1. Beam Lines At SSRL Cathie Condron SSRL Scattering Workshop May 2007

2. Materials Scattering Beam Lines Characteristics Diffractometer Flux Energy range Detectors Analyzers Sample stages Used for Planning Experiments at SSRL

3. 1-4 SAXS Q range 0.0001 – 1 Å Scatter From 1-100 nm density inhomogeneities Energy Range 8333 eV Detector CCD Sample Stages Transmission Flow Cell Heater (R.T. ~ 200 °C) Reflection

4. Use full to look at nanoparticles (catalysts, bio-oxides, geo-oxides) nanoporous materials co-polymers dendimers supramolecular assemblies Micelles colloids metallic glasses 1-4 SAXS WAXS patterns contain data concerning correlations on an intra-molecular, inter-atomic level SAXS patterns contain data concerning correlations on an inter-molecular level

5. 2-1: Powder/ Thin Film Diffraction Diffractometer Huber 2-circle:  (sample), 2  (detector) Flux ~10 11 to 10 12 photons/s Energy Range 4000 eV to 15800 eV Detector Bicron (scintillation, no E resolution) Vortex (future, ~100 eV E resolution) Analyzers Crystal (high-resolution) Sollar (low resolution) Slits (adjustable/ lowish) Sample Stages Flat Plate Capillary (hard to use) Transmission cell (John Bargar) Anton Paar Heater (R.T. – 1173 K) * Motorized Sample Stage coming soon ARS Cryostat (10 K – 350 K)   

6. 2-1 powder Diffraction, Amorphous Materials, Reflectivity, Thin films, Anomalous diffraction, Specular Specular Diffraction of Pentacene Thin films: How The Structure Changes with Film Thickness

7. 7-2: X-ray Scattering and Diffraction Diffractometer Huber 4-circle:  (sample), 2  (detector), ,  Flux ~ 10 10 Energy Range 5000 eV to 17500 eV Detector Bicron Vortex Analyzers Crystal (high-resolution) Sollar (low resolution) Slits (adjustable/ lowish) Sample Stages Flat Plate (vacuum chuck) Anton Paar Heater (R.T. – 1173 K) ARS Cryostat (10 K – 350 K)   22 

8. 7-2 Single crystals, Grazing-incidence, Anomalous diffraction, Thin films, Surface studies Polythiophene Thin Film Transistors: Highly Oriented Crystals at The Interface Grazing-Incidence Rocking Curve Kline et all. Nature Materials, 5, 222, 2006

9. 11-3: X-ray Scattering and Diffraction Diffractometer Huber kappa-geometry (θ, , φ, 2θ) Flux 2.6 x 10 10 ph/s Energy Range Fixed at 12700 eV (Se edge) Detector Area detector (usually a MAR345) , θ and 2θ Fixed Sample Stages Flat Plate Capillary Flat plate transmission and other specialized user-designed stages φ

10. 11-3 Texture, Real time experiments, Polycrystalline, Small grains (e.g. soils), Thin films, Grazing-incidence t=0t=7t=8t=9t=10

11. Work with scientific staff before arrival to SSRL Think about the information you want Peak shape Peak position Variation of peak with q How long will you need to count Temperature dependence Sample environment Determine Appropriate Beam line Energy Detector Analyzer Sample holder Special equipment If you are not familiar with the instrument you will be using plan to sit in with another team if at all possible Planning an SSRL Experiment