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RF Reconfiguration and Testing Rashad Ramzan and Jerzy Dabrowski Linköping University Dept. of Electrical Engineering SE-581 83 Linköping, Sweden
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2 Linkoping, OCT 4, 2006 Outline Testable LNA RF-DC Detector Offset-Loopback Summary, Future Planes
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3 Linkoping, OCT 4, 2006 Recent Chip: RF Sampling Frontend A 1.4V, 25mW Wideband Testable LNA in 0.13 m CMOS
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4 Linkoping, OCT 4, 2006
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5 Recent Chip: RF Sampling Frontend
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6 Linkoping, OCT 4, 2006 Resent Chip: RF Sampling Frontend Due to “PCB” we are not able to measure NF at high frequencies? Traces are not even. FR4 not good for >1GHz Connector Pad parasitics & impedance discontinuities Remedy: We are working on it …….. New PCB with Rogers not FR4 or Thin Film Technology TRL calibration
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7 Linkoping, OCT 4, 2006 RF Testing- RF to DC Detector Idea! Only from DC measurements. All catastrophic faults can be detected. Some of parametric faults. Performance parameter like Gain, 1dB CP And may be NF & IP3 Calibration of Detectors with DC/Low voltage signals only
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8 Linkoping, OCT 4, 2006 RF Testing- Offset Loopback Base Band Processor LPF DAC LPF LNA LO Amp T r a n s m i t t e r R e c e i v e r (zero-IF) TA Test x test ADC I Q 90 0 IQ I Q IQ offset mixer IQ test signal QPSK is the simplest implementation but others can be used as well Test setup using IQ offset mixer for shared LO f ff Tx band Rx band f Tx f Rx
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9 Linkoping, OCT 4, 2006 RF Testing- Offset Loopback Test setup using IQ offset mixer for shared LO = 16 0 =5 0 (skew) Tx I Tx Q Rx Q Rx I
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10 Linkoping, OCT 4, 2006 Future Planes New board for complete Chip measurements. Test for Transceivers with polar modulator (shared LO) multistandard Transceivers. (with Phillips) On-Chip phase noise measurements
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