Presentation is loading. Please wait.

Presentation is loading. Please wait.

UCSB Short-term Testing Plan

Published byBenedict Johnathan Townsend Modified over 5 years ago

Similar presentations

Presentation on theme: "UCSB Short-term Testing Plan"— Presentation transcript:

1 UCSB Short-term Testing Plan
Characterize hybrid (+PA) on arrival Basic functionality and deep test (ARC) Specific bad channel requirements for hybrid (+PA) Re-characterize module on completion of construction Basic functionality, deep test, IV curves (ARC) Different bad channel requirement for module Vienna cold box test fraction of modules (DAQ) Acts as ~24 hour module burn-in Scaled bad channel requirements for change in gain, grounding, etc. Identifies mechanical/bond/electrical weaknesses prior to production of large number of modules Reduces reworking of rod/retrofitting of modules CMS Tracker Week Jan Proposal for Modification of Qualifying Procedure

2 Deep Test Modifications
Make bad channel requirements specific to component type tested (hybrid, hybrid+PA, module) Remove/loosen relative percentage/sigma requirements Tighten/add fixed requirements Motivate requirements on silicon tracker performance CMS Tracker Week Jan Proposal for Modification of Qualifying Procedure

3 Proposal for Modification of Qualifying Procedure
Pedestal/Noise Test Increase minimum noise test Fractional requirements too wide to discern saturated/dead FE preamplifier Replace fractional pedestal requirements with |Pi-Pchip|<Pcut Pcut motivated by decrease in dynamic range of channel Special requirements on chip edges if necessary CMS Tracker Week Jan Proposal for Modification of Qualifying Procedure

4 Proposal for Modification of Qualifying Procedure
Pulse Shape Test Remove current pulse shape requirements Include rise-time/fall-time/peak-time requirement Replace pulse shape with gain measurement Measure pulse heights at 6-13 calibration injection setting between 0-3 MIPs and fit Require gain between Glow and Ghigh Gain uniformity specification Calibration circuit may not be uniform Require c2<c2cut (c2 based on noise measurement) Finds non-linear charge response and gain non-uniformities Should be relatively simple to include in ARC software See following example CMS Tracker Week Jan Proposal for Modification of Qualifying Procedure

5 Hybrid Gain Measurement(1)
0-3 MIPs MIPs CMS Tracker Week Jan Proposal for Modification of Qualifying Procedure

6 Hybrid Gain Measurements(2)
Three channels’ pulse height vs. MIP injected First ‘regular’ Second 1st channel of chip 3 Third 63th channel of chip 3 Gain non-uniform and bad c2 if 0 MIP point included for chip 3 Improved if 0 MIP excluded Mostly likely calibration circuit non-uniformities CMS Tracker Week Jan Proposal for Modification of Qualifying Procedure

7 Proposal for Modification of Qualifying Procedure
Pipeline Test Add pipeline capacitor pedestal/noise requirement Widen relative to channel requirement according to decreased statistics Add pipeline column pedestal/noise requirement Remove bad capacitors/columns from channel pedestal/noise calculation CMS Tracker Week Jan Proposal for Modification of Qualifying Procedure

8 Proposal for Modification of Qualifying Procedure
Ladder Grading Grade ladders by fraction of bad capacitors Bad channel=190 capacitors Bad column=128 capacitors Treat chip edges differently (if necessary) CMS Tracker Week Jan Proposal for Modification of Qualifying Procedure

9 Necessary Infrastructure
DAQ with 10 hybrid channels LV/HV power supplies Reusable for rod burn-in Vienna cold box DI/O PC board 1.5 kW chiller Module carriers CMS Tracker Week Jan Proposal for Modification of Qualifying Procedure

10 Test System Grounding Issues
Module Testing Final PS System Sensor Sensor Hybrid Hybrid HV HV ARC FE +HV +HV HVGND 1.25V 2.5V GROUND LOOPS!!! Interconnect Bus Patch Panel/ LV ARC Controller -5V LV GND +1.25V -5V +2.5V GROUND LOOPS!!! AOH PC Optical Cables DOH Command And Data Cable CMS Tracker Week Jan Proposal for Modification of Qualifying Procedure

11 Proposal for Modification of Qualifying Procedure
Voltage conversion assumes old resistor values in bias return circuit (22KW,100W) With new resistor values (2.2KW, 681W) , need 4 current (~120mA) Voltage at p implant Leakage Current (mA) CMS Tracker Week Jan Proposal for Modification of Qualifying Procedure

Download ppt "UCSB Short-term Testing Plan"

Similar presentations

TEC X5 Setup (1) 1 Front + 1 Back petal, fully equipped (28 modules F.P. + 23 modules B.P. + AOH + DOHM) Petal assembly IPN-Lyon (F.P.), RWTH-Aachen I.

TEC X5 Setup (1) 1 Front + 1 Back petal, fully equipped (28 modules F.P modules B.P. + AOH + DOHM) Petal assembly IPN-Lyon (F.P.), RWTH-Aachen I.
Sci-Fi tracker for IT replacement 1 Lausanne 9. December 2010.

Sci-Fi tracker for IT replacement 1 Lausanne 9. December 2010.
1/8/04Lance Simms Thermal Testing of TOB/TEC Hybrids at UCSB.

1/8/04Lance Simms Thermal Testing of TOB/TEC Hybrids at UCSB.
Slide 1L3 Testing Meeting March 7, 2003UCSB Status-Anthony Affolder UCSB Testing Status Anthony Affolder (for the UCSB module testing group) Current testing.

