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Appendix A Example of a Testability Design Checklist Route test/control points edge connector to enable monitoring and driving of internal board functions.

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Presentation on theme: "Appendix A Example of a Testability Design Checklist Route test/control points edge connector to enable monitoring and driving of internal board functions."— Presentation transcript:

1 Appendix A Example of a Testability Design Checklist Route test/control points edge connector to enable monitoring and driving of internal board functions and to assist in fault diagnosis. Divide complex logic functions into smaller, combinational logic sections. Avoid one-shots; if used, route their signals to the edge connector. Avoid potentiometers and "select-on- test" components.

2 Appendix A Example of a Testability Design Checklist Use a single, large-edge connector to provide input/output pins and test/control points. Make printed board input/output signal logic-compatible to keep test equipment interface costs low and give flexibility. Provide adequate decoupling at the board edge and locally at each integrated circuit. Provide signals leaving the board with maximum fan-out drive, or buffer them.

3 Appendix A Example of a Testability Design Checklist Buffer edge-sensitive components from the edge connector - such as clock lines and flip-flop outputs. Do not tie signal outputs together. Never exceed the logic rated fan- out; in fact, keep it to a minimum. Do not use high fan-out logic devices. do use multiple fan-out devices, and keep their outputs separate.

4 Appendix A Example of a Testability Design Checklist Keep logic depth on any board to a low level by using edge terminated test/control points. Single-load each signal entering the board whenever possible. Terminate unused logic pins with a resistive pull-up to minimize noise pick-up. Do not terminate logic outputs directly into transistor bases. do use a series current-limiting resistor.

5 Appendix A Example of a Testability Design Checklist Buffer flip-flop output signals before they leave the board. Use open-collector devices with pull- up resistors to enable external override control. Avoid using redundant logic to minimize undetectable faults. Bring outputs of cascaded counters to higher- order counters so that they can be tested without large counts.

6 Appendix A Example of a Testability Design Checklist Construct trees to check the parity of selected groups of eight bits or fewer. Avoid "wired'OR" and "wired'AND" connections. If you cannot, use gates from the same integrated circuit package. Provide some way to bypass level- changing diodes in series with logic out-puts.

7 Appendix A Example of a Testability Design Checklist Break paths when a logic element fans out to several places that converge later. Use elements in the same integrated circuit package when designing a series of inverters or inverters following a gate function. Standardize power-on and ground pins to avoid test-harness multiplicity.

8 Appendix A Example of a Testability Design Checklist Bring out test points as near to digital-to-analog conversion as possible. Provide a means of disabling on- board clocks so that the tester clock may be substituted. Provide mounted switches and resistor-capacitor networks with override lines to the edge-board connector.

9 Appendix A Example of a Testability Design Checklist Route logic drivers of lamps and displays to the edge connector so that the tester can check for correct operation. Divide large printed boards into subsections whenever possible, preferably by function. Separate analog circuits from digital logic, except for timing circuits.

10 Appendix A Example of a Testability Design Checklist Uniformly mount integrated circuits and clearly identify them to make it easier to locate them. Provide sufficient clearance around integrated circuit sockets and direct- soldered integrated circuits so that clips can be attached whenever necessary. Add top-hat connector pins or mount extra integrated circuit sockets when there are not enough edge-board connector pins for test/control points.

11 Appendix A Example of a Testability Design Checklist Use sockets with complex integrated circuits and long, dynamic shift registers. Wire feedback lines and other complex circuit lines to an Use jumpers that can be cut during debugging. The jumpers can be located near the edge-board connector.

12 Appendix A Example of a Testability Design Checklist Fix locations of power and ground lines for uniformity among several board types. Make the ground conductor large enough to avoid noise problems. Group together signal lines of particular families. Clearly label all parts, pins and connectors.


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