Telecom Hardware Robustness Inspection System Key issue: Achieving global hardware robustness in electronic apparatus

Hardware design phase - signal integrity optimization (ringing, crosstalk, ground bounce, power supply distribution analysis), timing problem control - filtering/shielding optimization (EMI simulations) - reliability evaluation (components, architectural conceps, thermal analysis) Hardware/Software Integration phase - fault insertion, noise injection, experimental EMI precompliance tests EMC qualification phase - emission/susceptibility conformity tests Overall Fault Tolerance Verification phase - fault insertion Installation phase - environment interaction evaluation (grounding, shielding, EMI tests ) Hardware Robustness: a life-cycle issue

THRIS: CSELT/HDT partnership SI XTALK SSN What-If SPRINT PRESTO Faults/noise injection Conducted Radiated ESD Burst _SI_FI_EMC Close field measurements (EASYSCAN, NFA) Precompliance EMC (measurements near field) Conducted noise injection (RFI) EMC prediction Reliability RAP THRIS Physical tests on actual systems Data preparation require simulation performed with Presto

THRIS basic functionalities Common database (data extracted at design phase are the same used in EMC prediction and qualification (Fault insertion) Signal integrity prediction EMI prediction (radiated/conducted emission,conducted susceptibility) EMI performance optimization (What-If analysis) Reliability evaluation (RAPSODIA, METRICA) Fault injection (pin forcing technique) Noise injection Electrical/thermal monitoring EMI precompliance analysis (near-field, common mode currents, conducted susceptibility)

THRIS_FI: Pin forcing Mbit/s output streams Mbit/s input streams Fault Stage A Stage B Stage C Description: 3 Boards + backplane Mbit/s streams 6 16x16 switching matrices THRIS simulation model: circuit elements nodes timepoints 20’ simulation time on typ. ws.

Normal operation 5mA current injection 12mA current injection ecl interconnection N output testpoint THRIS_FI: Noise injection

THRIS new development Mainly in EMC field of application: Simulation: common mode, maximum radiation evaluation, close field maps in EASYSCAN Measure: generalized radio frequency noise injection