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Chapter 7: Testing Of Digital Circuits 1 Testing of Digital Circuits M. Balakrishnan Dept. of Comp. Sci. & Engg. I.I.T. Delhi.

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Presentation on theme: "Chapter 7: Testing Of Digital Circuits 1 Testing of Digital Circuits M. Balakrishnan Dept. of Comp. Sci. & Engg. I.I.T. Delhi."— Presentation transcript:

1 Chapter 7: Testing Of Digital Circuits 1 Testing of Digital Circuits M. Balakrishnan Dept. of Comp. Sci. & Engg. I.I.T. Delhi

2 Chapter 7: Testing Of Digital Circuits 2 Design Approaches Test pattern generation to cover a large fraction of the faults Design for testability –Built-in-self-test (BIST) Fault tolerant design

3 Chapter 7: Testing Of Digital Circuits 3 Faults: Sources and Types Sources –Design process –Device defects –Manufacturing process Types –Dynamic –Static

4 Chapter 7: Testing Of Digital Circuits 4 Fault Models Stuck-at faults correspond to a simple fault model – Stuck-at-0 (s-a-0) – Stuck-at-1 (s-a-1) More complex models are also used but beyond the scope of this work

5 Chapter 7: Testing Of Digital Circuits 5 Combinational Circuits: Test Pattern Generation Problem definition: Given a set of faults (F) and a set of test vectors (T), identify the smallest possible subset of test vectors (V) which covers either all the faults in F or say a predetermined fraction of faults (say 98%).

6 Chapter 7: Testing Of Digital Circuits 6 Fault Simulation Given a test vector, by simulating the circuit with the fault, identify all faults covered by the test vector. Test vectors (T) Faults (F)

7 Chapter 7: Testing Of Digital Circuits 7 Test Generation Given a fault, identify all the test vectors which can cover that fault. Test vectors (T) Faults (F)

8 Chapter 7: Testing Of Digital Circuits 8 Limitations Only one fault is expected to occur at one time Faults other than stuck-at faults are expected to show up as stuck-at faults at some other location By and large fault location is not possible These approaches are valid only for combinational circuits

9 Chapter 7: Testing Of Digital Circuits 9 Typical Circuit Enhancements Insertion of test points Pin amplification Test modes Scan chains

10 Chapter 7: Testing Of Digital Circuits 10 Test Generation Methods M. Balakrishnan Dept. of Comp. Sci. & Engg. I.I.T. Delhi

11 Chapter 7: Testing Of Digital Circuits 11 Parallel Fault Simulation In parallel fault simulation, evaluation is performed simultaneously for many faults The number of faults that can be simultaneously simulated corresponds the word length of the host machine

12 Chapter 7: Testing Of Digital Circuits 12 Parallel Fault Simulation (Example) a b c d e f g h i

13 Chapter 7: Testing Of Digital Circuits 13 Parallel Fault Simulation (Example contd.)

14 Chapter 7: Testing Of Digital Circuits 14 Deductive Fault Simulation At each of the primary inputs generate the list of faults that can be detected by the test vector Use these lists to generate the lists at other nodes by “appropriate” operations on these lists

15 Chapter 7: Testing Of Digital Circuits 15 Deductive Fault Simulation (example) a b c d e f g h i La = {a1} Lb = {b0} Lc = {c1} Ld = {d0} Le = {e1} 0 1 0 1 0 Lfp = Lb’  Lc = {c1} Lf = {c1, f1} Lgp = (Ld’  Le)’ = {d0} Lg = {d0, g1} Lhp’ = (Lf  Lg)’, Lhp =  Lh = {h0} Lip’ = La  Lh’, Lip = {h0} Li = {h0, i0} 0 0 1 1

16 Chapter 7: Testing Of Digital Circuits 16 Deductive Fault Simulation (example contd.) a b c d e f g h i La = {a1} Lb = {b0} Lc = {c0} Ld = {d0} Le = {e1} 0 1 1 1 0 Lfp’ = Lb’  Lc’ = { b0, c0} Lf = {b0, c0, f0} Lgp = (Ld’  Le)’ = {d0} Lg = {d0, g1} Lhp’ = (Lf ‘  Lg)’ Lhp = {d0,g1}, Lh = {d0,g1,h0} Lip’ = La  Lh’, Lip = {d0, g1,h0} Li = {d0, g1, h0, i0} 1 0 1 1

17 Chapter 7: Testing Of Digital Circuits 17 Test Generation Methods Boolean Difference & D-Algorithm M. Balakrishnan Dept. of Comp. Sci. & Engg. I.I.T. Delhi

18 Chapter 7: Testing Of Digital Circuits 18 Boolean Difference Consider a function f of say 4 variables f(x0, x1, x2, x3) Boolean difference of f w.r.t to x i is defined as follows: df/dx i = f  xi=0 + f  xi=1

