1. Status of 44 ARCS tested TOB modules, June 24, 2004
Anatoly Ronzhin,
Fermilab

2. 7613-7656 modules ARC tested. 44 modules (7613-7656) – tested.
chips.
chips.
All modules PASSED with grade A.
Only 2 “new bad” channels in addition to “known” detected for , and 7 “new bad” - for “Known” are “wire bond to skip” in db.

5. Unexpected glitches.
Initial VPSP = 40 set made a mess – the set provided us with a lot of BAD channels which were really GOOD ones.
First time it was noticed on June 15, 04 (first production day) and reported the same day on our internal meeting (SiDet, kitchen).
VPSP=36 was installed on June 17.

6. VPSP=40, 7628

7. VPSP=40, 7644

8. VPSP=40, 7647

9. Even worse
Even worse that VPSP=40 distorted shape of noise plot due to wrong pedestal setting.
As result we wasted about 1 day by filling out wrong data in travels, looking for modules damage, trying to distinguish “bad” and “false bad” channels, etc.
Both UCSB and CERN use set VPSP=36 for ARC test, why we used VPSP=40 ?
We need more fast reaction to fix such a kind of noticed “glitches” (like VPSP, “raw data”…) in our future modules production.

10. VPSP=40, 7629

11. VPSP=36, 7629

12. VPSP=40, 7633

13. VPSP=36, 7633

14. VPSP=40, 7636

15. VPSP=36, 7636

16. VPSP=40, 7648

17. VPSP=36, 7648

18. Another unexpected glitch.
FE-hybrid cables (extension) damage – as result - a lost of some contacts and wrong data taken.
4 damaged cables in sum – again loss of time – to realize it, take data with not damaged cables, etc.
Looks like cables damage is due to wrong procedure of cable’s connectors disengagement.
Tool introduced to make it safe.

19. FE-hybrid cable damage, 7650.

20. Fork for cables disconnection

21. The rest of glitches.
was not initialized, bended wires between APV2 and PCB, fixed.
7635 – HV, crowbar blown, w/o crowbar passed with grade A.
7642 – HV, broken conductor fixed.
7653 – PH eliminated (#109 pulled out).
Main loss of time now (about 3-5 min) during ARCS test is to convert root file into plots.

22. Summary of ARCS test
All 44 produced modules ( , 4 chips), ( , 6 chips) passed ARCS test with grade A. The mean value of “bad” channels for – 2, for – 3.
Main waste of time (about 30%) was due to VPSP = 40 initial set and damaged FE-hybrid extension cables.
No CMN and pill off of aluminum on strips (“scratches”) noticed this time.
All bad channels identified and mostly due to skipped bonding. Only one PH detected.