1. Chapter 6 ~ 8 Instrument and design of X-ray
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2. X-ray diffractometer
1. An instrument for measuring x-ray spectra by means of a crystal of known structure.
2. An instrument for studying crystalline (and noncrystalline) material by measurements of the way in which they diffract x-ray of known wavelength.
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3. Fig 6-3 Rigaku diffractometer
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5. Fig 6-3 Rigaku diffractometer
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6. Fig 6-4 detector circuits for a diffractometer
1. Continuous scan: starting/ending angle and scan speed
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7. Fig 6-4 detector circuits for a diffractometer
2. Step scan: starting/ending angle and scanning interval/time of each scan
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8. Fig 6-5 Diffraction pattern of NaCl powder.
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9. Determination of the peak position.
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10. X-ray detector sample chamber crossed primary beam stop Göbel Mirrors
sealed
X-ray tube
2-D detector
X-ray generator
2-D detector
with real time display
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11. A detector “sees” only the radiation to which it is exposed and is “blind” to all diffracted rays not only lying in the planes of the diffractometer circle.
2-D detector
with real time display
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12. temperature dependent position shift and intensity change of maxima
room
temperature
70 °C
80 °C
140 °C
150 °C
temperature dependent position shift
and intensity change of maxima
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14. X-ray diffraction pattern of polyimide
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15. Fig 7-14 Angular relationships in the pinhole method
Pinhole method in Transmission mode
tan2 = U/2D
Fig Angular relationships in the pinhole method
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16. Background radiation 1. Fluorescent radiation emitted by the specimen
2. Diffraction of the continuous spectrum
3. Diffuse scattering from the specimens itself
Compton modified scattering and coherent scattering
4.Diffraction and scattering from other than the specimen material
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17. Fig 8-2 Transmission Laue camera
tan2 = r1/D
Fig Transmission Laue camera
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18. Fig 8-4 Back- reflection Laue camera
tan(180-2) = r2/D
Fig Back- reflection Laue camera
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