The Next Evolution In AFM Nanonics produces AFM/SPM systems with unique design for overcoming limitations of standard SPM system. Nanonics offers unique capabilities for integrated microscope of combining SPM with optical microscopy, analytical devices (e.g. Raman) and multiprobe operation. Nanonics opened the door and pioneered many new fields in SPM that became a standard in this market. The following are examples: MultiProbe SPM systems AFM/Raman and TERS Near-field Scanning Optical Microscopy (NSOM and sSNOM) Ultimate BioAFM Hydra with Tuning Fork feedback Fountain Pen Nanolithography SPM/FIB/SEM Integra ration

The Next Evolution In AFM Nanonics covers a wide range of the Nanoscience and Nanotechnology spectrum: SPM various modes Online AFM/Raman TERS Near-field and Far-field microscopy combined with SPM (NSOM and Apertureless) Photonics Plasmonics BioSPM Nanolithography Multiprobe imaging and nanomanipulation, Nano-Electrical/Thermal, Low temperature SPM and integration with FIB/SEM. Visit our website for more information or to get a quote:

The Next Evolution In AFM MultiView 1000 TM MultiView 2000 TM MultiView 4000 TM (One Probe) MultiView 4000 Hydra TM (Two Probe) MultiView 4000 TM (One Probe-Two Nanoaligners) Optometronics MultiView 4000 TM (Two Probe-Two Nanoaligners) MultiView 4000 TM (Four Probe) CryoView 2000 TM Raman Integration Packages AFM/SEM/FIB Integrations NanoToolKit TM Nanonics SPM Products

The Next Evolution In AFM Unique SPM Design for Free Optical Axis 3D FlatScan TM Scanner StageTransparent Glass Probe  >20 mm clear optical axis  7 mm thin scanner  mms of rough scanning and up to 100 micron of fine scanning in X, Y and Z directions  Allows for Tip and Sample scanning modes Nanonics’ NanoToolKit TM :  Optically Friendly AFM Probes  Normal Force NSOM Probes  Coaxial Electrical Probes  Two Wire Thermal Probes  Chemical Writing Probes  TERS Probes All MultiView Systems Are Compatible With All Conventional Probes Available

The Next Evolution In AFM NSOM/SNOM Near Field Scanning Optical Microscopy A line of instruments that provides the highest resolution optical information simultaneously with high resolution SPM topography. Tapered optical fiber probe functions as the main probe in the SPM – light can be either transmitted or collected so that a variety of NSOM modes can be operated including collection, reflection, and transmission modes. Nanonics provides systems with different feedback mechanisms Probe shape and geometry are customizable depending on the customer needs. More info can be found at systems/multiview-1000-system.html or systems/multiview-2000-system.html systems/multiview-1000-system.html systems/multiview-2000-system.html

The Next Evolution In AFM Raman characterization: AFM-Raman and TERS (tip enhanced Raman characterization)AFM-RamanTERS Technology that provides high resolution chemical information through Raman spectra on your material simultaneously with high resolution topographic information. AFM/confocal Raman microscopy system Tip enhanced Raman spectroscopy (TERS) system for higher resolution – In TERS, the SPM tip functions as an antenna to focus the light right beneath the tip and collect highly localized Raman spectra. More info can be found at systems/multiview-1000-system.html or systems/multiview-2000-system.html systems/multiview-1000-system.html systems/multiview-2000-system.html

The Next Evolution In AFM Multiple probe SPM A revolutionary technology that refers to the ability to simultaneously and independently operate two or even four probes – provides maximum flexibility and sophistication in your characterization needs. Probes can be any combination of scanning probe, near field optical, thermal, electrical and nanolithography probes. Unique experiments – one probe manipulating or pumping a sample optically, electrically or thermally, while the other probe(s) interrogate the sample in various modes simultaneously – Nanomanipulation – Electrical and thermal transport More info can be found at systems/multiprobe-imaging-multiview-4000.html

The Next Evolution In AFM Low Temperature/Cryogenic Multiple Probe SPM A system that performs all of the standard SPM/optical measurements but now at temperatures down to 10K – Very fast cooling that does not require an immersion cryostat. Applications include: – Photoconductivity – Electrical transport – Thermal transport – Electrical probe station For dynamics and transport of 2D materials such as graphene and MoS 2 More info can be found at: systems/low-temperature-multiprobe.html systems/low-temperature-multiprobe.html

The Next Evolution In AFM Combined AFM/SEM/FIB The first triple beam AFM, SEM & FIB with the ability to integrate AFM/NSOM with SEM and FIB technology the ultimate 3D nanoscale characterization capability Incorporates revolutionary innovation in this instrument and AFM probe design – open architecture that provides open access to the SEM/FIB beams without any obstruction or interference to the injectors, detectors, or beam lines. More info can be found at spm-systems/combined-afm-fib-and-afm- sem.html