CALICE Collaboration Meeting KEK/Japan – April 2015

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Presentation transcript:

CALICE Collaboration Meeting KEK/Japan – April 2015 Ecal activities at LAL Roman Pöschl CALICE Collaboration Meeting KEK/Japan – April 2015

Comments on Assembly - In the following the assembly of (short) Ecal layers is documented - These steps have been devlopped by the LAL team Julien Bonis, Patrick Cornebise, Alice Thiebault, Marco Fernandez (Consultation by Christian Bourgeois and Alexandre Gonnin) All steps allow assembly in a fully controled manner with very little human 'contact' with detector devices - For the tests, training an ASU with false SiWafers was used - Last test before assembly of 'real' ASUs

Assembly of SiW Ecal layers Assembly bench in LAL Workshop

Assembly bench from a different angle

Steps of assembly 2. Picking PCB from delivery plate

Steps of assembly 3. Preparing the HV Kapton Placing glue dots for connection SiWafer – HV Kapton Well controled paramters at well defined spots Proper grid of glue dots

Steps of assembly 4. Placing and fixing

Steps of assembly 5. Adapter card alignment (applies also for further ASUs)

Steps of assembly 6.1 Interconnection – Placing the frame

Steps of assembly 6.2 Interconnection – Do the job ... following carefully studied specifications Interconnection in/on assembly bench Human being to be “replaced” by robotic procedure (AIDA-2020) - This part of the assembly has to be very carefully integrated into planning of detector design!!!

Steps of assembly 7. Polymerisation (Gluing PCB – HV Kapton) Layer remains in cradle during polymerisation Polymerisation for about 1/2 day at 40o C (Check time with experts)

Steps of assembly 8. Finishing Interconnection pair Adpater card/ASU Connection of HV straps Not shown: Placing of thermal copper drain and closing with Aluminum cover Ready for use: a) Leakage current b) Tests with data

Comments - All steps of assembly procedure have been exercised with an experimental model - New w.r.t. FEV8 (2012) Four wafers, interconnection in mechanical structure - Ready to receive and assemble 'real' layers Important step to stabilise effort at LAL (We are sitting at the end of the chain) - Assembly of short layers takes about 1 day * including polymerisation => parallelisation * do not expect much longer for long layer (provided enough automatisation) - AIDA-2020 will help to scrutinise procedure further - Further reduction of human intervention - Interconnection is maybe most delicate step that needs automatisation and monitoring (in particular in view of long slabs)

FEV8_COB Produced by EOS Company South-Korea under supervision of SKKU/OMEGA/LAL Metrology Thickness ~1.1mm Planarity not overwhelming 1,0mm et 1,4mm of bending Still within industrial limits Will be subject of discussion with EOS company next week

FEV8_COB – Chip bonding Realised in CERN bonding lab Successful bonding ... but “Black Pad” problem observed Would influence long term reliability (to be discussed with EOS)

FEV8_COB – On test bench High tech piece of paper Integrated smoothly with existing hardware and current version of calicoes/pyrame software

Some impression of FEV8_COB tests Signal r/o from ASICs ... - Quick test series (More profound tests slowed down by funding “accident”) - ASICs on PCBs react correctly to slow control commands - Acquisition and readout works properly (Noise from channels) - Problems with starting PreAmp for injected charge pulses (has been also observed for earlier production by Protechno and Exception) -> requires access to probes of SKIROC2 <- requires configuration through DAQ2 s/w

Summary and outlook - LAL team is preparing for assembly of short layers - Succesful exercise with experimental model of a layer Many different steps that have to be mastered!!! Experience will be input to further automatisation Assembly has to become integral part of detector design! LAL team is fragile but motivated and skillful! - Continuing R&D on Chip on Board solution 10 boards have been produced 2 boards have been equipped with SKIROC2 ASICs by CERN Black Pad effect observed during bonding First tests on test bench are encouraging Observed issues need more profound debugging Will talk to PCB producer next week Will search for “All-Korean” solution (for on-Board and packed versions)

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