1. 1 Design Review Feb 02 H.MATHEZ P.PANGAUD IPNL CNRS SUMMARY OF STATISTICAL RESULTS OVER 1 500 CHIPS TESTED (FPPA 2000)

2. 2 Design Review Feb 02 H.MATHEZ P.PANGAUD IPNL CNRS To test the FPPA2000 we used the well known Labview software and GPIB instruments to polarize and drive the circuit. Some on line cuts allow us to remove very bad circuits. We made some off line cuts on several parameters in order to understand the FPP2000's behavior. Off line cuts were made at the level of ±20% and based on the first 170 tested chips. In a second time we made off line cuts at the level of ±5% to sort out all the circuits. All outputs voltage are measured with 50  adapted buffer, so all measurement must be multiply a factor of 2. Cuts are made on the following parameters : Base line pre-amplifier and gain amplifier P2/P1 and P3/P2 ratios Peaking Time pre-amplifier and gain amplifier Power supplies Slow Control measurements Logic part (different modes) Clock The ratio P2/P1and P3/P2 which represent the ratio of pre-amplifier or gain amplifier output for two different input charges. This ratio must be equal to the input charge ratio if the circuit works well.

3. 3 Design Review Feb 02 H.MATHEZ P.PANGAUD IPNL CNRS FPPA_2000 Vref_in Temp_in Leakage_in Rtest CLK_in CLK_out /CLK_in FPPA_out PA_out PA_in /CLK_out CLK_comp K_236 K_237 CLK_GEN CSA803 TDS644 PeakO_PULSE Power Supply D K_2000_1 K_2000_2 GPIB_16 GPIB_15 GPIB_6 Power Supply A GPIB_7 GPIB_10 GPIB_5 GPIB_2 GPIB_30 GPIB_8 M1 M2 Trig 1234 Ext_Dir Mode Write/Read PCI card PC + Labview FPPA2000 TEST BENCH 11 GPIB instruments

4. 4 Design Review Feb 02 H.MATHEZ P.PANGAUD IPNL CNRS TESTBENCH IN FARADAY ROOM FPPA UNDER TEST PCB OZTEK SOCKET FPPA2000 TEST BENCH

5. 5 Design Review Feb 02 H.MATHEZ P.PANGAUD IPNL CNRS 1 pC 10 pC 40 pC (after ± 20% off line cut)  Peaking-time (charge Inj)  5 ns  ase line (charge Inj) = Cte PRE-AMPLIFIER PEAKING TIME and BASE LINE vs CHARGE INJECTION Base line = 540 mV Peaking-time  50 ns

6. 6 Design Review Feb 02 H.MATHEZ P.PANGAUD IPNL CNRS (after ± 20% off line cut) 0.504 pC 1.4 pC 2 pC 1.4 pC 4 pC 6.3 pC GAIN-AMPLIFIER (X33,X9) PEAKING TIME vs CHARGE INJECTION (in force MODE)

7. 7 Design Review Feb 02 H.MATHEZ P.PANGAUD IPNL CNRS (after ± 20% off line cut) 1.4 pC 6.3 pC 10 pC 2 pC 20 pC 40 pC GAIN-AMPLIFIER (X5,X1) PEAKING TIME vs CHARGE INJECTION (in force MODE)

8. 8 Design Review Feb 02 H.MATHEZ P.PANGAUD IPNL CNRS (after ± 20% off line cut) SLOW-CONTROL PART This part measures the APD's Leakage Current (over a range of 20nA to 20µA) and the temperature of crystal plus APD (over a range of 5°C to 25°C which corresponds to a current in the thermistor of 4.3µA to 12µA). Over the full range, the both output are between 1.9V and 2.9V which is compatiblewith the ADC input. Temperature Measurement Leakage Current Measurement

9. 9 Design Review Feb 02 H.MATHEZ P.PANGAUD IPNL CNRS (after ± 5% off line cut) To sort out the chips, we made some cuts at the level of ±5% on the same parameters as before.

10. 10 Design Review Feb 02 H.MATHEZ P.PANGAUD IPNL CNRS (after ± 5% off line cut) Pre-amplifier gain = 23 mV/pC (Typical 33 mV/pC) Cf = 33 pF instead of 22 pF PRE-AMPLIFIER OUTPUT and PEAKING TIME vs CHARGE INJECTION 0.504 pC 5 pC 14.2 pC 40 pC

11. 11 Design Review Feb 02 H.MATHEZ P.PANGAUD IPNL CNRS GAIN VALUES and GAIN RATIO Gain 9 = 6.42 Gain 5 = 3.64 Gain 33 = 23.4 (after ± 5% off line cut) Parasitics resistors causes wrong gain value but the ratio between gains are correct.

12. 12 Design Review Feb 02 H.MATHEZ P.PANGAUD IPNL CNRS SLOW CONTROL NON LINEARITY OVER THE FULL RANGE (after ± 5% off line cut) APD's Leakage current linearity Temperature measurement linearity The both peak in histogram are correlated to the change of test board.