1. Revolution in RF Test Formula LitePoint
Black Ma
2014-Apr

2. Who is LitePoint 2

3. LitePoint is

4. LitePoint

5. LitePoint

6. LitePoint Delivers… Innovation at the Intersection of
Presentation Title
LitePoint Delivers…
Innovation at the Intersection of
Wireless Technology and Mass Production
Source: Earth 911, Info Dingo

7. LitePoint Consumer Electronics Companies Manufacturers Chipset Makers
Smart Appliances
Tablets
Smart Phones
Consumer
Electronics
Companies
Smart Appliances
Audio & Video
LitePoint
When you think about the 50 billion wireless devices projected to be in the market by 2020, think variety. And think beyond mobile devices. Increasingly complex radios will be found inside an increasingly broad range of products. It’s becoming a very complex and large ecosystem. And to maintain quality and manage wholly unprecedented volume, the entire value chain will need to be in synch.
We work with everyone in the value chain. We work with all of the chipset manufactures, most of the device and handset makers, and the tablet and PC makers—anyone that makes a wireless device.
We are based in Silicon Valley and are surrounded by the leading chip makers and device makers. We’re right in the middle of the action and can reach them all with a short drive.
And, our solutions cover the entire testing process—from silicon to device, from sand to product—so you can rely on test results and transparency throughout the product development lifecycle.
NETGEAR uses LitePoint test systems in the lab and then again on the manufacturing line to ensure that they don’t sacrifice quality even as volume increases.
Manufacturers
Smart Power Grid
Consumer Electronics
Chipset Makers
Billions of Devices
Consumer Electronics
Consumer Electronics

8. What LitePoint matters with you
--Speed to Market & Cost Savings

9. Innovation Drives Speed to Market
Presentation Title VS
To Market
Lightning-Fast Test Times VS
Ease of Use
LitePoint innovations that:
Enable speedy rollout in the production environment
Reduce training times and provide operator ease of use
Speed the testing process per device
All drive faster times to market.
With faster throughput, you can still meet launch dates even when there are delays receiving product. It also means you’ll be ready to meet increased demand.
Implementation
Fast VS

10. Maximize Lifetime Value
LitePoint test systems continue to create value and help you save money over time.
Starting with the initial adoption that includes the streamlined rollout and faster training. There are also immediate factory footprint savings: when you require fewer, one-box test systems to meet throughput demand, you’ll save the floor space, energy bills, and operator expenses associated with the additional equipment you’d need with another solution.
LitePoint systems also help reduce costs associated with daily operating expenses: testing more devices faster and easily switching configurations to test different standards.
The average LitePoint test system pays for itself in xx, and over time saves xx hours. (Brad, do we have any data to populate a statement like this)?
OPERATING EXPENSES
THROUGHPUT
Time to market
Value Over Time

11. Don’t Sacrifice Quality
Presentation Title
Throughput
Quality
LitePoint
Competitors
With everyone in the value chain under pressure to increase production and speed time to market, there’s an increasing need for high-throughput test solutions that ensure quality.
With LitePoint solutions, you can increase quality even as production rates increase.
(insert more from Vernon’s story here)

12. Why LitePoint
-- Formular LitePoint 12

13. #1 Cellular multi-DUT Parallel Tester – Y2011
First Parallel Testing Solution

14. Utilization Maximizing Technology (UMT)
Smart Multi-DUT Testing Architecture
Optimized resource usage – best utilization
Optimized hardware and software integration – highest throughput
Key Elements
Dynamic Signal Control (DSC)
Intelligent Signal Processing
Smart Data Export
Built in Calibration
Point to Point Connections
Dynamic Reference Level Control
Per DUT Signal Detection
Synchronized Captures
Parallel Processing
Pipelined Data Transfer
Smart Data Export
Dynamic
Signal Control
Data Capture
Data Processing
Data Export
Data Processing
Data Processing
Data Processing
DUTs

15. Multi-Channel Measurement Architecture
Traditional Test Architecture supports only one measurement at a time
PWR
EVM
OBW
ACLR
setup
setup
setup
setup
measure
measure
measure
measure
fetch
fetch
fetch
fetch
IQxstream Architecture Multiple instrument channels support multiple, simultaneous measurements
setup
Capture
PWR
Data
setup
EVM
Data
setup …
OBW
Data
Data
setup
ACLR

