3 to 4A.

What we have done at commissioning Optimization of operation parameters for all readout chip. Making of mask file to mask noise pixels. Threshold scan with noise trigger. Setting of threshold level. Noise level is < 0.1% Noise level for most of readout chips is < 0.01%

Hit Map of Barrel 0 (Zero Field RUN402340-0000) low rate SOUTH NORTH WEST The efficiency of B0-L8-South is quite low. Bias voltage for sensor modules of B0-L8-S was applied and we could see leak current.  Not bias issue. Need to check the response from test pulse by changing some setting values on Wed. NORTH SOUTH EAST

Hit Map of Barrel 1 (Zero Field RUN402340-0000) We will check some operation parameters for ladders whose efficiency is low. low rate WEST EAST Connector of bias cable were broken  Fixed LV is OFF

BBCZ vs VTXZ (RUN402336-0000-0004 336k events) Reconstructed with VTX standalone bbcz vs vtxz bbc_z (cm) vtx_y (cm) vtx_z (cm) vtx_x (cm) vtx_x (cm) Mean = -0.2 vtx_z-bbc_z (cm) Event Sequence

Event Number Dependence of Mean Multiplicity (VTXS) Sampling Event Number ADC sum is dropping around 10k events. X vertex is correlated with the dropping mean multiplicity of VTXS. Strip group is now working on this readout issue. GTM file was updated. The issue is supposed to be fixed.

Cluster Number vs bbc q(RUN402389-0000-0004 645k events) VTXP-B0 VTXP-B1 number of cluster (B0) number of cluster (B1) bbcq bbcq VTXS-B2 VTXS-B3 number of cluster (B2) number of cluster (B3) bbcq bbcq

Summary 15 GeV AuAu run started. VTXP is working. Operation parameters were optimized. There are no additional dead area except for one ladder (B1-L11) We have a read out issue for VTXS. The issue is supposed to be fixed today.

BACK UP SLIDES

Hit Rate chip by chip (RUN14 – Zero Field RUN402340) Hit rate is decreased to half for B0-WEST. B0-WEST B0-EAST B1-WEST B1-EAST average hit rate hit rate = 0 is removed for a average calculation Hit Rate (hit / chip / total event) 1.3 0.9 0.4 0.3 Chip Number

(Noise counts/chip) / (Total Number of Events (100k)) Noise-pixel-rate/chip is less than 0.1% B1-L5 chip8 and 9 B0-West B0-East B1-West B1-East 1 count / chip / 100k events

Leave B1-L5-chip8 and 9 chip0 chip1 chip2 chip3 Hit/Total events Threshold DACs chip4 chip5 chip6 chip7 Threshold level 1/3 x MIP (electrons) B1-L5 chip8 and 9 There exist unstable pixels. chip8 chip9 chip10 chip11 chip12 chip13 chip14 chip15 Probably unstable pixels cannot be removed with threshold Keep threshold level as 170

Cluster Number vs bbc q(RUN402389-0000-0004 645k events) VTXP-B0 VTXP-B1 Number of Clusters (EAST B0) Number of Clusters (EAST B0) Number of Clusters (WEST B0) Number of Clusters (WEST B0) VTXS-B2 VTXS-B3 Number of Clusters (EAST B0) Number of Clusters (EAST B0) Number of Clusters (WEST B0) Number of Clusters (WEST B0)