Shaker training March 2011 Renard Klubnik Applications engineer The information contained in this document is the property of Meggitt Sensing Systems and.

Shaker training March 2011 Renard Klubnik Applications engineer The information contained in this document is the property of Meggitt Sensing Systems and is proprietary and/or copyright material. This information and this document may not be used without the express authorization of Meggitt Sensing Systems. Any unauthorized use or disclosure may be unlawful. Information contained in this document is subject to U.S. Export Control regulations, specifically the (choose as appropriate) International Traffic in Arms Regulations and / or Export Administration Regulations. Each recipient of this document is responsible for ensuring that transfer or use of any information contained in this document complies with all relevant (choose as appropriate) International Traffic in Arms Regulations and / or Export Administration Regulations.

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Introduction to shakers Where do shakers fit in the test market? Reaction mass shakers –Excite a structure, not shake it –Modal testing –Not for shake testing No envelope performance curves like MIL 810G –Transfer function measurement – built in impedance head Point impedance Transfer impedance –Ability to measure is a function of the readout equipment and mechanical impedance of test structure –Characterize the unit under test, not vibrate it –Identify natural frequencies and amplification factor Trunion mounted shakers –Test article testing

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Application of shakers Used in determining mechanical impedance Measure the dynamic properties of structures and materials It is the complex ratio of applied force to resulting velocity It is frequency related –Sine –Random Similar properties for acceleration and displacement components are shown in the adjoining chart Usually done by transfer function measurements of two channel analyzers and supporting software Easier setup than trunion mounted designs

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Primary applications Why/where are the shakers used? Understand the mechanics of a test object –Simulate external forces Test electrical components circuit boards sub assemblies Determine mode shapes –Assess structural response under different forms of excitation Sine Random Impulse –Determine a test objects resonant frequencies –Medical – bones

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Reaction mass shakers – Operation principle Operates on reaction mass principle A reaction force is generated which excites the test structure –An AC electrical voltage is applied to the coil –Alternating magnetic field causes relative movement between the permanent magnet outer shell and inner coil –Like poles of magnet repel each other Two reaction mass shaker types –Electromagnetic shakers –Piezoelectric shakers Permanent magnet Typical electromagnetic shaker

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Electromagnetic shaker Operates similarly to a loud speaker A coil is driven within a permanent magnet field The dynamic electromagnetic coil field ‘pushes’ against the heavier outer permanent magnet shell Coil is attached to the structure Heavy ring-shaped magnets are suspended around the coil Force generated is proportional to input current Powered by conventional methods (audio power amplifier)

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Piezoelectric shakers Utilize piezoelectric ceramic disks which change thickness proportional to an applied voltage Ceramic disks are sandwiched between a heavy mass and a light fixture which attaches to the test structure Although displacement is small, the use of multiple disks and high drive voltages produces large forces at high frequencies Must be driven by high voltage which is provided by an impedance matching network between the power amplifier and shaker Impedance matching network steps up the power amplifier output drive voltage to a much higher level for the drive voltage of the shaker

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Reaction mass electrodynamic shaker systems Reaction mass shakers Open or closed loop measurements Attach shaker directly to test object Contact unit under test with built in force gage Stingers not used

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Shaker systems, impedance heads and amplifiers F3 Electrodynamic design Nominal 1 lb force output 25 – 10000 Hz 2.26” diameter Z602WA impedance head or dummy plug F4 Electrodynamic design Nominal 10 lb force output 10 – 7500 Hz 5.10” diameter Z820WA impedance head or dummy plug Materials testing application

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Shaker systems, impedance heads and amplifiers F5B Electrodynamic design Nominal 0.4 lb force output 10 – 10000 Hz 1.35” diameter Z11 impedance head F10 Electrodynamic design Nominal 20 lb force output 5 – 2000 Hz 8.25” diameter Z820WA impedance head or dummy plug

