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Spring 07, Jan 16 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 Introduction Vishwani D. Agrawal James J. Danaher.

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Presentation on theme: "Spring 07, Jan 16 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 Introduction Vishwani D. Agrawal James J. Danaher."— Presentation transcript:

1 Spring 07, Jan 16 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 Introduction Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University Auburn, AL 36849 vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal/COURSE/E7770_Spr07

2 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)2 Related Course: VLSI Design   ELEC 5770/6770: Review of MOS transistor fundamentals, CMOS logic circuits; VLSI fabrication and design rules; clocking strategies and sequential design; performance estimation; memories and programmable arrays; standard cell design methodologies; computer aided design (CAD) tools.

3 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)3 Related Course: Computer-Aided Design of Digital Circuits   ELEC 5250/6250: Hardware components of multiprocessor systems including processor, interconnection, memory, and control architectures; Software elements of parallel processing including inter-processor communication, task partitioning, task mapping and scheduling, load balancing, programming languages, and parallel algorithms.

4 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)4 Related Course: Low-Power Design of Electronic Circuits   ELEC 5270/6270: Design of digital circuits and systems for reduced power consumption, power analysis algorithms, low-power MOS technologies, low-power design architectures for FPGA, memory and microprocessor, reduction of power in testing of circuits.

5 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)5 Related Course: VLSI Testing   ELEC 7250: Introduction to VLSI testing, test process and automatic test equipment, test economics and product quality, fault modeling, logic and fault simulation, testability measures, combinational and sequential circuit test generation, memory test, analog test, delay test, IDDQ test, design for testability, built-in self-test, boundary scan, analog test bus, system test and core test.

6 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)6 Related Course: Digital System Design   ELEC 4200: Hierarchical, modular design of digital systems; computer-aided digital system modeling, simulation, analysis, and synthesis; design implementation with programmable logic devices and field programmable gate arrays.

7 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)7 This Course: Advanced VLSI Design  ELEC 7770: Review of CMOS logic circuits; impact of fabrication issues on design; high speed switching circuits; high performance memory structures; advanced clocking strategies and clock distribution; performance optimization; deep submicron design issues; ASIC design flow: logic synthesis, placement and routing; design verification; low power design.

8 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)8 Course Objectives and Evaluation  Objectives:  Learn and participate in the process of modern VLSI design, verification, and test of a chip.  Develop an understanding for the advanced design concepts in modern VLSI technologies.  Evaluation:  Project participation  Homeworks  Class tests  Final exam

9 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)9 Course Outline  Nanotechnology: Present and future advances.  Design Team Project  Advanced Topics  Design for testability for system on chip (SOC)  Low-power design  Signal integrity  Process variation  Verification

10 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)10 Reference Books  J. M. Rabaey, A. Chandrakasan, and B. Nikolić, Digital Integrated Circuits, A Design Perspective, Second Edition, Prentice-Hall, 2003.  M. J. S. Smith, Application-Specific Integrated Circuits, Addison-Wesley, 1997.  N. H. E. Weste and D. Harris, CMOS VLSI Design, A Circuits and Systems Perspective, Third Edition, Addison-Wesley, 2005.  W. Wolf, Modern VLSI Design, System-on-Chip Design, Third Edition, Prentice-Hall, 2002.

11 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)11 Design Team Project  Product definition and specification  Project plan: Task definitions and measurable goals.  Team selection and task assignments  Schedule  Execution  Report

12 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)12 VLSI Realization Process Determine requirements Write specifications Design synthesis and Verification Fabrication Manufacturing test Chips to customer Customer’s need Test development Design Manufacture

13 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)13 Defining Terms  Design synthesis: Given an I/O function, develop a procedure to manufacture a device using known materials and processes.  Verification: Predictive analysis to ensure that the synthesized design, when manufactured, will perform the given I/O function.  Test: A manufacturing step that ensures that the physical device, manufactured from the synthesized design, has no manufacturing defect.

14 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)14 Project Assignment: Product Definition  Write specifications for a processor chip  Architecture  Speed  Technology  Power  Cost  Prepare for a class discussion on Jan 18, 2007.

15 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)15 Design Team  Architecture  System design  Verification  Design for testability  Synthesis  Power analysis  Physical design  Timing closure  Test generation

16 Spring 07, Jan 16ELEC 7770: Advanced VLSI Design (Agrawal)16 VLSI Design & Test Seminar Series   Must attend   http://www.eng.auburn.edu/users/strouce/ D&TSeminar.html http://www.eng.auburn.edu/users/strouce/ D&TSeminar.html   Every Wednesday, Broun 235, 4PM   January 17, 2007: Joe Bungo, The ARM CPU Architecture


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