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Open Research and Future Standard Opportunities

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Presentation on theme: "Open Research and Future Standard Opportunities"— Presentation transcript:

1 Open Research and Future Standard Opportunities

2 Outline Digital Secondary Systems
Frequency and ROCOF Measurement Challenge Total Vector Error vs. Magnitude and Phase Error Overview—self explanitory.

3 Synchrophasor Considerations for Digital Secondary Systems
Veselin Skendzic Schweitzer Engineering Laboratories

4 Remember When… The World Used to be Analog?
People answered the phone Vinyl records ruled the world Tape recorders were cool Amplifiers were linear Movies were not compressed

5 Digital Secondary Systems
Promise to: Consolidate large amounts of data over a few fibers Reduce expensive copper connections Improve substation EMC performance Improve accuracy (reduced CT burden) Improve safety (fiber based LPITs) Reduce operating cost

6 But Where Do We Stand Today?
Limited deployment with multiple pilot projects Equipment availability is improving fast Vigorous standardization work: IEC series GOOSE, MMS, Time requirements and much more IEC Sampled Values IEC PTP Power Profile IEC Low Power Instrument Transformers IEC LPIT digital interface IEC Stand Alone Merging Units IEC IT Electronic Datasheet (TEDS)

7 DSS Standard Relationship
IEC

8 Synchrophasors and Digital Secondary Systems
DSS system standards are built with Synchrophasors in mind Synchrophasors inspired key DSS concepts (precise time synchronization, group delay compensation) Network based (terrestrial) time distribution improves system reliability

9 Key Mechanism Examples

10 IEC 61869-6 Frequency Response Mask

11 Anti-Aliasing Filter Attenuation Requirements
Accuracy Class Filter Attenuation ( f  fs-fr ) Protection  20 dB 1 0.5 0.2  28 dB 0.1  34 dB

12 IEC Sampling Rates Rates are independent from power system frequency Preferred rates are integer multiples of 50 & 60 Hz

13 IEC 61869-9 Maximum Processing Delay Time
Application Maximum Processing Delay High Bandwidth DC (closed loop control) 25 s Time-critical low bandwidth DC control 100 s Protection 2 ms Quality Metering 10 ms Merging Unit is responsible for compensating the data acquisition chain Group Delay

14 IEC 61869-13 Dynamic Response Requirements
Fully offset fault waveform passing through a linear system with 1Hz corner frequency (no saturation)

15 DSS Open Issues Synchrophasor applications need full time stamp (being added in IEC ) Automated exchange of IT calibration and nameplate data (IEC TEDS standard project) Higher sample rate support for emerging applications Cybersecurity

16 Difficulty with Frequency and ROCOF measurement
Allen Goldstein NIST

17 Frequency and ROCOF Many ways to measure:
Zero Crossing Peak detection Hilbert Transform Fourier techniques Derivative of estimated phase etc. All for these have issues when measuring power system F and dF: Harmonics, interharmonics and noise shift the zero crossing times Discrete Fourier transform leakage Error and noise in phase estimation Non-ideal filtering and aliasing

18 Frequency and ROCOF are very important
We have come a long way We need to trust the measurements IEC TC95 ( ) and ANSI 81 are protection devices standards to not include requirements performance frequency measurement output Compliant PMUs can be trusted Vibrating Reed Frequency Meter Source: StackExchange,

19 Total Vector Error vs. Magnitude and Phase Error
Allen Goldstein NIST

20 TVE vs ME and PE TVE is a SCALAR value equal to the MAGNITUDE of the difference between the PMU reported synchrophasor (a vector) and a REFERENCE synchrophasor (another vector) The difference between two vectors is, of course another vector and TVE is the magnitude of that vector TVE is a very convenient term to calculate, state, and to compare against requirements. However it makes no sense to add or subtract two TVE values because the vector ANGLE information has been lost. Also, when trying to analyze PMU error causes, TVE is not very helpful

21 Magnitude Error and Phase Error
𝑀𝐸= 𝑋 𝑚 𝑡 𝑛 − 𝑋 𝑚 𝑡 𝑛 2 Phase Error 𝑃𝐸= ∅ 𝑡 𝑛 - ∅ 𝑡 𝑛 TVE 𝑇𝑉𝐸= 2(1+𝑀𝐸)(1− cos 𝑃𝐸 + 𝑀𝐸 2

22 Chinese PMU Standard Source: NASPI: Chinese PMU Standard, Dynamic Testing and Future Applications, Tianshu Bi et al

23 Understanding PMU errors
Magnitude Error Exposes issues with scaling A/D Scaling A/D Linearity Input Gain PMU filter gain/rolloff Noise Phase Error Exposes issues with timing Timing offset Jitter Exposes issues with PMU Filter phase shift Filters have group delay that the PMU must correct for.


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