Slide 1L3 Testing Meeting March 7, 2003UCSB Status-Anthony Affolder UCSB Testing Status Anthony Affolder (for the UCSB module testing group) Current testing.
Thermal Testing of TEC/TOB Hybrids at UCSB 1/20/04 Slide 1 Thermal Testing of TOB/TEC Hybrids at UCSB.

Thermal Testing of TEC/TOB Hybrids at UCSB 1/20/04 Slide 1 Thermal Testing of TOB/TEC Hybrids at UCSB.
Slide 1Module Testing Meeting March 7, 2003US Hybrid/Module/Rod Testing Model-Anthony Affolder US Hybrid/Module/Rod Testing Model Anthony Affolder (for.

Slide 1Module Testing Meeting March 7, 2003US Hybrid/Module/Rod Testing Model-Anthony Affolder US Hybrid/Module/Rod Testing Model Anthony Affolder (for.
Slide 1Module Testing Meeting Jan. 29, 2002CMS Module Testing Issues-Anthony Affolder CMS Module Testing Issues From a CDF Testing Experience Perspective.

Slide 1Module Testing Meeting Jan. 29, 2002CMS Module Testing Issues-Anthony Affolder CMS Module Testing Issues From a CDF Testing Experience Perspective.
Slide 1PMG Jan. 24 2002CMS Module Testing Issues-Anthony Affolder CMS Module Testing Issues Perspective from a large scale production project Anthony Affolder.

Slide 1PMG Jan CMS Module Testing Issues-Anthony Affolder CMS Module Testing Issues Perspective from a large scale production project Anthony Affolder.
Slide 1X-Calibration Common Testing Issues-Anthony AffolderModule Testing Meeting, June 3, 2003 X-Calibration Common Testing Issues: Grounding, Environmental.

Slide 1X-Calibration Common Testing Issues-Anthony AffolderModule Testing Meeting, June 3, 2003 X-Calibration Common Testing Issues: Grounding, Environmental.
Slide 1UCSB Rod Production presented by Jim LambDOE review, January 20, 2004 UCSB Rod Production UCSB Rod Production, Jan. 20 2004, presented by Jim Lamb.

Slide 1UCSB Rod Production presented by Jim LambDOE review, January 20, 2004 UCSB Rod Production UCSB Rod Production, Jan , presented by Jim Lamb.
Anthony AffolderUS CMS Meeting 12/3/2002Proposal of UCSB Short-term Testing Program Assumptions Electrical and optical hybrids not burnt-in prior to arrival.

Anthony AffolderUS CMS Meeting 12/3/2002Proposal of UCSB Short-term Testing Program Assumptions Electrical and optical hybrids not burnt-in prior to arrival.
Slide 1 Anthony Affolder US Silicon Meeting, March 9, 2004 Equipment Status ARCS equipment status à Single module and 4 hybrid DAQ equipment status à Vienna.

Slide 1 Anthony Affolder US Silicon Meeting, March 9, 2004 Equipment Status ARCS equipment status à Single module and 4 hybrid DAQ equipment status à Vienna.
1 US Testing Status-Anthony AffolderModule Testing Meeting, Dec. 11, 2003 Update of US Testing Status Anthony Affolder On behalf of the US testing group.

1 US Testing Status-Anthony AffolderModule Testing Meeting, Dec. 11, 2003 Update of US Testing Status Anthony Affolder On behalf of the US testing group.
Andrea Giammanco CMS Tracker Week April 20031 DS ROD Prototype: “final” optohybrids “final” CCUM integrated in the rod with new FEC_to_CCUM adapter (Guido.

Andrea Giammanco CMS Tracker Week April DS ROD Prototype: “final” optohybrids “final” CCUM integrated in the rod with new FEC_to_CCUM adapter (Guido.
Slide 1Module Testing Meeting Jan. 29, 2002CMS Module Testing Issues-Anthony Affolder CMS Module Testing Issues From a CDF Testing Experience Perspective.

Slide 1Module Testing Meeting Jan. 29, 2002CMS Module Testing Issues-Anthony Affolder CMS Module Testing Issues From a CDF Testing Experience Perspective.
CMS Tracker Week – Module Test Meeting – April 2003 – Patrick Gartung 1 Status of US long term module testing Patrick Gartung University of California,

CMS Tracker Week – Module Test Meeting – April 2003 – Patrick Gartung 1 Status of US long term module testing Patrick Gartung University of California,
Anthony AffolderUS CMS Meeting 12/3/02DAQ Based Systems LV/HV Needs DAQ Power Supply Needs HV à 600 V/~1mA range –0.1-1  A Current Sensing –Over Voltage/Current.

Anthony AffolderUS CMS Meeting 12/3/02DAQ Based Systems LV/HV Needs DAQ Power Supply Needs HV à 600 V/~1mA range –0.1-1  A Current Sensing –Over Voltage/Current.
Oct, 2000CMS Tracker Electronics1 APV25s1 STATUS Testing started beginning September 1 wafer cut, others left for probing 10 chips mounted on test boards.

Oct, 2000CMS Tracker Electronics1 APV25s1 STATUS Testing started beginning September 1 wafer cut, others left for probing 10 chips mounted on test boards.
AHCAL Electronics. Front-end electronics and DAQ Mathias Reinecke CALICE meeting Hamburg March 21st, 2013.

AHCAL Electronics. Front-end electronics and DAQ Mathias Reinecke CALICE meeting Hamburg March 21st, 2013.
System Test Status Report R. D’Alessandro 1 TIB System Test Report Where were we ….., Mechanics (layer 3 prototype) Mother Cable & Interconnect Board System.

System Test Status Report R. D’Alessandro 1 TIB System Test Report Where were we ….., Mechanics (layer 3 prototype) Mother Cable & Interconnect Board System.

Similar presentations

Ads by Google