1. ROTAN the X-Ray laboratory Daniel Šimek Jan Drahokoupil Zbyněk Šourek
Jiří Kub
Václav Studnička
the X-Ray laboratory
Oliva Pacherová
Marián Čerňanský
Marie Trousilová
Petr Veřtát

2. Equipment operated room 120 room 046 room 043 3 open X-ray sources
Back scattered Laue method
Debye-Schrerer method
Bragg-Brentano HZG3 in reconstruction
X’Pert Pro vertical diffractometer
Bragg-Brentano (Co, Cu) with PSD
Parallel beam geometry (Co)
Texture accessory (limited liability range)
High temperature chamber (RT to 2200 ˚C)
Bruker D8 with rotating anode
Parallel beam geometry, Cu anode only
Set of three primary monochromators/collimators (Bartels)
Variable slit, parallel plate collimator or analyzers in diffracted beam
Eulerian cradle (chi, phi, X-Y-Z-stage)
Domed low-temerature chamber (-100 to +350 ˚C)
Rigaku Rotaflex rotating anode generator
Two diffractometers attached, Cu, Co, Mo
Parallel beam-geometry powder diffractometer Huber (Cu anode only)
3 crystal single crystalline diffractometer BEDE
Fine focus open source (Cu anode)
instrumentation experiments (X-ray optics etc.)
room 120
room 046
room 043

3. Single crystal services
Low resolution (Laue method) Marie Trousilová, Václav Studnička
Single crystal orientation determination
Orienting single crystals (for cutting etc.)
High resolution (epitaxial layers) Oliva Pacherová, Zbyněk Šourek, Jiří Kub
mutual orientation of layer/substrate
heteroepitaxy parameters (misfit → strain)
(multi)layer thicknesses, roughness
X-ray reflectivity also works for atomically smooth amorphous/polycrystalline (multi)layers Oliva Pacherová, Daniel Šimek, Jiří Kub
thickness and roughness of (multi)layers
Non-ambient -100 to +350 ˚C

4. Powder (polycryst.) services
Film methods (historical)
Debye Scherrer characterisation (crystal statistics)
Phase analysis Jan Drahokoupil, Václav Studnička, Petr Veřtát
qualitative (phase recognition) of known inorganic phases in powder, polycrystals both bulk and thin layers
quantitative (phase fractions) for powders or non- or weak textured bulk polycrystals (Rietveld refinement)
phase transformations (e.g. with temperature)
Structure refinement Jan Drahokoupil, Daniel Šimek, Petr Veřtát
Microstructure analysis Jan Drahokoupil, Marián Čerňanský, Daniel Šimek, Petr Veřtát
grain sizes (<300 nm)
residual strain (thin layers, surface)
texture characterisation (liable for cubic symmetry)
Non-ambient RT to ˚C (liable for powders)

5. Special (on-demand)
In-situ experiments (mechanical load) on polycrystaline samples Jan Drahokoupil, Petr Veřtát
Phase transformations under mechanical load
Instrumentation Daniel Šimek, Jiří Kub, Jan Drahokoupil
Statistical characterisation of grain sizes > 1 μm
Hi precision single-crystal orienting
Novelty crystallographic techniques (holography, diffuse scattering)
X-ray optics testing Jiří Kub, Zbyněk Šourek
X-ray lens, optics prototyping

6. Summary
The (responsible) persons for particular techniques were introduced
Feel free to turn to them directly with your problems
If you are not sure to whom to turn, ask me to help you
If you think you would need (even in a future) something else, let me know.

7. Future? (we would like to purchase)
Texture diffractometer with 2D detector
reliable texture analysis of any material
grain statistics (equivalent to D-S method)
fast tracking of phase transformations (non/ambient, diffusion processes)
Pair distribution function characterisation (short-range ordered materials)
Microtomography with phase/diffraction contrast
non-destructive 3D imaging of voids, cracks, inclusions
non-destructive 3D grain boundaries imaging
non-destructive 3D grain orientation imaging
in-situ experiments (crack-growth, domain walls migration)
Improved Laue method (automated with CCD camera)
fast orienting and attaching to any holder, less trained personnel (anyone)
Hi-resolution diffractometer with beam collimated in both directions
in plane measurements, non-coplanar diffraction
small angle scattering on nano-sized objects
Solid ’21 ? ?