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Siena, 21-24 Oct. 2002 8 th Topical Seminar on Innovative Particle and Radiation Detectors: Progress in Radiation and Magnetic Field tests of CAEN HV and.

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Presentation on theme: "Siena, 21-24 Oct. 2002 8 th Topical Seminar on Innovative Particle and Radiation Detectors: Progress in Radiation and Magnetic Field tests of CAEN HV and."— Presentation transcript:

1 Siena, 21-24 Oct. 2002 8 th Topical Seminar on Innovative Particle and Radiation Detectors: Progress in Radiation and Magnetic Field tests of CAEN HV and LV boards UNI EN ISO 9001 CERT. N. 9105.CAEN Giovanni GRIECO E-mail: Giovanni GRIECO E-mail: COSTRUZIONI APPARECCHIATURE ELETTRONICHE NUCLEARI Via Vetraia, 11 - I 55049 VIAREGGIO (Italy) Tel. +39 0584 388398URL: http://www.caen.it

2 Siena, 21-24 Oct. 2002 Summary CAEN approach to LHC power supplies CAEN approach to LHC power supplies Implemented devices working in hostile area Implemented devices working in hostile area Result of last tests in radiation and magnetic field Result of last tests in radiation and magnetic field Conclusions Conclusions

3 Siena, 21-24 Oct. 2002 SY1527 Integration in DCS TCP/IP LAN OPC LAN Telnet ClientLabView on PC/MAC Internet Router WAN Link Telnet Client ETH I/F OPC Server (via RS232) RS232 I/F Custom HV Distr. Detector OPC Server (via TCP/IP) OPC Client HV/LV Out Custom LV Distr. Custom HV Distr. HV+Control

4 Siena, 21-24 Oct. 2002 CAEN approach to the problems in power supplies of LHC Radiation tolerance Radiation tolerance Magnetic field tolerance (up to 10 KGauss) Magnetic field tolerance (up to 10 KGauss) Low Cost (COTS) Low Cost (COTS) Hi-Power (up to 1 KWatt) Hi-Power (up to 1 KWatt) Efficient energy transmission Efficient energy transmission Low noise Low noise Floating ground Floating ground Basic requirements

5 Siena, 21-24 Oct. 2002 CAEN Experience in LHC “Hostile Area” ’97: First COTS rad-tolerance tests (ENEA - La Casaccia) ’97: First COTS rad-tolerance tests (ENEA - La Casaccia) ’98: NIC Non Inductive Converter ’98: NIC Non Inductive Converter ’99: Tests with p and n in Louvain-la-Neuve of A877 ( CMS Muon Chambers ) ’99: Tests with p and n in Louvain-la-Neuve of A877 ( CMS Muon Chambers ) ’00: Special material research ’00: Special material research ’01: A New design (Patent Pending) for a family of High and Low voltage DC/DC converters ’01: A New design (Patent Pending) for a family of High and Low voltage DC/DC converters

6 Siena, 21-24 Oct. 2002 System Philosophy

7 Siena, 21-24 Oct. 2002 Functional Prototype SASY : a S ub A ssembly SY stem SASY : a S ub A ssembly SY stem Functional Prototype for Easy Testing Functional Prototype for Easy Testing Floating ground Floating ground Parameters controlled via SY1527/SY2527 mainframe Parameters controlled via SY1527/SY2527 mainframe

8 Siena, 21-24 Oct. 2002 The SASY 2000 A “functional prototype” solution A “functional prototype” solution

9 Siena, 21-24 Oct. 2002 SASY 2000 Design SASY 2000 Power Supply and Control Diagram: SASY 2000 Power Supply and Control Diagram:

10 Siena, 21-24 Oct. 2002 SASY 2000 Design SASY 2000 Power Supply and Control: Actual Implementation SASY 2000 Power Supply and Control: Actual Implementation

11 Siena, 21-24 Oct. 2002 Common Noise Reduction Viewpoint Common Noise Reduction Viewpoint

12 Siena, 21-24 Oct. 2002 Expected Radiation and Magnetic Field Tolerance Magnetic Field: Magnetic Field: »up to 10 kGauss Radiation: Radiation: »60 MeV protons, up to 2*10 10 p/cm 2 »Up to 60 MeV neutrons, up to 10 12 n/cm 2 »up to 7 kRad

