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VLSI System Design LEC3.1 CMOS FABRICATION REVIEW

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Presentation on theme: "VLSI System Design LEC3.1 CMOS FABRICATION REVIEW"— Presentation transcript:

1 VLSI System Design LEC3.1 CMOS FABRICATION REVIEW
Engr. Anees ul Husnain ( ) Department of Computer Systems Engineering, College of Engineering & Technology, IUB

2 A review up till now… Cross Sectional views of a transistor

3 Fabricating one transistor
Oxidation (Field oxide) Silicon substrate Silicon dioxide oxygen Photoresist Develop oxide Coating photoresist Mask-Wafer Alignment and Exposure Mask UV light Exposed exposed Polysilicon Deposition polysilicon Silane gas Dopant gas Oxidation (Gate oxide) gate oxide oxygen Photoresist Remove oxide RF Power Ionized oxygen gas Oxide Etch photoresist Ionized CF4 gas Mask and Etch Ionized CCl4 gas poly gate G S D Active Regions top nitride silicon nitride Nitride Deposition Contact holes Etch Ion Implantation resist ox Scanning ion beam Metal Deposition and Etch drain Metal contacts

4 Top view

5 Wafer preparation

6 Start with P substrate Start  Target structure

7 1. Spin Resist Coating Target structure

8 2. Expose N Well Mask to UV light
Target structure

9 3. Develop resist Target structure

10 4. Implant N Well Target structure

11 Anneal wafer to diffuses N well (heal lattice) and grow new oxide layer
Target structure

12 5. Remove Resist Target structure

13 Remove oxide from anneal
Target structure

14 1. Spin Resist Target structure

15 2. Expose resist with active diffusion mask
Target structure

16 3. Develop resist Target structure

17 4. Grow oxide on exposed surface
Target structure

18 5. Strip resist Target structure

19 Grown thin oxide over silicon surfaces
Target structure

20 1. Deposit poly using Chemical Vapor Deposition (CVD)
Target structure

21 2. Spin resist 3. expose resist using the GATE mask 4. develop resist 5. etch poly
Target structure

22 Remove thin oxide layer where exposed
Target structure

23 1. Spin resist 2. expose with P implant mask 3. develop resist 4
1. Spin resist 2. expose with P implant mask 3. develop resist 4. implant P 5. strip resist Target structure

24 1. Spin resist 2. expose with N implant mask 3. develop resist 4
1. Spin resist 2. expose with N implant mask 3. develop resist 4. implant N 5. strip resist Target structure

25 Remove resist – anneal wafer – oxide etch
Target structure

26 Grow oxide 1. spin resist 2. expose Contact mask 3. develop resist 4
Grow oxide 1. spin resist 2. expose Contact mask 3. develop resist 4. etch contacts 5. strip resist Target structure

27 1. Deposit metal L1 2. spin resist 3. expose metal L1 mask 4
1. Deposit metal L1 2. spin resist 3. expose metal L1 mask 4. develop resist 5. etch metal 6. strip resist Target structure

28 Rest of metal layers follow similarly
Target structure


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