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Design and Implementation of VLSI Systems (EN0160) Prof. Sherief Reda Division of Engineering, Brown University Spring 2007 [sources: Weste/Addison Wesley.

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Presentation on theme: "Design and Implementation of VLSI Systems (EN0160) Prof. Sherief Reda Division of Engineering, Brown University Spring 2007 [sources: Weste/Addison Wesley."— Presentation transcript:

1 Design and Implementation of VLSI Systems (EN0160) Prof. Sherief Reda Division of Engineering, Brown University Spring 2007 [sources: Weste/Addison Wesley – Rabaey/Pearson]

2 Summary of last lecture NMOS transistor PMOS transistor

3 Summary of transistor ideal (Shockley) model for nMOS for pMOS

4 DC transfer characteristics

5 PMOS on (linear), NMOS off Vin = 0

6 PMOS on (linear), NMOS on (saturation) V in = 0.2V DD

7 PMOS on (linear ~ sat) and NMOS (sat) V in = 0.4V DD

8 PMOS on (sat) NMOS on (linear) Vin = 0.6VDD

9 PMOS on (off ~ linear) and NMOS on (linear) Vin = 0.8VDD

10 NMOS on (linear) and PMOS cut off Vin = VDD

11 Summary of voltage transfer function A B C E D

12 Noise margins

13 CMOS inverter noise margins desired regions of operation

14 What is the impact of altering the PMOS width in comparison to the NMOS width on the DC char? V in3 I dsn, |I dsp | V out V DD V in3 V V If we increase (decrease) the width of PMOS compared to NMOS  for the same input voltage, a higher (lower) output voltage is obtained V in V out

15 Impact of skewing transistor sizes on inverter noise margins  Increasing (decreasing) PMOS width to NMOS width increases (decreases) the low noise margin and decreases (increases) the high noise margin

16 Pass transistor DC characteristics  As the source can rise to within a threshold voltage of the gate, the output of several transistors in series is no more degraded than that of a single transistor

17 Summary Today –Covered DC transfer characteristics Next time –Transistor non-ideal behaviour


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