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Study of wire cutting effects on surfaces of diamond turned copper structures S. Heikkinen CERN TS/MME/MM Team meeting 18.6.2008 Motivation: Why structures.

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Presentation on theme: "Study of wire cutting effects on surfaces of diamond turned copper structures S. Heikkinen CERN TS/MME/MM Team meeting 18.6.2008 Motivation: Why structures."— Presentation transcript:

1 Study of wire cutting effects on surfaces of diamond turned copper structures S. Heikkinen CERN TS/MME/MM Team meeting 18.6.2008 Motivation: Why structures after CTF-3 high power test (and wire cutting) do look like this? Surfaces full of pits

2 A test was performed Specimen: Output coupler of high power tested 30GHz Mo iris structure Slice cut for reference before wire cutting The rest went through a similar wire cutting process as the structures. Reference slice “Before wire cut” Reference slice “Before wire cut” Test piece “After wire cut” Test piece “After wire cut” 1. Mechanical cut 2. Wire cut

3 Specimens on a SEM stage After wire cut Before wire cut

4 SEM images of the diamond turned surfaces Before wire cutAfter wire cut

5 SEM images of the diamond turned surfaces Before wire cutAfter wire cut

6 SEM images of the diamond turned surfaces Before wire cutAfter wire cut

7 SEM images of the diamond turned surface Region close to wire cut Wire cut Diamond turning

8 SEM image of the rough machined surface far away from the wire cut

9 Some related structures tested and inspected earlier: 30CNSD1P2.Cu, 30 GHz disc structure brazed diamond turned discs, fabricated 2002-2003 high power tested in CTF-3, 2007 wire cut for the post mortem inspections, 2007-2008 https://edms.cern.ch/cedar/plsql/doc.info?cookie=7534124&document_id=888479&version=3

10 Some related structures tested and inspected earlier: 30CNS2P3.Cu, 30 GHz disc structure brazed diamond turned discs, fabricated 2002-2003 high power tested in CTF-3, 2007 wire cut for the post mortem inspections, 2007-2008 https://edms.cern.ch/cedar/plsql/doc.info?cookie=7534124&document_id=892745&version=3

11 Some related structures tested and inspected earlier: 30 GHz disc structure brazed diamond turned discs, fabricated <2003 high power tested in CTF-2, <2003 wire cut for the post mortem inspections, 2003

12 Known phenomena Due to: contaminations inadequate flushing and penetration of the EDM dielectric fluid

13 Conclusion: Wire cutting causes pitting to the cut and adjacent surfaces Poor flushing due to cavity geometry Flushing difficult to be improved Recommended: Use other cutting techniques


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