1. nanoFIP Progress Report Eva. Gousiou BE/CO-HT & the nanoFIP team RadWG 23Nov11

2. Outline o Introduction – Project Organization o Functionalities & Features o nanoFIP & Simulation Test Bench o nanoFIP & Test Board o Next Steps

3. Outline o Introduction – Project Organization o Functionalities & Features o nanoFIP & Simulation Test Bench o nanoFIP & Test Board o Next Steps

4. Project Organization & Some History ALSTOM-CERN contract with CERN purchasing ALSTOM’s design information. (2008) Concerns for the long-term availability of ALSTOM’s components; WorldFIP Taskforce set up. (2006) Project divided in different Work Packages: (2009) WP1: microFIP code preliminary interpretation (B. Todd & E. van der Bij) WP2: project management documentation for the in-sourcing (E. van der Bij) WP3: functional specifications for microFIP’s replacement (E. van der Bij) WP4: rewrite & extend microFIP VHDL code WP5: write new code (P. Alvarez & E. Gousiou) WP6: test bench creation (G. Penacoba) WP7: design of a board for functional and radiation tests (HLP, France ) WP8: Radiation tests (CERN RadWG & E. Gousiou) Taskforce conclusions: No technological alternative & in-sourcing of WorldFIP technology. (2007) 4

5. Outline o Introduction – Project Organization o Functionalities & Features o nanoFIP & Simulation test bench o nanoFIP & HLP test board o Next Steps

6. WorldFIP services: Data consumption & Broadcast data consumption (up to 124 bytes). Data production (up to 124 bytes). Functionalities & Features 6 nFIP WorldFIP Master user consumption

7. WorldFIP services: Data consumption & Broadcast data consumption (up to 124 bytes). Data production (up to 124 bytes). Functionalities & Features 7 nFIP WorldFIP Master user production

8. Simple interface with the user: Data transfer over an integrated memory or Functionalities & Features nanoFIP user WISHBONE MEMORY 8 WorldFIP services: Data consumption & Broadcast data consumption (up to 124 bytes). Data production (up to 124 bytes). nFIP WorldFIP Master user

9. Simple interface with the user: Data transfer over an integrated memory or Functionalities & Features Data transfer in stand-alone mode (2 bytes data exchange, no need for memory access). nanoFIP user WISHBONE MEMORY 16 bit DATA BUS 9 WorldFIP services: Data consumption & Broadcast data consumption (up to 124 bytes). Data production (up to 124 bytes). nFIP WorldFIP Master user

10. Simple interface with the user: Data transfer over an integrated memory or Functionalities & Features Data transfer in stand-alone mode (2 bytes data exchange, no need for memory access). Features: Communication in 3 speeds: 31.25kb/s, 1Mb/s, 2.5Mb/s. Independent memories (124 bytes each) for consumed and produced data. nanoFIP status byte available to the User and the Master. nanoFIP user WISHBONE MEMORY 16 bit DATA BUS 10 WorldFIP services: Data consumption & Broadcast data consumption (up to 124 bytes). Data production (up to 124 bytes). nFIP WorldFIP Master user

11. nanoFIP & Radiation 11 TID > 200 Gy 10 LHC years > Component Selection o Actel ProASIC3 family Flash-based & reconfigurable Proven performance in radiation environments (ALICE, nQPS, NASA). Techniques o Triple Module Redundancy of all the flip-flops & memories of the design. o Simplification. o Various reset possibilities.

12. microFIP FPGA sensor Signal Conditioner sensor Signal Conditioner nanoFIP vs. microFIP nanoFIP is: nanoFIP is not: o Tailored to users’ needs. o Providing bigger memories. o Providing a rigorous approach towards radiation. o nanoFIPs and microFIPs can co-exist under the same Master. o Backwards compatible for the user. sensor Signal Conditioner World FIP Master 12

13. nanoFIP FPGA nanoFIP vs. microFIP nanoFIP is: nanoFIP is not: o Tailored to users’ needs. o Providing bigger memories. o Providing a rigorous approach towards radiation. o nanoFIPs and microFIPs can co-exist under the same Master. o Backwards compatible for the user. sensor Signal Conditioner sensor Signal Conditioner sensor Signal Conditioner 13

14. Outline o Introduction – Project Organization o Functionalities & Features o nanoFIP & Simulation Test Bench o nanoFIP & HLP Test Board o Next Steps

15. VHDL test bench: o Random generation of data vectors o Automatic checks o Assertion based output Independent development of nanoFIP’s simulation test bench by Gonzalo Penacoba. nanoFIP & Simulation test bench 3 testing concepts: o Functionality according to specs o Behavior under specs error conditions o Unspecified faulty conditions User simulation Master simulation nanoFIP 15

