1. DISSEMINATION ACTIONS 2012

2. Dissemination actions Catness’12 (4 presentations) Mixdes Special session (5 papers) IOLTS 2012 Special session Invited conference, UPC, Madrid VAMM Workshop ERIC’12 Poster CAD 2012 D&T special issue on Variability and Aging (2013) Spectrum journal DCIS’12 Special session on Variability ESDERC Workshop 2012 ESSCIRC Workshop 2013 Castness’13

3. UPC Publications 2012 Journals N. Aymerich, S.D. Cotofana, A. Rubio, “Adaptive fault-tolerant architecture for unreliable technologies with heterogeneous variability”, IEEE Transaction on Nanotechnology, volumen 11, issue 4, pp. 818-829, May 2012, DOI 10.1109/TNANO.2012.2199513 N. Aymerich, S. Ganapathy, A. Rubio, R. Canal, A. González, “Impact of positive bias temperatura instability (PBTI) on 3T1D-DRAM cells”, INTEGRATION, The VLSI Journal, 45 (2012) 246-252, DOI 10.1016/j.vlsi.2011.11.014 N. Aymerich, A. Rubio, “Fault-tolerant nanoscale architecture base don linear threshold gates with redundancy” Microprocessors and Microprosystems, volumen 36, issue 5, July 2012, pp. 420-426, DOI 10.1016/j.micpro.2012.02.003 Amat, E. et al., “Variability mitigatiom mechanisms in scaled 3T1D DRAM memories to 22nm and beyond”, IEEE Tr. Device and materials reliability, vol. 12, issue 3, 2012 N. Aymerich, S. Cotofana, A. Rubio, “Degradation Stochastic Resonance (DSR) in AD-AVG architectures”, IEEE Tr. On Nanotechnology (Invitation) C. García, A. Rubio, “Variability and reliability analysis of CNFET technology: impact of manufacturing imperfections”, IEEE Tr. Nanotechnology (minor revision) N. Aymerich, “Reliability and performance tunable architecture: the asyncrhonous RMR”. IEEE on Reliability (under revision)

4. UPC Publications 2012 Conferences E. Amat, A. Rubio et al., “Strain relevance on the improvement of the 3T1D cell performance” Proceedings of the MIXDES Conference, Warsaw, May 2012. C. García, A. Rubio, “Variability and reliability analysis of CNFET in the presence of carbon nanotube density fluctuations”, Proceedings of the MIXDES Conference, Warsaw, May 2012. P. Peyman, A. Rubio, “SRAM lifetime improvement by using adaptive proactive reconfiguration”, Proceedings of the MIXDES Conference, Warsaw, May 2012. Z. Jaksic and R. Canal, “Enhancing 6T SRAM cell stability by back gate biasing techniques for 10nm SOI Finfets under process and environmental variations”, Proceedings of the MIXDES Conference, Warsaw, May 2012. P. Peyman, A. Rubio, “Process variability-aware proactive reconfiguration techniques for mitigating aging in nano scale SRAM lifetime”, IEEE LSI Test Symposium (VTS’12), Hawaii, May 2012. N. Aymerich, S. Cotofana, A. Rubio, “Degradation Stochastic Resonance (DSR) in AD-AVG architectures”, IEEE Nano 2012, Birmingham, UK. M. Landauer, J.L. Gonzalez, “Carbon nanotube FET process variability and noise model for radiofrequency investigations”, IEEE Nano 2012, Birmingham, UK. E. Amat et al., “Impact of bulk/SOI Finfets on 3T1D-DRAM cell performance”, 11th Int. Conf. On Solid-State and Infegrated Circuits Technology 2012, Xi’an, China. P. Pouyan, “Implementation of a proactive SRAM memory”, DATE 2103 (IP accepted) DCISE (1 paper) VTS 2013 1 paper sent ICCD 2012, presneted ETS 2013 1 paper sent Invited conference Whistler 2013

5. UPC Publications 2012 Intel X. Vera, “DFH(eterogeneity)for tera-scale reliable processors”, IEEE LSI Test Symposium (VTS’12), Hawaii, May 2012. T. Ramírez at al., “Mitigating lower failures with adaptive system reconfiguration” Proceedings of the MIXDES Conference, Warsaw, May 2012. Others? Other dissemination actions

6. Other dissemination actions by UOG and Imec Publications 2012?