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Międzyresortowy Instytut Techniki Radiacyjnej Prof. dr hab. Halina Abramczyk Dr hab. inż. Beata Brożek-Płuska Dr inż. Jakub Surmacki Mgr inż. Monika Kopeć.

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Presentation on theme: "Międzyresortowy Instytut Techniki Radiacyjnej Prof. dr hab. Halina Abramczyk Dr hab. inż. Beata Brożek-Płuska Dr inż. Jakub Surmacki Mgr inż. Monika Kopeć."— Presentation transcript:

1 Międzyresortowy Instytut Techniki Radiacyjnej Prof. dr hab. Halina Abramczyk Dr hab. inż. Beata Brożek-Płuska Dr inż. Jakub Surmacki Mgr inż. Monika Kopeć Halina Abramczyk Lodz University of Technology, Laboratory of Laser Molecular Spectroscopy, Lodz, Poland http://mitr.p.lodz.pl/raman

2 : Laboratory of Laser Molecular Spectroscopy : Laboratory of Raman Imaging Laboratory of Femtosecond Spectroscopy Laboratory of Raman Spectroscopy

3 Biomedical applications High spatial resolution (far below the diffraction limit, TERS) RAMAN IMAGING High temporal resolution (FEMTOSECOND PUMP-PROBE SPECTROSCOPY) Strong signal enhancement enabling monitoring the genetic and immunological responses in biological systems (SERS COMBINED WITH NANOPARTICLES) Specificity of interactions (BIOCONJUGATES)

4 Biomedical applications High spacial resolution (far below the diffraction limit, TERS) RAMAN IMAGING

5 CONFOCAL RAMAN MICROSCOPY R>> wide-field microscopy

6 Scanning near-field microscopy (SNOM) Near-field imaging occurs when a sub-micron optical probe is positioned at a very short distance from the sample and light is transmitted through a small aperture at the tip of this probe. The near-field is defined as the region above a surface with dimensions less than a single wavelength of the light incident on the surface. Within the near-field region light is not diffraction limited and nanometer spatial resolution is possible. This phenomenon enables non-diffraction limited imaging of a sample that is simply not possible with conventional optical imaging techniques. d<< The next step to material analysis on a smaller scale has been the combination of Raman spectroscopic analysis with near field optics and an Atomic force microscope (AFM). Such systems allow tip enhanced Raman scattering to be explored, making true NanoRaman achievable, with spatial resolution <100nm. spatial resolution <100nm.

7 Tip-enhanced Raman spectroscopy (TERS) (cantilever based SNOM) In a typical TERS experiment a Au- or Ag-coated AFM tip is used as a nanostructure to produce Raman signal enhancement on a sample surface once the excitation laser is focused on the apex of the tip with the tip brought into close proximity with the surface. The tip radius, which defines the lateral resolution of an AFM measurement, is typically in the range of 10-20 nm. In the TERS experiment the lateral resolution depends on the size of the hot-spot therefore one can expect resolution in the range of 20-50 nm for Raman spectroscopy and imaging measurements. The TERS tip-apex must be illuminated with the excitation laser from either above, below, or the side.

8 Biomedical applications High spatial resolution (far below the diffraction limit, TERS) RAMAN IMAGING High temporal resolution (FEMTOSECOND PUMP- PROBE SPECTROSCOPY)

9 Ultrafast nonlinear spectroscopy pump-probe femtosecond transient absorption Recently developed techniques of ultrafast nonlinear vibrational spectroscopy allow a much more effective attack on this problem.

10 Biomedical applications High spacial resolution (far below the diffraction limit, TERS) RAMAN IMAGING High temporal resolution (FEMTOSECOND PUMP-PROBE SPECTROSCOPY) Strong signal enhancement enabling monitoring the genetic and immunological responses in biological systems (SERS COMBINED WITH NANOPARTICLES) Specificity of interactions (BIOCONJUGATES)

11 H. Abramczyk, B. Brozek-Pluska, Chem. Rev. 113 (2013) 5766-7581 2013 IF = 41,298

12 16 października 201212 2011

13 H. Abramczyk, B. Brozek-Pluska, J. Surmacki, J. Jablonska-Gajewicz, R. Kordek, PBMB 108 (2012) 74-81 2012

14 16 października 201214 2013

15 16 października 201215 2013

16 16 października 201216 2013

17 2014 H. Abramczyk, B. Brozek-Pluska, J. Surmacki, J. Musial, R. Kordek, Analyst (2014) DOI: 10.1039/c4an00966e

18 J. Surmacki, B. Brozek-Pluska, J. Musial, R. Kordek, H. Abramczyk, Analyst (2015) DOI: 10.1039/C4AN01876A 2015 ANALYST cover


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