16. Outline o Introduction – Project Organization o Functionalities & Features o nanoFIP & Simulation test bench o nanoFIP & HLP Test Board o Next Steps

17. nanoFIP & HLP test board 3 testing concepts: o Specs correct functionality o Limit operational conditions o Tests over time Software developments on the Master side taken over by Julien Palluel. Working Testing Board prototype by HLP. 17

18. Testing Board Basic Features 18 nanoFIP user WorldFIP Master WorldFIP FIELDBUS Field TR Fiel drive RS 232

19. nanoFIP Testing Board Basic Features user 19 Field TR Fiel drive RS 232 WorldFIP Master WorldFIP FIELDBUS

20. nanoFIP Testing Board Basic Features user 20 Field TR Fiel drive RS 232 WorldFIP Master WorldFIP FIELDBUS

21. nanoFIP Testing Board Extra Features user 21 Field TR Fiel drive RS 232 WorldFIP Master WorldFIP FIELDBUS

22. nanoFIP Testing Board & Radiation Tests user 22 Field TR Fiel drive RS 232 WorldFIP Master WorldFIP FIELDBUS

23. nanoFIP Testing Board & Radiation Tests user 23 Field TR Fiel drive RS 232 WorldFIP Master WorldFIP FIELDBUS

24. nanoFIP Testing Board & Radiation Tests user 24 Field TR Fiel drive RS 232 WorldFIP Master WorldFIP FIELDBUS

25. Testing Board & Radiation Tests PSI facility, 250MeV 2.1e9 p+/cm 2 / Gy 300 Gy lifetime of an Actel ProASIC3 device 6.3 e11 p+/cm 2 with each device 6.3 e12 p+/cm 2 with 10 decices σ nanoFIP = ~ 1e-13 cm 2 5000 nanoFIPs in the LHC σ system = ~ 5e-10 cm 2 10 SEU / year

26. user nanoFIP Cons Prod Testing Principles WorldFIP Master WorldFIP FIELDBUS Cons FF..FF t ime 26

27. user nanoFIP Cons Prod Testing Principles WorldFIP Master WorldFIP FIELDBUS Loop back User copies bytes prod Cons FF..FF t ime 27

28. user nanoFIP Cons Prod Testing Principles WorldFIP Master WorldFIP FIELDBUS Loop back User copies bytes Cons EE..EE Prod FF..FF User copies bytes prod Cons FF..FF t ime 28

29. user nanoFIP Cons Prod Testing Principles WorldFIP Master WorldFIP FIELDBUS Loop back User copies bytes Cons EE..EE Prod FF..FF 5ms User copies bytes prod Cons FF..FF t ime User copies bytes Cons EE..EE Prod FF..FF 29

30. Outline o Introduction – Project Organization o Updates on Functional Specification o nanoFIP & Simulation test bench o nanoFIP & HLP test board o Next Steps

31. Next Steps Radiation tests. Support to users; User’s Guide & FAQ documentation. Code Review. 31

32. nanoFIP project report Extras

33. WorldFIP Frames Communication throughput for 1Mbps: FSS 2 bytes Ctrl 1 byte Id 2 bytes CRC 2 byte FES 1 byte 8 bytes * 8 bits* 1 us FSS 2 bytes Ctrl 1 byte Data 124 bytes CRC 2 byte FES 1 byte 130 bytes * 8 bits * 1us Master -> nanoFIP nanoFIP -> Master 1.1 ms for 124 data-bytes = 0.9 Mb/s Master -> nanoFIP nanoFIP -> Master turnaround time 10 us FSS 2 bytes Ctrl 1 byte Id 2 bytes CRC 2 byte FES 1 byte FSS 2 bytes Ctrl 1 byte Data 2 bytes CRC 2 byte FES 1 byte 10 us 138 us for 2 data-bytes = 0.1 Mb/s 33 turnaround time

34. Project Status Majority voter circuit: 34

35. Extra features: nanoFIP & HLP test board o Heaters & Thermometers on nanoFIP & Fieldrive, controlled & monitored through the user interface o Voltmeters & Current-meters for all Voltage Supplies & Current Consumptions

36. nanoFIP & HLP test board user WorldFIP Master nanoFIP Cons Prod prod Cons FF..FF Loop back Automatized Testing Principles:

37. Cons EE..EE nanoFIP & HLP test board user WorldFIP Master nanoFIP Cons Prod FF..FF prod Cons FF..FF Loop back Automatized Testing Principles:

38. Cons EE..EE nanoFIP & HLP test board user WorldFIP Master nanoFIP Cons Prod FF..FF prod Cons FF..FF Loop back Prod 1 cons 2 Prod EE..EE Cons DD..DD Automatized Testing Principles: