Presentation on theme: "효율적 테스트/디버그를 위한 디자인과 테스트 업체의 연구 방안"— Presentation transcript:
1 효율적 테스트/디버그를 위한 디자인과 테스트 업체의 연구 방안 ATE Debugging tool효율적 테스트/디버그를 위한 디자인과 테스트 업체의 연구 방안Add indicator in which release the feature isKorea Test ConferenceJin-Soo KoJune 25, 2014
2 SW and debug tools magnify needle! Improve supporting features under Claims
3 Market trends driving ATE SW tOOL roadmap Test EngineerShorter Time To MarketLess Than 15 Days Si to SamplesFunctional IntegrationLarge Test ListsCollaborative DevelopmentQuality<100 DPM For Mobility DevicesComplex FlowsIncreased Device Configuration and RepairCOT PressuresHigher Multisite, Concurrent Test, Datalog overheadFaster Time To Volume>1M devices within 2 Months
4 IG-XL: #1 in ATE Software - Why need Good SW-debug tool? IG-XL has been ranked #1 in ATE Software for the last four years by VLSI Customer Satisfaction Research Survey30% faster test program development timeNative MultiSite, Program Modularity, Templates, “Debug in the Zone”, Complete tool set, ESAOptimal throughput early in the product ramp resulting in faster time to profits.IG-XL’s Pure Parallel, Native MultiSite, Background DSP, TrueCT, TimelinesFaster time to entitled yieldScan fail capture throughput, APIs to design environments, Protocol AwareImprove supporting features under ClaimsBetter quality programs that result in fewer RMAs and defect escapesVBT, Spike-Check tool, Simulation Tools, IG-Review, IG-DiffNew users become self sufficient fasterEasy to learn programming language, DUT Centric use model, Template programming
5 Design Test Design Loop “off tester” tools“on tester” toolsFailure Analysis / Yield EnhancementOn-Tester Debug/ Characterization (hours/minutes)STDFDesignSimulationEDA-based Pattern ViewerSimultaneous display of EDA and tester informationDiagnose Physical Device FaultseventstransactionsATPGTiming/LevelsMixed SignalRepeatabilityCorrelationPattern & Test program. Gen.
6 How are scan failures resolved now? Tools are not integratedInformation is lost or delayed between Test / Design / FAInvestigations can take weeks to complete
7 The tester is only part of a bigger process Advanced ATE SW tools for Time to MarketTeradyne Confidential
8 OpenEDA: Connecting ATE SW (IG-XL) to the entire design and test environment High Volume Manufacturing:Test Floor ManagementFactory Data ManagementAdaptive TestPart Average TestingOperator InterfacesPeripherals and HandlersYield MonitoringOEEDesign and Test Development:EDA LinksTest Program GenerationFeedback To SimulationTest-Design IntegrationYield LearningData Analysis
9 What The Test Engineer Sees…. POP Since the Engineer can control all the events from one pattern, we have Pattern Oriented Programming (POP)Program Instrumentswith Psets (All instruments in parallel)Select Source SignalExact TimelineTrigger measurements at precise timesAutomatic data moveand processingReprogram Instrumentswith PSetsSelect different Source Signal-3dBTrigger measurements at precise timesAutomatic data moveand processing…and so on…
10 Concurrent test tool Timeline viewer Development Challenges Serial Test FlowTestsBlock ABlock BBlock CBlock DBlock EBlock FTestTimeInitialFull FunctionalTestsBlock ABlock BBlock CBlock DBlock EInitialBlock FTestTimeFull FunctionalConcurrent Test FlowDevelopment ChallengesCommon bus/pinsShared test resourcesFlow manipulationMulti-site implementationAdaptive test & RetestDebug toolsDifferent screens shots for A and B
11 Separate test code & data for each sub program Multi-sheet use model= no more manual merging of sub programsSeparate test code & data for each sub programTied together at the Job List SheetIG-XL completes the Multi-Sheet ModelSub-Program ADifferent screens shots for A and BEnabler for independent developmentReduces time to integrateSub-Program B
12 RF tools- LTE-A TX signal debug tool and result IG-XL 7.30ESA 2.03GPP LTETD-SCDMA802.11n 4x4 MIMOVSA 10.011 port vectorPower de-embeddingSignal sheet supportSmith chartingIG-XL 7.40ESA 2.53GPP LTE UpdateBluetooth 3.0VSA 11IG-XLESA 3.0LTE 8.9VSA12IG-XL 8.10ESA 3.5LTE-A (R10)802.11acVSA 14IG-XL 8.20ESA 4.0LTE-A (100MHz)802.11ac (160MHz)802.11ac (80+80)BT 4.0 (LE)VSA 1690% reduction in VSA instance creation timesNeed to add features beyond
13 Integrated Mobile Device Protocol Aware“Stored Response” ATEComplex Device ArchitectureTries to TestIntegrated Mobile DeviceCPUDRAMI/FFlashJTAGUSBDSPBBProcPower MgmtFunctionsAudio / BBGPS3G RFWiFiFM/TVWrite.jtag ( ADDR: 04h, DATA: 55h)Read.jtag (ADDR: 0Ah, DATA read_var)Protocol StudioFor online debug of protocol transactionsTransaction resultsDebug displaysData capture setupsModule managementPort PropertiesNeed to add features beyondProtocol Definition EditorFor defining and modifying protocols
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