16. Better Test Coverage, Less Test Time
W-CDMA TX test example
ILPC
ACLR
EVM
I/Q Imb.
Time
Power Level 1
Power Level 2
ACLR
EVM
I/Q Imbalance
Power Level (dBm)
Slot …
ILPC
I/Q Imb.
Time

17. Sequence-Based Test Programming
Presentation Title
Traditional Methods require sending instructions to (“setup”) the DUT at the beginning of each measurement in a series of tests
Test Time
Traditional Non-Signaling
DUT + TE setup
meas #1
TE setup
meas #2
TE setup
meas #3
TE setup
meas #N
IQxstream Method:
pre-program a “sequence” (several SCPI commands) only once
IQxstream and then execute many times with one command
In #2 – Sequence makes testing faster
Sequence Based Non-Signaling
DUT setup
meas #1
meas #2
meas #3
DUT setup
meas #1
meas #2
meas #3
Execute test sequence
Load the test sequence

18. IQxstream Enables Fastest Throughput
Tester “x” 1 DUT
signaling
IQxstream 1 DUT
non-signaling
IQxstream 4 DUT
non-signaling        
Test Speed
>2X Improvement
Test Speed
>6X Improvement
6X More Throughput!

19. Throughput -- more than RF Test Speed19

20. Offering Flexibility in Manufacturing (And a smooth transition to automated, multi-DUT testing)
Automated Loading /
Panel Test
Manual Loading
Manual Loading
1-DUT Sequential (1x1 ping-pong)
Multi-DUT Asynchronous (4 devices in semi-parallel)
Multi-DUT Synchronous (4 devices in 1 chamber)
2013 and before
Now
When you’re ready

21. Why Does APT Work? (Example: TX Calibration)
1-DUT
DUT control, settling time, NV write
30% Utilized 0%
100%
70% Idle
2-DUT
60% Utilized 0%
40% Idle
3-DUT
90% Utilized 0%
10%
4-DUT
Nearly 100% Utilized 0%
100%

22. APT Integration Requirements
LitePoint APT easily PnP in any ATE SW with minimal changes required
Keys:
“Turn off” tester when DUT fails
“Turn off” tester when DUT passes
“Turn off” tester when DUT finishes (before NVs written)
Upper S/W layer does not need to need to be:
“Multi-DUT aware” – just starts multiple 1-DUT programs
Aware of any other DUT program – all handled through in-box tokens
Thread safe
Zero Risk to any ATE SW
How to implement?
Litepoint APT is very easy, which can be easy plugs into existing test driver, no need modify test framework and test flow, very easy.

23. Maximum performance using APT
Asynchronous Parallel Test drivers benefits
Application side driver is written as a single threaded driver
No shared memory, or application side synchronization required
Works with 1 – …n DUT’s.
Plugs into existing API’s from any test framework without any architecture changes required.
Maximum performance achieved with simple API call to turn off the Generator when testing is completed. (Pass, Fail, Abort, Prior to NVM)
Works for both calibration and verification
Common core driver can operate in multiple modes of operation
Exclusive Resource
Maximum distribution
Shared Resource
Cadence Enforced Mode ( CEM-1, CEM-2, CEM-4)
CEM-1 = 1x1x1
CEM-2 = 1x2x2
CEM-4 = 1x4

24. “Asynchronous” Does Not Mean “Chaotic”
New token priority system helps manage asynchronous test processes
Key benefits:
Ensures maximum operator efficiency in the factory – minimal idle time
Asynchronous processes do not need to be aware of other processes
DUT #1
DUT #2
DUT #3
DUT #4
Time
Unmanaged Asynchronous Processes
Maximum Asynchronous Distribution

25. Synchronizing Asynchronous Processes
How do we go from:
DUT #1
DUT #2
DUT #3
DUT #4
Here
DUT #1
DUT #2
DUT #3
DUT #4
…to here?
Asynchronous
Synchronous

26. Combining APT & SPT
By leveraging token prioritization, the test program can automatically align multiple asynchronous processes
Key benefits:
Same operational benefit of APT, and eliminates wait time between Cal and Ver
Again, asynchronous processes do not need to be aware of other processes
DUT #1
DUT #2
DUT #3
DUT #4
Time
Asynchronous Processes
Synchronous Processes

