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Integrated test environment for a part of the LHCb calorimeter TWEPP 2009 Carlos Abellan Beteta La Salle, URL 22/9/2009TWEPP09 Parallel session B2a - Production,

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Presentation on theme: "Integrated test environment for a part of the LHCb calorimeter TWEPP 2009 Carlos Abellan Beteta La Salle, URL 22/9/2009TWEPP09 Parallel session B2a - Production,"— Presentation transcript:

1 Integrated test environment for a part of the LHCb calorimeter TWEPP 2009 Carlos Abellan Beteta La Salle, URL 22/9/2009TWEPP09 Parallel session B2a - Production, testing and reliability

2 Integrated test environment for a part of the LHCb calorimeter P RESENTATION O UTLINE Introduction Real environment Former test boards Final test board –Test capabilities –Features Conclusions 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 2

3 Introduction LHCb calorimeter Future testing needs –Reparation needs –Non expert tests –Integration –Usability No need of full laboratory Stability (Software but also Mechanical, loose wires,...) –Kaizen (Continued Improvement) –Product continuity (FPGA) 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 3

4 Real Environment LHCb calorimeter: –Power Supply –Clock distribution –Trigger data flow –DAQ data flow 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 4 Scintillator Pads VFE Clock & Control Regulator Board Power Preshower F.E. Board Data Control Control Board Selection Board Multiplicity SPECS Clock Data Ch-B Charged Particle

5 Real Environment Data from VFE to PSFEB is composed by 4 LVDS serializers of 21b at 840Mbps each one. Data from 7 PSFEB to a single CB is 7*840Mbps. Data from CB to SB is about 1,2Gbps of payload with an optical link. Control has I2C bidirectional control as well as a serial synchronous 40MHz channel for time sensitive controls. Huge amount of data flows through the system 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 5

6 Former test boards FPGA Baseline –Originally Parallax Board with Stratix EP1S25F672C6 Nice solution for prototyping & tests (Discontinued by vendor) Good form factor –Extended design done by our group Same philosophy USB instead of RS232, usable not only for programming. Aprox. Double of pins Backwards compatible More powerful Stratix II EP2S60F484C5 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 6

7 Former test boards Control Board Data from the backplane (PSFEB -> CB) SPECS from the backplane Optical Link Receiver USB interface with a mezzanine by Bitwise Systems 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 7

8 Former test boards Very Front End –Digital Part PreShower Front End Board reception Control of the VFE can be driven from the Control Board or from test board Connection through real LDVS cable ensures maximum realism USB interface with a mezzanine by Bitwise Systems Can also work with the Photo Multiplier test environment to test the analogical part 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 8

9 Former test boards Very Front End –Analogical Part High voltage power supply for the PMTs Dark box to test with controlled light Motorized optical fiber emits pulsed light on the desired channel of the PMT Also diffuse pulsed light is available Motor control is done by a computer while triggering of light pulses is done by the VFE’s test board that also collects the resulting data 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 9

10 Former test boards Link supervision –Clock distribution very important for our system, it defines integration time. Must be easily checkable. –Communication between the VFE/RB and the CB is done by an ad-hoc I2C with only two pairs. Focus of doubts, also tested. –Able to supervise signal shapes and communications. –Able to substitute a VFE and view what would it receive. –Able to check relative phases of the 8 clocks available on a CB. 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 10

11 Former test boards Mixing real detector with “emulated” parts –Test for the data cabling with LVDS pattern With real datapath With test board instead of PSFEB –Test for analogical noise and offset With real datapath With test board instead of PSFEB –Test for the control cabling With real datapath With test board instead of CB With scope –All of them very useful to isolate problems and try to solve them. 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 11

12 Final test board USB Ethernet WiFi LVDS Data Control Cables Optical Power PMTs env. Spy 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 12

13 Final test board –Test capabilities 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 13 Test Control Board VFE PMT Test

14 Final test board Features –Mechanical resistance One must not expect careful manipulation by an average user. Old one had clear mechanical flaws. Common in systems designed during prototyping tests. (Loose wires,...) 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 14

15 Final test board Mechanical resistance 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 15 −21 screws, 10mm aluminium plate −Good fixation of optical link −Good fixation of LVDS cable

16 Final test board Less laboratory dependant –Power –Clock –Scope –Special SW on PC Now: –Clock generator –Power Regulator –No SW needed* 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 16

17 Final test board Better interface: – USB –Ethernet/WiFi (compatible with various models with integrated web server) Portable: –O.S. Independent (No drivers) –No applications –Always Updated software Usable: –Remotely operated (expert at home, ALARA reasons, etc) 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 17

18 Conclusions –Ready for future tests and reparations –System suitable for average user Usable Stable Intended for average user –Better interface Ethernet is a great advantage –More test possibilities New data paths not available before –Less lab dependant –Solved problems learned by using testing boards 22/9/2009Parallel session B2a - Production, testing and reliabilitySlide 18


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