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Data Acquisition ET 228 Chapter 15 Subjects Covered Analog to Digital Converter Characteristics Integrating ADCs Successive Approximation ADCs Flash ADCs.

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Presentation on theme: "Data Acquisition ET 228 Chapter 15 Subjects Covered Analog to Digital Converter Characteristics Integrating ADCs Successive Approximation ADCs Flash ADCs."— Presentation transcript:

1 Data Acquisition ET 228 Chapter 15 Subjects Covered Analog to Digital Converter Characteristics Integrating ADCs Successive Approximation ADCs Flash ADCs Frequency Response of ADCs Analog to Digital Converter Characteristics Key Aspects ADC Resolution Quantization Error Offset Error Gain Error ADC Resolution Same as for DAC Resolution of the ADC = 2 n

2 Data Acquisition ET 228 Chapter 15 Analog to Digital Converter Characteristics ADC Resolution Same as for DAC »Text commonly uses 1 LSB for  V in for a change of 1 LSB »Text commonly uses FSR for V FSR Maximum Identifiable Input Voltage Text commonly refers to it as V ifs and calls it the Maximum Full Scale Input Voltage »V ifs = FSR - 1 LSB »Causes all ones in the binary output Digital Output D = V IN /{1 LSB} Input/Output Graph for an ideal 3-bit ADC Figure 15-1 on page 432 Sample Problem 15-1 on page 432

3 Data Acquisition ET 228 Chapter 15 Analog to Digital Converter Characteristics ADC Resolution In Class Exercise Problem 1 on page 451 w/ 2.4V, 3.0V, and 4.5V as the input voltages Quantization Error Review Figure 15-1 for a Digital Output of 1/2 FSR or D=100 2 Output is the same for the Inputs + 1/2 LSB around the center This uncertainty is the quantization error Offset Error Output is off from the Ideal Usually expressed in terms of the LSB See Figure 15-2 on page 433 Example Problem 15-2 on page 434 In class exercise Example 15-2 but for Offset Error of +1/2 LSB

4 Data Acquisition ET 228 Chapter 15 Analog to Digital Converter Characteristics Gain Error Usually specified as a percentage of FSR A positive Gain Error lowers the input V that will yield all 1’s See Figure 15-3 on page 434 Example Problem 15-3 on page 435 Linearity Error Figure 15-4 on page 435 Types of ADCs Integrating Usually for slowly changing Analog Inputs Usually needs approximately 300 ms Successive Approximation Converges in a few microseconds

5 Data Acquisition ET 228 Chapter 15 Types of ADCs Flash Converters More costly Much faster - can be used to digitize video signals Integrating ADCs Key Phases of the conversion Signal Integrate Reference Integrate Auto-Zero See Figure 15-5 on page 437 Signal Integrate Phase Input Analog signal is applied to the Integrator Must be in the FSR of inputs V o ramps up in the opposite polarity of the input

6 Data Acquisition ET 228 Chapter 15 Integrating ADCs Signal Integrate Phase Sample Vin = -100 mV ----Vout of 833mV The Counter went through 1000 counts - each lasting 83.3  s for a total of 83.3 ms Period T 1 Reference Integrate During T 1 a capacitor C ref was charged with the reference voltage Constant magnitude, but with the opposite polarity of V in The higher V in the longer this period of time T 2 » See Figure 15-5 the T 2 for Vin = -200 mV is twice the period for Vin = - 100 mV T 2 = (Vin/Vref) T 1 with Vref = 100 mV & T 1 = 83.3 ms T 2 = (0.833 ms/mV)Vin

7 Data Acquisition ET 228 Chapter 15 Integrating ADCs Reference Integrate The Conversion Digital Output = (counts/second) T 2 = (counts/second) T 1 (Vin/Vref) with Vref = 100 mV & T 1 = 83.3 ms Digital Output = 12,000 (counts/second) (83.3 ms/100 mV) Vin with V ref = 100 mV & T 1 = 83.3 ms = (10 counts/mV) Vin Sample Problem 15-5 on page 439. The Auto-Zero C int is zeroed out

8 Data Acquisition ET 228 Chapter 15 Successive Approximation ADCs Uses a DAC and is digitally controlled See Figure 15-6 on page 440 Key Components Comparator DAC Successive Approximation Register (SAR) Eternal Logic Circuits Process DAC generates a signal that is compared with the input Only Greater Than or Less Than Comparisons Number of comparisons equal to the number of bits - much less than the number of possible DAC output values »3 bit => 3 verses 8 tests »8 bit => 8 verses 256 tests

9 Data Acquisition ET 228 Chapter 15 Successive Approximation ADCs Process Walk through Figure 15-7 on page 441 Note timing error with the Start and clock pulses Conversion Time Each of the comparisons uses a clock cycle Assumption the circuits are reset before the start of the test The resetting requires at least one clock cycle  T C = T(n + 1) T = period of the clock pulse n = the number of bits in the resolution of the ADC = the period of time required to perform a Successive Approximation A/D conversion Example Problem 15-6 on page 442

10 Data Acquisition ET 228 Chapter 15 Flash ADCs Very Component Intensive A 3-bit Flash ADC At least seven Comparators Eight to 3 line converter »Each input line causes a specific pattern on the three line output A 8-bit Flash ADC At least 255 Comparators 256 to eight line converter »Each input line causes a specific pattern on the eight line output A 10-bit Flash ADC At least 1023 Comparators 1024 to ten line converter Conversion Time Only limited by the response times of the Comparators

11 Data Acquisition ET 228 Chapter 15 Flash ADCs Conversion Time Only limited by the response times of the Logic Gates in the line converter Number of comparators 2 n - 1 Frequency Response of ADCs Key Aspects Aperture Error Sample-and-Hold Amplifiers Aperture Error Caused by Input changing more than +1/2 LSB Formula for the upper frequency limit for accurate A/D conversion of a sine wave

12 Data Acquisition ET 228 Chapter 15 Frequency Response of ADCs Aperture Error Example Problem 15-7 on page 450 ADC 8-bit w/T C = 10 µsec v = A·sinωt = A·sin(2πf)t Simplifying assumptions: A = 1V ΔT = 10 µsec f Max = 62Hz, 1 LSB = 2V/256 =7.8125 mV, 0.5LSB = 3.906mV v = A·sin(2πf)t w/t=0 µsec, and f = 61 Hz v = sin (6.2831853 · 61) ·0 = 0 A·sin(2πf)t w/t=10 µsec, and f = 61 Hz v = sin (6.2831853 · 61) · 10 µsec = 3.833mV v = A·sin(2πf)t w/t=0 µsec, and f = 63 Hz v = sin (6.2831853 · 63) ·0 = 0 A·sin(2πf)t w/t=10 µsec, and f = 63 Hz v = sin (6.2831853 · 63) · 10 µsec = 3.958mV

13 Data Acquisition ET 228 Chapter 15 Frequency Response of ADCs Sample-and-Hold Amplifier Key to increasing the Frequency response of ADCs Two OP-Amp Circuit with a high speed switch Figure 15-13 on page 451 Takes inputs when the switch is closed The Cap holds the inputted signal constant while it is converted by an external ADC  The T C can be used to represent the switch jitter variation Usually a much smaller number than the ADC conversion time Sample Problem 15-8 on page 451


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