27. Technology Trends: Multi-DUT and Panel Test 4 / 8 DUT, Asynchronous & Synchronous Parallel Test
1-DUT / Ping-Pong
4 / 8-DUT Asynchronous
4 / 8-DUT Synchronous    
1dut to 4dut/8dut to panel testing 

28. LitePoint – Continuous Throughput Improvement
Test innovation enabled through close cooperation with chipset providers and OEMs
4 / 8 DUT Parallel Test (WiFi / BT)
Throughput
IQxel-M
First in Multi-DUT Parallel Test (2G/3G/4G)
IQxstream
MPS
FAST PER
IQ2010
2008
2011
2013
2014

29. Concurrent Test vs. Serial Test
Traditional approaches test multiple radios serially (“one at a time”)
WiFi
Bluetooth®
Serial testing requires long test times
GPS / GNSS FM
Serial Tester
WiFi BT
GPS
GNSS FM
Test time
Concurrent testing
Significantly reduces test time
Up to 50%
IQxel-M offers concurrent testing of multiple radios
WiFi
WiFi
GPS FM BT
Bluetooth®
GPS/GNSS
GNSS FM
Test time
* DUT O/S must support concurrent test

30. Multi-DUT Configuration
Presentation Title
Connectivity VSA
Connectivity VSG
Signal Routing
Broadcast
VSG
Navigation
Example set up of 4 smart phones for WLAN/BT, GPS / GLONASS and FM test

31. Flexible Multi-DUT Testing
Manual Loading
Manual Loading
Automated Loading
1-DUT Sequential (1x1 ping-pong)
Multi-DUT Asynchronous (4 devices in semi-parallel)
Multi-DUT Synchronous (4 devices in full parallel)
2013 and before
Now
When you’re ready
a smooth transition to automated, multi-DUT testing

32. Formula LitePoint – Real Cases32

33. META Turbo for MTK
DUT
Fromula LitePoint
DUT1
DUT2
DUT3
DUT4

34. CFT Turbo for SpreadTrum
DUT
Fromula LitePoint
DUT1
DUT2
DUT3
DUT4

35. META Turbo Promotion 2.7 1.4 1.0 Test time/DUT UPH: 1.7x higher
Cal + Verf，MTK ATE
GSM 3bands，WCDMA 2bands
148s
Boot up
25s
Test Time
104s
123s
25s
81s
Test time/DUT
UPH: 1.7x higher
Same Tool, same operation
Less stations, operators, and PCs.
55s
55s
*Turbo approcah hide all boot up time cost
2.7
1.4
65pcs
1.0
UPH
34pcs
24pcs
AG8960
(1-DUT)
IQXS
(1-DUT)
IQXS
(4-DUT)

36. Before: you have to
Many manufacturers still rely on stacks of large outdated devices, that are expensive and hard to manage. 36

37. Today: You and LitePoint37

38. Providing Best Test Economics
Focus on the problem
Purpose-built for manufacturing to achieve lowest test cost, highest reliability, and best test yield
Operational innovation through Continuity Fault Detection and automated path loss calibration
Minimize test costs – maximize product quality
Reduce test times while increasing test coverage
Pioneering multi-DUT test
Maximizing parallelism with minimal resource idle time
Future-looking test techniques with concurrent test engines
Support
Providing wireless measurement expertise – not just instrument support
Providing total chipset solutions, enabling optimal performance

40. Global Footprint, Local Support
Copenhagen
Chicago
Gumi
Sunnyvale
Chengdu
Haifa
Tokyo
San Diego
Shanghai
LitePoint offers world-class, local support.
LitePoint solutions are fully supported by local LitePoint personnel, often on-site. We’ll help implement in local environments and provide ongoing support. If you’re there, we’ll be there.
We have people solving problems, not just products solving problems. We are out there looking to solve the customer’s problem, be your partner, and make sure you get the most out of LitePoint products.
Our goal is to delight the local customer. We like to provide global customers with a clone of what we have in Sunnyvale.
INSERT examples about custom, local solutions (Taipei?)
Taipei
Shenzhen