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Piezoelectric shaker systems Piezoelectric performance Below resonance, system output is displacement controlled – ~1 micron per 1000 volts Above resonance, output is force controlled Open or closed loop testing Output of shaker is dependent on the mechanical impedance of the specimen At higher frequencies shaker is lower impedance

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Shaker systems, impedance heads and amplifiers F7 Piezoelectric design Nominal 100 lb force output 500 – >20000 Hz 2.20” diameter Impedance head built in Requires impedance matching network F7-1 Piezoelectric design Nominal 10 lb force output 1 – 80000 Hz 2.20” diameter No impedance head Requires impedance matching network

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Shaker systems, impedance heads and amplifiers F4/F7 Combination design for low and high frequency Nominal 10 lb force output 10 – >20000 Hz Requires two power amplifiers for continuous sweep Requires impedance matching network for F7 shaker

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Shaker performance Shaker response is payload sensitive Mass on shaker causes lowering of resonant frequencies Customer will have to estimate response with his payload Payload can contribute additional resonances

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Impedance heads Used to measure shaker effect Force transducer Accelerometer Positioned between shaker and test article Option on F3 –Z602WA Option on F4 –Z820WA Option on F5 –Z11 Built in on F7 Option on F10 –Z820WA

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Amplifiers PA8HF Low noise and low distortion over its entire range of operation Designed for small and medium size electromagnetic and piezoelectric shakers

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Matching network needed for piezoelectric shakers N7FS, N8FS, N8FHS Matching network Electrical interface between amplifiers and piezoelectric shakers Provide voltage step to drive shakers at full voltage levels Lower voltage levels at higher frequencies to better match reactive loads

© Meggitt Sensing Systems. Proprietary. 15 February 2010 How to choose the right shaker for the application? Determine the application Modal Test article testing Modal testing Determine frequency range Evaluate size and shape of test article Estimate stiffness of test article Explore measurement options Test article testing Determine frequency range Evaluate size and shape of the test article Determine desired amplitude test range Consider shaker performance with additional payload

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Sample configurations F3 (needs to have dummy plug or Z602WA) Signal source side –F3 (includes cable to mate with PA8HF) F3/dummy plug or F3/Z602WA –PA8HF if signal source can’t deliver 10 watts –*Signal source (sine oscillator, random noise generator) –*Cable to connect either the PA8HF or F3 to the signal source Measurement side –With Z603WA Impedance head (2 x microdot to BNC cables supplied) 2 x IEPE power supplies (P704B) –*Other accelerometers for test article measurement * - designates additional required instrumentation available from other sources

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Sample configurations F5 Signal source side –F5 (includes cable to mate with PA8HF) –PA8HF if signal source can’t deliver 3 watts –*Signal source (sine oscillator, random noise generator) –*Cable to connect either the PA8HF or F5 to the signal source Measurement side –Optional Z11 Impedance head (2 x 5-44 to BNC cables supplied) 2 x charge converters required (CC701) –Other accelerometers for test article measurement * - designates additional required instrumentation available from other sources

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Sample configurations F4 (needs to have dummy plug, Z820WA or F7) Signal source side –F4 (includes cable to mate with PA8HF) F4/dummy plug or F4/Z820WA or F4/F7 (see separate page) –PA8HF if signal source can’t deliver 100 watts –*Signal source (sine oscillator, random noise generator) –*Cable to connect either the PA8HF or F4 to the signal source Measurement side –With Z820WA Impedance head (2 x BNC to BNC cables supplied) 2 x IEPE power supplies (P704B) –*Other accelerometers for test article measurement * - designates additional required instrumentation available from other sources

