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April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 281 Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard n Motivation n Bed-of-nails tester n System view.

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Presentation on theme: "April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 281 Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard n Motivation n Bed-of-nails tester n System view."— Presentation transcript:

1 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 281 Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard n Motivation n Bed-of-nails tester n System view of boundary scan hardware n Elementary scan cell n Test Access Port (TAP) controller n Boundary scan instructions n Summary

2 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 282 Motivation for Standard n Bed-of-nails printed circuit board tester gone  We put components on both sides of PCB & replaced DIPs with flat packs to reduce inductance n Nails would hit components  Reduced spacing between PCB wires n Nails would short the wires  PCB Tester must be replaced with built-in test delivery system -- JTAG does that  Need standard System Test Port and Bus  Integrate components from different vendors n Test bus identical for various components n One chip has test hardware for other chips

3 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 283 Bed-of-Nails Tester Concept

4 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 284 Bed-of-Nails Tester

5 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 285 Purpose of Standard n Lets test instructions and test data be serially fed into a component-under-test (CUT)  Allows reading out of test results  Allows RUNBIST command as an instruction n Too many shifts to shift in external tests n JTAG can operate at chip, PCB, & system levels n Allows control of tri-state signals during testing n Lets other chips collect responses from CUT n Lets system interconnect be tested separately from components n Lets components be tested separately from wires

6 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 286 System Test Logic

7 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 287 Instruction Register Loading with JTAG

8 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 288 System View of Interconnect

9 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 289 Boundary Scan Chain View

10 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2810 Elementary Boundary Scan Cell

11 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2811 Serial Board / MCM Scan

12 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2812 Parallel Board / MCM Scan

13 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2813 Independent Path Board / MCM Scan

14 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2814 Tap Controller Signals n Test Access Port (TAP) includes these signals:  Test Clock Input (TCK) -- Clock for test logic n Can run at different rate from system clock  Test Mode Select (TMS) -- Switches system from functional to test mode  Test Data Input (TDI) -- Accepts serial test data and instructions -- used to shift in vectors or one of many test instructions  Test Data Output (TDO) -- Serially shifts out test results captured in boundary scan chain (or device ID or other internal registers)  Test Reset (TRST) -- Optional asynchronous TAP controller reset

15 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2815 Tap Controller State Diagram

16 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2816 Tap Controller Timing

17 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2817 TAP Controller Power- Up Reset Logic

18 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2818 Boundary Scan Instructions

19 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2819 SAMPLE / PRELOAD Instruction -- SAMPLE Purpose: 1. Get snapshot of normal chip output signals 2. Put data on bound. scan chain before next instr.

20 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2820 SAMPLE / PRELOAD Instruction -- PRELOAD

21 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2821 EXTEST Instruction n Purpose: Test off-chip circuits and board- level interconnections

22 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2822 INTEST Instruction n Purpose: 1. Shifts external test patterns onto component 2. External tester shifts component responses out

23 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2823 INTEST Instruction Clocks n Control of applied system clock during INTEST n Use of TCK for on-chip system logic clock

24 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2824 RUNBIST Instruction n Purpose: Allows you to issue BIST command to component through JTAG hardware n Optional instruction n Lets test logic control state of output pins 1. Can be determined by pin boundary scan cell 2. Can be forced into high impedance state n BIST result (success or failure) can be left in boundary scan cell or internal cell  Shift out through boundary scan chain n May leave chip pins in an indeterminate state (reset required before normal operation resumes)

25 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2825 CLAMP Instruction n Purpose: Forces component output signals to be driven by boundary-scan register n Bypasses the boundary scan chain by using the one-bit Bypass Register n Optional instruction n May have to add RESET hardware to control on-chip logic so that it does not get damaged (by shorting 0’s and 1’s onto an internal bus, etc.)

26 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2826 IDCODE Instruction n Purpose: Connects the component device identification register serially between TDI and TDO  In the Shift-DR TAP controller state n Allows board-level test controller or external tester to read out component ID n Required whenever a JEDEC identification register is included in the design

27 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2827 Device ID Register -- JEDEC Code 27 12 Part Number (16 bits) 11 1 Manufacturer Identity (11 bits) 0 ‘1’ (1 bit) 31 28 Version (4 bits) MSBLSB

28 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2828 USERCODE Instruction n Purpose: Intended for user-programmable components (FPGA’s, EEPROMs, etc.)  Allows external tester to determine user programming of component n Selects the device identification register as serially connected between TDI and TDO n User-programmable ID code loaded into device identification register  On rising TCK edge n Switches component test hardware to its system function n Required when Device ID register included on user-programmable component

29 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2829 HIGHZ Instruction n Purpose: Puts all component output pin signals into high-impedance state n Control chip logic to avoid damage in this mode n May have to reset component after HIGHZ runs n Optional instruction

30 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2830 BYPASS Instruction n Purpose: Bypasses scan chain with 1-bit register

31 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2831 Optional / Required Instructions Instruction BYPASS CLAMP EXTEST HIGHZ IDCODE INTEST RUNBIST SAMPLE / PRELOAD USERCODE Status Mandatory Optional Mandatory Optional Mandatory Optional

32 April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 2832 Summary n Boundary Scan Standard has become absolutely essential --  No longer possible to test printed circuit boards with bed-of-nails tester  Not possible to test multi-chip modules at all without it  Supports BIST, external testing with Automatic Test Equipment, and boundary scan chain reconfiguration as BIST pattern generator and response compacter  Now getting widespread usage

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