1. Status of Slave Board (SLB) ASIC
SLB ASIC (version 1) used in Slice Test 2001 has bugs in JTAG, Readout block (Parallel to Serial Converter: PSC).
Timing instability of the long shift registers of PSC[218] and Control part (Mask[160] and Test Pulse[160])
Confliction of JTAG TDO data at the state transition from “shift” to “capture” DR due to timing problem
Bug fixed version SLB ASIC (version 2) has been delivered in July,2002 and tested since then.
7/10/2002
TGC electronics meeting in CERN

2. Error phenomena Shift register problem Frame Prev. BC data
Current data
Next data
2. JTAG state transition problem
7/10/2002
TGC electronics meeting in CERN

3. C.Fukunaga @ TGC electronics meeting in CERN
Cure for the bugs
Introduction of Master-slave shift register structure
A small logic to ensure c(apture)DR must come later than TCK
7/10/2002
TGC electronics meeting in CERN

4. C.Fukunaga @ TGC electronics meeting in CERN
Results
7/10/2002
TGC electronics meeting in CERN

5. C.Fukunaga @ TGC electronics meeting in CERN
Name
Bit RW
DEPTH 21
Depth of L1 Buffer
TESTPULSE 5
Set delay of Test Pulse Trigger
DELAY 4
Set delay of input
SCHEME 1
Low : 3 out-of 4 , High : 4 out-of 4
L1VETO
Low : through , High : L1A = 0
CLKINV
Low : order , High : invert
RESET
Internal ECR & BCR
DRDRST
Derandomizer Reset
DCVETO
Low : DC balanced , High : Normal
SEU RO
SEU Flag
MODULE 8
Indicate Module Type and Module Address
OVERFLOW
Indicate Derandomizer Overflow ID 32
ID=
MASK1P
160
Mask Pattern for Readout and Matrix
MASK1
Mask Enable for Readout and Matrix
MASK2P
Mask Pattern for Matrix only
MASK2
Mask Enable for Matrix only
TPP
Test Pulse Pattern
7/10/2002
TGC electronics meeting in CERN

6. Summary for SLB ASIC version 2
Low-pT matrix part: Verification with 8000 patterns for each doublet/triplet and wire/strip.
Readout part: PSC with new shift register scheme works fine, but we are still doing tests for this parts.
Control part: All JTAG functions work fine.
Mask and Test Pulse: Both work fine owing to new shift register structure.
7/10/2002
TGC electronics meeting in CERN