13 Siena, 21-24 Oct. 2002 SASY 2000 family: SA2xxx (Custom Development)

14 Siena, 21-24 Oct. 2002 SA2002 2 Ch Low Voltage Module SA2002 2 Ch Low Voltage Module Main Features for each channel: V out = 4.5 ÷ 5.5 V V out = 4.5 ÷ 5.5 V 6.5 ÷ 7.5 V I out = 2 A 1 A I out = 2 A 1 A R ipple = < 20 mVpp R ipple = < 20 mVpp

15 Siena, 21-24 Oct. 2002 SA2003 4 ch DAC Module Main Features for each channel: 14 bit progammable voltage = 0 ÷ 3 V 14 bit progammable voltage = 0 ÷ 3 V I out = 30 mA I out = 30 mA

16 Siena, 21-24 Oct. 2002 SA2004 1 ch Low Voltage High Current Module Main Features: V out = 4 ÷ 6 V V out = 4 ÷ 6 V I out = 60 A I out = 60 A R ipple = < 150 mVpp R ipple = < 150 mVpp

17 Siena, 21-24 Oct. 2002 SA200x 1 ch Low Voltage High Current Module Main Features: V out = 5 V V out = 5 V I out = 80 A I out = 80 A R ipple = < 30 mVpp R ipple = < 30 mVpp Smaller volume than SA2004 Smaller volume than SA2004 Patent Pending

18 Siena, 21-24 Oct. 2002 Test under Radiation Louvain la Neuve, August 26 th 2002 Tested modules : SA2002, SA2003 and SA2004 Tested modules : SA2002, SA2003 and SA2004 Test Time: 2h 40’ Test Time: 2h 40’ Radiation: up to 60 MeV n’s, Fluence 10 8 n/cm 2 Radiation: up to 60 MeV n’s, Fluence 10 8 n/cm 2 Average target distance: 75 cm. Average target distance: 75 cm. Total dose: 10 12 n/cm 2 Total dose: 10 12 n/cm 2 Branch controller on SY2527 Branch controller on SY2527

19 Siena, 21-24 Oct. 2002 Test Setup Louvain la Neuve, August 26 th 2002

20 Siena, 21-24 Oct. 2002 Test Setup Louvain la Neuve, August 26 th 2002

21 Siena, 21-24 Oct. 2002 Test Setup Louvain la Neuve, August 26 th 2002

22 Siena, 21-24 Oct. 2002 Tests Performed During the test lots of cycles of ramp-up and ramp-down were performed During the test lots of cycles of ramp-up and ramp-down were performed Output voltages Output voltages were changed were changed continuously continuously

23 Siena, 21-24 Oct. 2002 Test Results During the test the communication with the SASY was lost for three times but the problem was recovered with a remote operation. During the test the communication with the SASY was lost for three times but the problem was recovered with a remote operation. After the test and the total dose of 10 12 n/cm 2 the SASY works perfectly. After the test and the total dose of 10 12 n/cm 2 the SASY works perfectly.

24 Siena, 21-24 Oct. 2002 Test in Magnetic Field CERN, September 5 th 2002

25 Siena, 21-24 Oct. 2002 Test Setup

26 Siena, 21-24 Oct. 2002 Test Setup

27 Siena, 21-24 Oct. 2002 SA2004 Tests performed Channel efficiency checked in the following condition: Channel efficiency checked in the following condition: »Vout= 5 Volt »Iout = 30, 40, 50 Amp »B= 0, 1, 3, 5 Kgauss

28 Siena, 21-24 Oct. 2002 SA2004 Test results Worst Case:

29 Siena, 21-24 Oct. 2002 SA200x Tests performed Channel efficiency checked in the following condition: Channel efficiency checked in the following condition: »Vout= 5 Volt »Iout = 40, 60, 80 Amp »B // and  = 0, 1, 2, 3, 4, 5 KGauss

30 Siena, 21-24 Oct. 2002 SA200x Test results - 1 Worst Case:

31 Siena, 21-24 Oct. 2002 SA200x Test results - 2 Best Case:

32 Siena, 21-24 Oct. 2002 Conclusions & Comments Test in Magnetic Field: Test in Magnetic Field: –R&D steps are completed Test under Radiation: Test under Radiation: –known problems are solved Components: Components: –Purchasing strategy Time Schedule: Time Schedule: –From the prototype to the production

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