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Sample configurations F4/F7 Signal source side –F4 (includes cable to mate with PA8HF) –F7 (includes cable to mate with N7FS) –2 x PA8HF if signal source can’t deliver 100 watts and customer wants full bandwidth coverage at the same time –N7FS matching network (includes cable to mate with PA8HF) –*Signal source (sine oscillator, random noise generator) –*Cable to connect the PA8HF to the signal source – user configured Measurement side –Z7 Impedance head, included (2 x microdot to microdot cables supplied) 2 x charge converters required (CC701) 2 x IEPE power supplies (P704B) –*Other accelerometers for test article measurement * - designates additional required instrumentation available from other sources

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Sample configurations F7 Signal source side –F7 (includes cable to mate with N7FS) –1 x PA8HF –N7FS matching network (includes cable to mate with PA8HF) –*Signal source (sine oscillator, random noise generator) –*Cable to connect the PA8HF to the signal source Measurement side –Z7 Impedance head, included (2 x microdot to microdot cables supplied) 2 x charge converters required (CC701) 2 x IEPE power supplies (P704B) –*Other accelerometers for test article measurement * - designates additional required instrumentation available from other sources

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Sample configurations F7-1 Signal source side –F7-1 (includes cable to mate with N8HFS) –1 x PA8HF –N8HFS matching network (includes cable to mate with PA8HF) –*Signal source (sine oscillator, random noise generator) –*Cable to connect the PA8HF to the signal source Measurement side –*Other accelerometers for test article measurement * - designates additional required instrumentation available from other sources

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Sample configurations F10 (needs to have dummy plug, Z820WA or F7) Signal source side –F10 (includes cable to mate with PA8HF) F10/dummy plug or F10/Z820WA or F10/F7 (see separate page) –PA8HF if signal source can’t deliver 100 watts –*Signal source (sine oscillator, random noise generator) –*Cable to connect either the PA8HF or F10 to the signal source Measurement side –With Z820WA Impedance head (2 x BNC to BNC cables supplied) 2 x IEPE power supplies (P704B) –*Other accelerometers for test article measurement * - designates additional required instrumentation available from other sources

© Meggitt Sensing Systems. Proprietary. 15 February 2010 Sample configurations F10/F7 Signal source side –F10 (includes cable to mate with PA8HF) –F7 (includes cable to mate with N7FS) –2 x PA8HF if signal source can’t deliver 100 watts and customer wants full bandwidth coverage at the same time –N7FS matching network (includes cable to mate with PA8HF) –*Signal source (sine oscillator, random noise generator) –*Cable to connect the PA8HF to the signal source – user configured Measurement side –Z7 Impedance head, included (2 x microdot to microdot cables supplied) 2 x charge converters required (CC701) 2 x IEPE power supplies (P704B) –*Other accelerometers for test article measurement * - designates additional required instrumentation available from other sources

© Meggitt Sensing Systems. Proprietary. 15 February 2010 The information contained in this document is the property of Meggitt Sensing Systems and is proprietary and/or copyright material. This information and this document may not be used or disclosed without the express authorization of Meggitt Sensing Systems. Any unauthorized use or disclosure may be unlawful. The information contained in this document may be subject to the provisions of the Export Administration Act of 1979 (50 USC 2401-2420), the Export Administration Regulations promulgated thereunder (15 CFR 730-774), and the International Traffic in Arms Regulations (22 CFR 120-130). The recipient acknowledges that these statutes and regulations impose restrictions on import, export, re-export and transfer to third countries of certain categories of data, technical services and information, and that licenses from the US Department of State and/or the US Department of Commerce may be required before such data, technical services and information can be disclosed. By accepting this document, the recipient agrees to comply with all applicable governmental regulations as they relate to the import, export and re-export of information.'

Shaker training March 2011 Renard Klubnik Applications engineer The information contained in this document is the property of Meggitt Sensing Systems and.

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Shaker training March 2011 Renard Klubnik Applications engineer The information contained in this document is the property of Meggitt Sensing Systems and.

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Presentation on theme: "Shaker training March 2011 Renard Klubnik Applications engineer The information contained in this document is the property of Meggitt Sensing Systems and."— Presentation transcript:

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