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Munich, 18 Oct 2006J. Cvach, annual JRA31 JRA3 Institute of Physics ASCR Prague 1.ECAL, VFCAL (V. Vrba) 2.HCAL (J. Cvach) 3.Exchange in NA2 (travels 8.5.

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Presentation on theme: "Munich, 18 Oct 2006J. Cvach, annual JRA31 JRA3 Institute of Physics ASCR Prague 1.ECAL, VFCAL (V. Vrba) 2.HCAL (J. Cvach) 3.Exchange in NA2 (travels 8.5."— Presentation transcript:

1 Munich, 18 Oct 2006J. Cvach, annual JRA31 JRA3 Institute of Physics ASCR Prague 1.ECAL, VFCAL (V. Vrba) 2.HCAL (J. Cvach) 3.Exchange in NA2 (travels 8.5 k€)

2 Munich, 18 Oct 2006J. Cvach, annual JRA32 Tasks in EUDET & budget w/o overheads  Si sensor development for ECAL, VFCAL  Monitoring system for HCAL  Consumables - 81.7 k€ Si sensor development + production (34.6 k€) VME test stand (25742 €), calibration electronics (16.5 k€) computing (4.9 k€)  Personnel - 13 k€ for PhD students, young postdocs  Travels 4 k€  Contribution from the Institute Permanent staff – 67 ppm Travels (6.7 k€)

3 Václav Vrba, SI ECAL Sensor Status 2006 Si Sensors for ECAL (V. Vrba) Sensor ECAL prototype production:  2006: in four production runs of Si pad sensors at ON Semiconductor we obtained 72 good fully tested wafers which have been integrated into ECAL prototype  January-July 2006: wafers delivered to Ecole Polytechnique 7 ECAL layers equipped with ON Semiconductor wafers  end of 2006: additional fabrication run at ON Semiconductor is planned to produce about 60 wafers for the full instrumentation for 2007 test beam. DET1DET1 DET2DET2 DET3DET3 DET4DET4 DET5DET5 DET6DET6 DET7DET7 DET8DET8 DET9DET9

4 Munich, 18 Oct 2006Václav Vrba, ECAL status I-V curves on pad arrays

5 Munich, 18 Oct 20065 Reverse current long term stability 2 weeks

6 Munich, 18 Oct 2006V. Vrba, ECAL status6 Sensor testing @ Institute of Physics AS CR  Test laboratory for measurement of Si sensors Senzors from ON Semiconductor, Czech Republic EUDET tasks Design studies for finer granularity (5x5 mm 2 ) of Si sensors are under way Possibility to use 6” wafers is also investigated

7 Munich, 18 Oct 2006J. Cvach, annual JRA37 HCAL - Calibration + Monitoring Board system (I. Polák) CMB provides  calibrated UV flashes to the scintillator tiles  optical feedback via PIN photodiode  sensing of temperature at scintillator planes and on CMB  connection via CANbus to the detector Slow Control  monitoring of temperature, voltages, …  setting enable, amplitude, pulse width of each LED

8 Calibration and monitoring board II  Calibration & monitoring board – to deliver LED light dynamic range 0.5 – 100 MIP  Functions LED control  Amplitude (via DAQ, CANbus, standalone)  Pulse width: 5 ns   Enable PIN diode readout Temp monitoring  Measurement of nonlinearity LED intensity varied by DAQ Intensity measured by PIN Absolute calib from linear part 3 pulse generators 12 PIN ampli control 1V 10 ns

9 Munich, 18 Oct 2006J. Cvach, annual JRA39 Calibrating 18 SiPM with one LED Gain calibration for a matrix of 18 SiPM connected to the same LED

10 Munich, 18 Oct 2006J. Cvach, annual JRA310 HCAL plane CMB boards during CERN tests

11 Munich, 18 Oct 2006J. Cvach, annual JRA311 VME stand – durable equipment financed from the EUDET project  Replacement of old CAMAC and NIM modules  Measurements of signals from photodetectors (PM, APD, …)  9 pieces of APDs, Hamamatsu S 8664-s  12 bit QDC, 16 chan., V792N  Controller V2718 connected by optical cable to PC  Reading, control with Labview  4-channel power supply N472  GPIB, serial bus  Scope TDS 5104

12 Munich, 18 Oct 2006J. Cvach, annual JRA312 Stand is operational – a EUDET milestone  Labview chart of signal processing LED  4 fibres read by APD +QDC  Ivo pulser + V993 dual timer – 1 kHz  What we gained? Larger dynamic range 10bit  12bit QDC Sophisticated system (new, VME)  Short term usage: long term tests of CMB Linearity dependence of 4 channels (APDs) to the increase (Vcalib) of the LED light InitialisationQDC readingInput buffer decoding Jan Smolík J. Zálešák

13 Munich, 18 Oct 2006J. Cvach, annual JRA313 Future stand use  Long term tests and better understanding of CMB  Use a CMB board with (8 LED & PIN diodes) + 8 APDs  16 QDC chan. APD

14 Munich, 18 Oct 2006J. Cvach, annual JRA314 Our immediate tasks in EUDET  Production of Si wafers for ECAL module successfully integrated into the prototype and operated in the test beam Design studies for finer granularity (5x5 mm 2 ) of Si sensors are under way; Possibility of the use of 6” wafers is investigated;  Students and young physicist (Petr Mikes, Michal Marcisovsky, Pavel Ruzicka, Miroslav Havranek) are involved in the project activities participating in the laboratory sensor evaluation, test beam runs at DESY and CERN, data analysis, simulation etc. They also participate in regular collaboration meetings.  HCAL – calibration electronics 2006: 40 (double) boards produced, 23 installed in the prototype, one half financed from EUDET Investigations of functionality and long term stability of CMB  Participation in tests and data analysis

15 Munich, 18 Oct 2006J. Cvach, annual JRA315 Resources EUDET  Main contribution from EUDET - consumables  Upper table – our JRA3 spending profile by tasks  Lower table – spending according to categories yearPerm staff Temp staff Consum ables TravelDurable equipm Over- heads Total (€) Install ment 2006 3256 430815 356 4742 2860 610436 62536 740 2007 8581 2008 8581 2009 5720 total25742 yearHCALECALVFCAL 200612 k€6 k€2 k€ 20071265 20081475 20096,551,94,15


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