1. Juan Valls 1 TOB System Test Status Report  DS ROD System Test Setup  DAQ Software  DS ROD Characterization PLL, FED Timing Scans OPTO Scans  Noise Characterization (ROD vs OTRI)  Effect of Decoupling Caps on TOB Modules  Conclusions Juan Valls CERN

2. Juan Valls 2 SS ROD System Tests  SS ROD electrical design validated optical readout (6 modules) electrical controls (electrical FEC, no DOHM)  Grounding scheme found ok and validated  Cooling performance and thermal behavior studied and verified at room temperature  Noise performance studied Conclusions from past TOB system tests Overall system performance validated Bartalini et al. Chierici et al.

3. Juan Valls 3 DS ROD  New Vienna AOH (LLD2 ICs, 3 laser drivers)  New final CCUM module (CCU25 IC)  Redistribution of resets and back-plane pulses on ROD ICB CCU6 CCU25  New FEC2CCU PCB to mimic DOHM controls functionality (present during the testing of cabled RODs in production) (G. Magazzu, F. Ahmed) reset out PIO SS ROD ICB top reset bottom reset 6 back-plane pulse lines reset out DCU DS ROD ICB 2 back-plane pulse lines 6 reset lines top BP pulse bottom BP pulse

4. Juan Valls 4 DS ROD  New (prototype) LV PS (Sandor’s design) DELTA switching power supply (8 V, 50 Amp) (old DELPHI HPC) Linear regulators (fixed 2.5 V and 1.25 V) Fast reacting PS (V 2.5 overvoltage < 0.2 V, long cables, up to 10 A) Sense voltages on the regulators for fast feedback Current limitation on both lines Interlock controls + V/I monitoring  next version  The CCUM voltages are provided through the FEC2CCUM board I 2.5 ~ 6.4 A I 1.25 ~ 2.6 A I CCU ~ 0.17 A DS ROD 12 modules 48 APVs I 2.5 (max) ~ 9.2 A I 1.25 (max) ~ 3.2 A

5. Juan Valls 5 DS ROD Assembly (Controls) CCUM (with CCU25) LV adapter card and connector HV adapter card and connector SC in (and LV in) SC out (and LV out) ICB Ground

6. Juan Valls 6 DS ROD Assembly (Readout) New Vienna AOHs (LLD2 ICs) 24 fibers from Jan Troska (Tracker Optical Links Web Page)

7. Juan Valls 7 DS ROD Setup (Building 598) FEC2CCUM board Optical Readout Electrical Controls TOB DS ROD Layer 1 HV LV C 6 F 14 Cooling Plant 1 kW +5  C/+32C (~3 m)

8. Juan Valls 8 DAQ Software  XROD System Tests Electrical and Functionality Tests of RODS Introduces a non-flat CMN picked-up by some of the modules in the ROD (see past talks on SS ROD)  Subestructure Burnin Test Station (W. Beaumont)  XDAQ System Tests Test-Beam Controls integration  Needed optical control  Separate location of BE boards (FEC card) Software throttle if FED overflow  inhibit TSC triggers Simultaneous readout of FED buffers while arrival of input frames

9. Juan Valls 9 XROD  ROD FAST debugging tool  CMS-like DAQ hardware  Access to BE boards TSC, FEC, FED, CCUM Handles CCU6 and CCU25  Access to FE registers PLL, MUX, APV, DCU, AOH Handles DCU1 and DCU2 Handles LLD1 and LLD2  Internal/external TSC triggers (and FED internal)  Single GUI Interface TSC FED APV

10. Juan Valls 10 XROD  XROD handles up to 3 PMC- FED cards  8 modules (4 or 8 APVs) 1 SS ROD (6 modules, 4 or 8 APVs) 2 SS RODs (4 modules, 4 APVs) 1 DS ROD (12 modules, 4 APVs)  The use of K-MUX will enhance this capability Noise Pulse Shape Scan Frames Gain Scan http://cern.ch/valls/CMS_SST/xrod.htm

11. Juan Valls 11 PLL Time Alignment Scan  Scan through PLL fine delays (1.04 ns) and with a fixed FED digitization delay  Reconstruct APV tick marks  The DS ROD introduces shift delays of ~2 ns on the trigger arrival time to APVs. FED 0 FED 1 FED 2 XROD

12. Juan Valls 12 FED Timing Scan  Find the FED optimal digitization point  Reconstruct APV tick marks by varying FED skew clock delay wrt data (PLL settings fixed)  Choose sampling point close to the back edge of the tick mark FED 0 FED 1 FED 2 XROD

13. Juan Valls 13 Optical Scan Characterization  Based upon Mirabito’s code  Run FEDs in Scope Mode  Fix AOH settings. Get distribution of ticks and baselines (over events and samples) Inverted ticks into AOH ! (connector mismatch between ICC and AOH PCBs) fixed by patching OEC output connectors Ticks still arriving inverted into the AOH

14. Juan Valls 14 Optical Scan Characterization  Plot ticks and baselines as a function of bias (for a fixed gain)  Get the tick amplitude from the difference between these distributions baselines ticks AOH bias AOH Gain = 1 (24 fibers) AOH bias tick amplitudes