19 Chapter 7: Testing Of Digital Circuits 19 Boolean Difference (example) a b c d e f g h i i = a + ((b.c). (d +e)’)’ di/da = i  a=0 + i  a=1 = ((b.c).(d+e)’)’ + 1 = (b.c)(d+e)’

20 Chapter 7: Testing Of Digital Circuits 20 Example (contd.) di/da = (b.c)(d+e)’ s-a-0 fault at a can be tested by a.di/da = 1 or a.b.c(d+e)’ = 1  test vectors (1,1,1,0,0) s-a-1 fault at a can be tested by a’.di/da = 1 or a’.b.c(d+e)’ = 1  test vectors (0,1,1,0,0)

21 Chapter 7: Testing Of Digital Circuits 21 Boolean Difference (contd.) b c d e f g h i = a + (f. (d +e)’)’ di/df = i  f=0 + i  f=1 = 1 + (a +d+e) = (a+d+e)’ = a’d’e’ a

22 Chapter 7: Testing Of Digital Circuits 22 Boolean Difference (contd.) di/df = a’.d’.e’ s-a-0 fault at f can be tested by f.di/df = 1 or fa’d’e’ = b.c.a’d’e’ =1  test vectors (0,1,1,0,0) s-a-01fault at f can be tested by f’.di/df = 1 or f’.a’d’e’ = (b.c)’.a’d’e’ = 1  test vectors (0,0,X,0,0) and (0, X,0,0,0)

23 Chapter 7: Testing Of Digital Circuits 23 D-Algorithm There are three main steps in the D-Algorithm Generate the fault Propagate the fault to one of the outputs (Forward or D-Drive) Back propagate to get consistent assignment for inputs (Backward drive or back- propagation)

24 Chapter 7: Testing Of Digital Circuits 24 D-Algorithm (Step 1) b c d e f g h Let us say we choose the fault g node s-a-0 1 2 3 4 Assign inputs to gate 2 to generate the fault i.e. d = 0 and e = 0 a i

25 Chapter 7: Testing Of Digital Circuits 25 D-Algorithm (Step 2) b c d e f g h 1 2 3 4 a 0 0 D Choose a path to the o/p and propagate the fault f is to be assigned 1 and a is to be assigned 0 to propagate D to the output i i

26 Chapter 7: Testing Of Digital Circuits 26 D-Algorithm (Step 3) b c d e f g h 1 2 3 4 a 0 0 D i 1 0 D’ Consistency Check Assign inputs to gates (whose outputs have been specified ) consistent with other assignments

27 Chapter 7: Testing Of Digital Circuits 27 D-Algorithm Result b c d e f g h 1 2 3 4 a 0 0 D i 1 0 D’ 1 1 The test vector is (0,1,1,0,0)

28 Chapter 7: Testing Of Digital Circuits 28 D-Algorithm M. Balakrishnan Dept. of Comp. Sci. & Engg. I.I.T. Delhi

29 Chapter 7: Testing Of Digital Circuits 29 Terminology Singular Cover D-intersection Primitive D-cube of a fault (pdcf) Propagation D-cubes (pdf)

30 Chapter 7: Testing Of Digital Circuits 30 Singular Cover SC of a gate (or any circuit element) is nothing but a compact version of the truth table. SC of a AND gate with a and b as inputs and c as output abc 0X0 X00 111

31 Chapter 7: Testing Of Digital Circuits 31 Singular Cover (contd.) SC of a NOR gate with a and b as inputs and c as output abc 1X0 X10 001

32 Chapter 7: Testing Of Digital Circuits 32 D-Intersection

33 Chapter 7: Testing Of Digital Circuits 33 Primitive D-Cube of Fault (pdcf) For generating a s-a-0 fault at node c, choose a SC row which gives an o/p of 1 for the nor gate and intersect with (X,X,0). pdcf is(0, 0, D) a b c

34 Chapter 7: Testing Of Digital Circuits 34 PDCF (contd.) For generating a s-a-1 fault at node c, choose a SC row which gives an o/p of 0 for the nor gate and intersect with (X,X,1). pdcf is(1, X, D)or (X, 1, D) a b c

35 Chapter 7: Testing Of Digital Circuits 35 Propagation D-Cube (pdc) PDC consists of a table for each circuit element which has entries for propagating faults on any one of its inputs to the output. To generate PDC entry corresponding to any one column, D-intersect any two rows of SC which have opposite values (0 and 1) in that column. There can be multiple rows for one column

36 Chapter 7: Testing Of Digital Circuits 36 PDC Example PDC of a AND gate with a and b as inputs and c as output abc 1DD D1D

