1. Engr 1182.03 College of Engineering Engineering Education Innovation Center Engr 1182 Nano Pre-Lab Demolding Rev: 20XXMMDD, InitialsPresentation Short Title1

2. Engr 1182.03 Micro/Nanotechnology Tools One of the challenges of nanotechnology is the limitation of tools available to allow us to “see” into this microscopic world. Rev: 20XXMMDD, InitialsPresentation Short Title2

3. Engr 1182.03 Wavelengths vs. Features Size Rev: 20XXMMDD, InitialsPresentation Short Title3 The wavelength of a sinusoidal wave is the spatial period of the wave— the distance over which the wave's shape repeats. The smaller the wavelength of the wave the higher the energy of the wave. 100 10 10 -2 10 -4 10 -6 10 -8 10 -10 10 -12 Wavelength in meters Nanotechnology

4. Engr 1182.03 Microscopes An optical microscope that uses visible light through lenses can magnify up to 1,500 times! A microscope that uses a beam of electrons instead of light can “magnify” millions of times! Why the difference? Rev: 20XXMMDD, InitialsPresentation Short Title4

5. Engr 1182.03 Resolution The resolution of an image is limited by the effects of diffraction (Bending of Light). A good rule of thumb: an imaging system is able to resolve features to approximately half the wavelength of “wave” used Therefore, the smaller the wavelength the higher the resolution of the microscope Rev: 20XXMMDD, InitialsPresentation Short Title5

6. Engr 1182.03 Microscopy using non-light wavelengths To obtain higher resolution than optical microscopes, imaging devices using other types of waves have been developed such as electron beam. Rev: 20XXMMDD, InitialsPresentation Short Title6

7. Engr 1182.03 Rev: 20XXMMDD, InitialsPresentation Short Title7 Scanning Electron Microscope An electron beam is focused and scanned across a specimen and then scattered electrons are detected. Those scattered electrons carry the image information. Resolution is ~ 5 nm Focusing Scanning Scattered electrons

8. Engr 1182.03 Cecropia Moth Rev: 20XXMMDD, InitialsPresentation Short Title8

9. Engr 1182.03 A close-up of the Cecropia Moth scale using a Scanning Electron Microscope – Note scale of 1 micron Rev: 20XXMMDD, InitialsPresentation Short Title9

10. Engr 1182.03 Scanning Probe Microscopes The family of scanning probe microscopes uses no lenses, but rather a probe that “interacts” with the sample surface. Some examples are: –Scanning Tunneling Microscope (STM) –Atomic Force Microscopy (AFM) Rev: 20XXMMDD, InitialsPresentation Short Title10