15. Juan Valls 15 Optical Scan Characterization  Find optimal settings (gain and bias) for an 800 mV AOH input tick amplitude  What does this correspond to at the FED (in ADC counts)?  Need to calibrate FED cards: FED gain ~3.5 mV/count, Optolink gain ~0.8V/V Gain 0 Gain 1 Gain 2 Gain 0 Gain 2 Gain 1 Bias 150-210 counts

16. Juan Valls 16 Measurements  All measurements taken with: Optimized timing (PLL, FED) and opto settings (gain and bias) R MUX = 100  (to match termination with AOHs) APV bias generator registers (as from “Procedures for Module Test”, Draft 2)  All results given in terms of: Total noise ( tot ) CMN substracted noise ( CMN-substracted ) Differential noise ( diff )  RMS of ½(ADC i -ADC i+1 )

17. Juan Valls 17 DS ROD Noise Deconvolution Non-Inverting (Doracil) (200 V) CCUM Cicorel ROD ICB Position 2Position 1 Position 3 Position 4 Position 5 Position 6  tot  diff  CMN

18. Juan Valls 18 DS ROD CMN CMN (flat) Calculation (running average pedestals) Non-Inverting Inverting ~40% 

19. Juan Valls 19 HV Bias Scan on DS ROD 6 HV channels for 12 modules (CAEN SY-127, A343 boards) Total noise (ADC) = f (Vbias) FNAL M658 (Cicorel) placed on top side of ROD (near to CCUM) Full depletion at ~150 Volts Similar behavior for all modules DS ROD HV Scans

20. Juan Valls 20 FNAL M658 (Cicorel/HybridSA) OTRI Setup Total Noise Differential Noise CMN substracted Noise Peak Mode Inverting Peak Mode Non Inverting Deconvolution Non Inverting Deconvolution Non Inverting ( tot ) ( diff ) ( CMN-substracted )

21. Juan Valls 21 Noise (DS ROD vs OTRI)  DS ROD noisier than OTRI  Slighter higher differential noise than total noise (uncorrelated CMN) Peak Mode (Non-Inverting) Deconvolution (Non-Inverting)   tot   diff   tot   diff   tot   diff OTRI C dec DS ROD

22. Juan Valls 22 Full Gain Scans (DS ROD) Fit Range: Ical=18 to Ical=70 0.6 – 2.7 MIPs Ical=29 ~ 25000 elec DS ROD Gains/APV Offsets/APV

23. Juan Valls 23 Full Gain (DS ROD vs OTRI) Gains (M658) DS ROD vs OTRI (electrons/ADC count) ~850 elec/ADC (OTRI) ~650 elec/ADC (ROD)  OTRI  ROD  OTRI  ROD Peak Mode Non-Inverting Deconvolution Non-Inverting

24. Juan Valls 24 Noise (DS ROD vs OTRI) APV25 bare chip on PCB (C inp =18 pF) Peak: 900 elec. Dec: 1500 elec. OTRI Setup Peak: 1600 elec. Dec: 2600 elec. DS ROD Setup Peak: 1600 elec. Dec: 2700 elec.   tot   diff   tot   diff Peak Mode Non-Inverting Deconvolution Non-Inverting

25. Juan Valls 25 Effect of Decoupling Cap Detector Return Decoupling C dec = 100 nF TOB Cycorel Hybrid Edge effect improvement on TIB modules (see Civinini talk)

26. Juan Valls 26 Edge Strip Correlation No improvement No edge effect on ROD (w/o C dec ) OTRI DS ROD C dec =100 nF

27. Juan Valls 27 TOB/TEC and TIB NAIS HV Connector on Kapton Cable Vbias     GND (wirebond to bias ring) Bias Connector on Kapton Cable TIB TOB

28. Juan Valls 28 CMN (DS ROD vs OTRI) Common Mode Noise DS ROD vs OTRI  CMN  CMN (C dec =100 nF)  CMN OTRI DS ROD Peak Mode (Non-Inv) Deconvolution (Non-Inv)

29. Juan Valls 29 Conclusions (I)  Flat noise, flat CMN in both setups  Similar noise results for both setups (OTRI/ ROD) after full gain values applied)  Slightly larger CMN for OTRI than for DS ROD  No evidence of noise edge effects on ROD (optical readout)  Edge effect seen in OTRI setup (FNAL modules M658 and M657, electrical readout), not cured with C dec  Most of the software tools and hardware designed for the system test setups will also be used during production for electrical and functionality tests of RODs

30. Juan Valls 30 Conclusions (II)  -source and cosmics studies (see next talk)  Study the cooling performance (thermal behavior) of DS ROD in the cold (with final LV PS + interlocks)  Integration of DOHM (or use of FEC2CCUM)  Exercise >1 RODs in a control loop  Exercise the back-plane pulse functionality  Integration of K-multiplexer into the DAQ  Integration of ROD objects into DB Next... http://cern.ch/valls/CMS_SST/rod_system_tests.htm More at...