Presentation is loading. Please wait.

Presentation is loading. Please wait.

Samples and MC Selection

Similar presentations


Presentation on theme: "Samples and MC Selection"— Presentation transcript:

1 Study of muons rejection on single p and minimum bias forced with PionDecayer tool

2 Samples and MC Selection
Signal sample: Single m at various pT (~1.5M events) Background simulated with p/K forced to decay ( with PionDecayer tool) Minimum bias (~113k events) Single p (~1M events) Selected MC generated m with |h|<2.7 coming from a forced decay of p/K (also with |h|<2.7) MC events selected: min bias ~56k single pion ~930k

3 Cut strategy Select events running full muon trigger slice on (LVL1, LVL2 and standard EF) no last optimized version of MuComb pT>2GeV cut LVL2 Define a set of critical variables ID d0, # pixel hits, hit on B layer, # SCT hits Ratio of pT in ID and MS Combined match c2 Evaluate efficiency of each cut w.r.t. standard EF combined muon EF efficiency w.r.t. LVL2 on single m (p) ~95% (~90%)

4 optimal cut could be different at different pT
Cut power rejection Efficiencies for signal and fake as a function of exclusive cuts # pixel d0 # SCT pT(ID)/pT(MS) optimal cut could be different at different pT Each cut is evaluated w/o applying the other cuts Match c2 muons pions Here a choice of cuts (red arrows) in the assumption of nominal detector performance

5 Efficiency (single particle samples)
Applied cuts Inner Detector d0 ≤ 0.15 ID number of pixel hits ≥ 3 ID number of B layer hits ≥ 1 ID number of SCT hits ≥ 6 pT (ID) / pT (SA) ≤ 1.25 Combined match c2 ≤ 26 Single m efficiency loss between 4GeV 20GeV Forced single p efficiency reduced at 4GeV 20GeV

6 Efficiency for p/K in minimum bias
Compatible with results on single p sample, high statistical errors separated contribution for pions and kaons after all cuts are applied Kaons are cutted away more easily than pions: candidates no cut cut Kaons 98 50 Pions 840 586

7 Backup

8 Reconstruction selection
Required first LVL1 threshold (totally open) passed and LVL2 pT>2GeV (no optimized MuComb of rel13) At EF level, found ID track used for combination using closest DR Applied following cuts to ID track Inner Detector d0 ≤ 0.15 ID number of pixel hits ≥ 3 ID number of B layer hits ≥ 1 ID number of SCT hits ≥ 6 Found MS track (SA) used for combination requiring same RoI index EF level to have at least one combined track with pT (ID) / pT (SA) < 1.25 Combined match c2 ≤ 26 events triggered and passed to EF: min bias single pion 73551 LVL1 events triggered: min bias single pion 82619 events passing all EF cuts: min bias single pion 44953


Download ppt "Samples and MC Selection"

Similar presentations


Ads by Google