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LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)1 A case study.

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Presentation on theme: "LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)1 A case study."— Presentation transcript:

1 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)1 A case study of test program generation J. M. Martins Ferreira FEUP / DEEC - Rua dos Bragas 4050-123 Porto - PORTUGAL Tel. 351-22-2041748 / Fax: 351-22-2003610 (jmf@fe.up.pt / http://www.fe.up.pt/~jmf)

2 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)2 Objectives To present practical BS test problems through a real case study To analyse the implementation of the test protocol using the test instruction set proposed earlier To enable the student to acquire the necessary experience to develop small test programs for specific test situations To enable hands-on sessions

3 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)3 Outline The demonstration board The information required for test program generation The test vectors The test program

4 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)4 The demonstration board (block diagram)

5 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)5 Information required for checking the BS infrastructure

6 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)6 Information required for full-BS interconnects (1) Number and identification of the BS chains Is the interconnect tied to GND or V CC ? For output pins: –Number of output pins and location of the output cell, the control cell (if any) and the tristate control value For input pins: –Number of input pins and location of the input cell

7 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)7 Information required for full-BS interconnects (2) For bidirectional pins: –Number of bidirectional pins and location of the output cell, the input cell, the control cell and the tristate control value For primary input pins: –Number of primary inputs, identification and tristate control value For primary output pins: –Number and identification of primary outputs

8 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)8 The IC1+IC2 non-BS cluster

9 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)9 Information required for testing the IC1+IC2 cluster (1)

10 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)10 Information required for testing the IC1+IC2 cluster (2) HILO generated 5 test vectors to provide 100% fault coverage of stuck-at pins in both components

11 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)11 The IC6 non-BS cluster

12 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)12 Information required for testing the IC6 cluster (1)

13 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)13 Information required for testing the IC6 cluster (2) HILO generated 5 test vectors to provide 100% fault coverage of stuck-at pins in IC6

14 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)14 Information required for testing the BS components

15 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)15 The test vectors A modified version of the self-diagnosis algorithm generated 6 test vectors for complete short-circuit fault detection in the 24 full-BS interconnects:

16 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)16 The serialised test vectors

17 LEONARDO INSIGHT II / TAP-MM ASTEP - A case study of test program generation © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)17 The test program

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