Presentation is loading. Please wait.

Presentation is loading. Please wait.

Avogadro Scale Engineering & Fabricational Complexity

Similar presentations


Presentation on theme: "Avogadro Scale Engineering & Fabricational Complexity"— Presentation transcript:

1 Avogadro Scale Engineering & Fabricational Complexity
Symposium on Digital Fabrication Pretoria, South Africa June 29, 2006 Molecular Fabrication (Jacobson) Group

2 Complexity vs. Size m 10-10 10-5 10-9 10-7 10-6 10-8 10-4 10-3 10-2
red blood cell ~5 m (SEM) diatom 30 m Simple molecules <1nm DNA proteins nm bacteria 1 m m 10-10 10-5 10-9 10-7 10-6 10-8 10-4 10-3 10-2 SOI transistor width 0.12m Semiconductor Nanocrystal ~1 nm Circuit design Copper wiring width 0.1m Nanotube Transistor (Dekker) IBM PowerPC 750TM Microprocessor 7.56mm×8.799mm 6.35×106 transistors

3 Caruthers Synthesis DNA Synthesis Error Rate: 300 Seconds 1: 102
Per step

4 Replicate Linearly with Proofreading and Error Correction
Fold to 3D Functionality Error Rate: 1: 106 100 Steps per second template dependant 5'-3' primer extension 3'-5' proofreading exonuclease 5'-3' error-correcting exonuclease Beese et al. (1993), Science, 260,

5 Resources for Exponential Scaling
Resources which increase the complexity of a system exponentially with a linear addition of resources 1] Quantum Phase Space 2] Error Correcting Fabrication 3] Fault Tolerant Hardware Architectures 4] Fault Tolerant Software or Codes

6 Error Correction in Biological Systems
Fault Tolerant Translation Codes (Hecht): NTN encodes 5 different nonpolar residues (Met, Leu, Ile, Val and Phe) NAN encodes 6 different polar residues (Lys, His, Glu, Gln, Asp and Asn) Local Error Correction: Ribozyme: 1:103 Error Correcting Polymerase: 1:108 fidelity DNA Repair Systems: MutS System Recombination - retrieval - post replication repair Thymine Dimer bypass. Many others… E. Coli Retrieval system - Lewin Biology Employs Error Correcting Fabrication + Error Correcting Codes

7 Threshold Theorem – Von Neumann 1956
= Probability of Individual Gate Working MAJ p n MAJ p MAJ n=3 Recursion Level P K=1 K=2 K MAJ p k For circuit to be fault tolerant

8 Threshold Theorem - Winograd and Cowan 1963
MAJ p A circuit containing N error-free gates can be simulated with probability of failure ε using O(N ⋅poly(log(N/ε))) error-prone gates which fail with probability p, provided p < pth, where pth is a constant threshold independent of N. n MAJ p MAJ MAJ p Number of gates consumed: k Find k such that Number of Gates Consumed Per Perfect Gate is

9 Threshold Theorem – Generalized
p n p MAJ p For circuit to be fault tolerant P<p k Total number of gates:

10 Scaling Properties of Redundant Logic (to first order)
Probability of correct functionality = p[A] ~ e A (small A) Area = A P1 = p[A] = e A P2 = 2p[A/2](1-p[A/2])+p[A/2]2 = eA –(eA)2/4 Area = 2*A/2 Conclusion: P1 > P2

11 Scaling Properties of Majority Logic
n segments P Total Area = n*(A/n) A Probability of correct functionality = p[A] To Lowest Order in A Conclusion: For most functions n = 1 is optimal. Larger n is worse.

12 Fabricational Complexity
Total Complexity Complexity Per Unit Volume Complexity Per Unit Time*Energy Complexity Per unit Cost Ffab = ln (W) / [ a3 tfab Efab ] Ffab = ln (M)e-1 / [ a3 tfab Efab ]

13 Fabricational Complexity
Total Complexity Accessible to a Fabrication Process with Error p per step and m types of parts is: A G T C A A A G A T A C G T A G T A G C

14 Fabricational Complexity
G T C Fabricational Complexity for n-mer = Fabricational Cost for n-mer = Complexity per unit cost

15 Fabricational Complexity
Non Error Correcting: A G T C A G T C Triply Error Correcting: A G T C A G T C P = 0.9 n = 300 P = 0.85 n n p

16 Deinococcus radiodurans
(3.2 Mb, Copies of Genome ) Uniformed Services University of the Health [Nature Biotechnology 18, (January 2000)] D. radiodurans: 1.7 Million Rads (17kGy) – 200 DS breaks E. coli: 25 Thousand Rads – 2 or 3 DS breaks

17 D. radiodurans 1.75 million rads, 0 h
photos provided by David Schwartz (University of Wisconsin, Madison)]

18 Autonomous self replicating machines from random building blocks

19

20

21 Combining Error Correcting Polymerase and
Error Correcting Codes One Can Replicate a Genome of Arbitrary Complexity M N Basic Idea: M strands of N Bases Result: By carrying out a consensus vote one requires only To replicate with error below some epsilon such that the global replication error is:

22 M (# of Copies of Genome)
N (Genome Length)

23 Replication Cycle + Step 1 Step 2 Step 3 Parts Template Machine
p per base p’ per base

24 Information Rich Replication
(Non-Protein Biochemical Systems) J. Szostak, Nature,409, Jan. 2001

25 Combining Error Correcting Machinery and
Error Correcting Codes One Can Replicate a Machine of Arbitrary Complexity For Above Threshold M Copy Number Jacobson ‘02

26 -Building a Fab for Biology- MIT Molecular Machines (Jacobson) Group
BioFAB -Building a Fab for Biology- MIT Molecular Machines (Jacobson) Group

27 MutS Repair System Lamers et al. Nature 407:711 (2000)

28 Error Removal

29 In Vitro Error Correction Yields >10x Reduction in Errors

30 Error-Removal 1000 bp Fluorescent Gene Synthesis
error-corrected (>95% fluorescent) error-enriched (<10% fluorescent) Native error rate

31 Error Reduction: GFP Gene synthesis

32 Molecular Machines Group-MIT
Faculty Joseph Jacobson Research Scientists and Post Docs Peter Carr Sangjun Moon Graduate Students Brian Chow David Kong Chris Emig Jae Bum Joo Jason Park Sam Hwang Air inlets Crushers Ganglion Multiple Visual sensors Muscles Pincers Sensory receptors Stridulatory pegs Wings


Download ppt "Avogadro Scale Engineering & Fabricational Complexity"

Similar presentations


Ads by Google