37 Chapter 7: Testing Of Digital Circuits 37 PDC Example (contd.) PDC of a NOR gate with a and b as inputs and c as output abc 0DD’ D0D’

38 Chapter 7: Testing Of Digital Circuits 38 D-Algorithm Steps Choose a stuck-at-fault at any of the nodes. Choose a pdcf for generating the fault. Choose an output and a path to the output and propagate the fault to the output by choosing pdc for all circuit elements on the path. (D-Drive) Use the SC of all unassigned circuit elements to arrive at a consistent set of inputs. (back-propagate or consistency check)

39 Chapter 7: Testing Of Digital Circuits 39 D-Algorithm: PDCF Example a b c d e f g h i Choose a fault say g s-a-0. Choose pdcf of gate 2 for generating this fault (a b c d e f g h i ) = (X X X 0 0 X D X X) 1 2 3 4

40 Chapter 7: Testing Of Digital Circuits 40 D-Algorithm: D-Drive Example Propagate the fault to the o/p using pdc of gates 3 &4 a b c d e f g h i 1 2 3 4 0 0 D pdc 3(X X X 0 0 1 D D’ X) pdc 4(0 X X 0 0 1 D D’ D’)

41 Chapter 7: Testing Of Digital Circuits 41 D-Algorithm: Consistency Example Perform consistency operation for gate 1 a b c d e f g h i 1 2 3 4 0 0 D (X X X 0 0 1 D D’ X) sc 1(0 1 1 0 0 1 D D’ D’)

42 Chapter 7: Testing Of Digital Circuits 42 D-Algorithm: Summary

43 Chapter 7: Testing Of Digital Circuits 43 Testing of Sequential Circuits M. Balakrishnan Dept. of Comp. Sci. & Engg. I.I.T. Delhi

44 Chapter 7: Testing Of Digital Circuits 44 Testing Techniques State table verification Random testing Transition count testing Scan based testing Signature analysis

45 Chapter 7: Testing Of Digital Circuits 45 State Table Verification Verify each transition by first taking the machine to a specific initial state, applying the input to perform the transition and then verifying the final state. For this purpose we need a homing sequence and distinguishing sequence

46 Chapter 7: Testing Of Digital Circuits 46 Homing & Distinguishing Sequence Homing sequence: An input is said to be a homing sequence for a m/c if the m/c’s response to the sequence is always sufficient to determine uniquely its final state. Distinguishing sequence: An input sequence which when applied to a machine will produce a different output sequence for each choice of initial state.

47 Chapter 7: Testing Of Digital Circuits 47 Example

48 Chapter 7: Testing Of Digital Circuits 48 Example: Homing Sequence (ABCD) (AB)(D) (ABCD) (AB)(D) (BD)(C) (A)(D)(D) (BC)(A) 0 1 0 1 0 1

49 Chapter 7: Testing Of Digital Circuits 49 Random Testing Random pattern generator Known good ckt Circuit under test Compare

50 Chapter 7: Testing Of Digital Circuits 50 Transition Count Testing Count the number of transitions for a specific input pattern and compare with the value stored for “good” circuits Reduction in data storage for storing correct responses “Aliasing” errors

51 Chapter 7: Testing Of Digital Circuits 51 Scan Based Testing Form a scan chain for all the storage elements (“flip-flops”) in the circuit Use this scan chain for inserting the test patterns as well as reading the results Use combinational circuit test pattern generator methods generating test inputs

52 Chapter 7: Testing Of Digital Circuits 52 Scan Based Testing (contd.) logic RegReg RegReg RegReg

53 Chapter 7: Testing Of Digital Circuits 53 Signature Analysis & Built-in- self-test (BIST) M. Balakrishnan Dept. of Comp. Sci. & Engg. I.I.T. Delhi

54 Chapter 7: Testing Of Digital Circuits 54 Signature Analysis Test results available in a very compact form and thus very suitable for BIST In-speed testing possible PRBS generators use for test pattern generation as well as test result generation

55 Chapter 7: Testing Of Digital Circuits 55 PRBS Generator A PRBS or pseudo random binary sequence generator consists of a long shift register with serial input generated by taking exclusive-or of some of the intermediate inputs

56 Chapter 7: Testing Of Digital Circuits 56 BIST Example logic L1 logic L2 R1R1 R2R2 R3R3

57 Chapter 7: Testing Of Digital Circuits 57 BIST Registers Modes Normal mode (PIPO) PRBS generator mode Signature capture mode Scan mode

58 Chapter 7: Testing Of Digital Circuits 58 BIST Steps: Example R1 : PRBS mode, R2: Signature mode Generate finite number of test patterns R1, R2, R3: Scan mode Scan out the signature of L1 and compare R2 : PRBS mode, R3: Signature mode Generate finite number of test patterns R1, R2, R3: Scan mode Scan out the signature of L2 and compare

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