1. M.Sc. Electrical Engineering Fall 2017 Lecture 1 (Review) Prof. Dr. M. Iram Baig

2. Basic Information Course Instructor: Prof. Dr. Muhammad Iram Baig Day & Time: Every Thursday, 6:00 PM to 9:00 PM Semester Start: 25.09.2017 Semester Close: 09.02.2018 Books: 1. “VLSI Test Principles and Architectures, Design for Testability” by Laung-Terng Wang. Morgan Kaufmann 2. “Essentials of Electronic Testing for Digital, Memory and Mixed signal VLSI Circuits” by Michael L. Bushnell and Vishwani D. Agarawal. Kluwer Publishers 3. “Digital Systems Testing & Testable Design” by Miron Abramovici, Melvin A. Breuer and Arther D. Friedman. IEEE Press

3. Books

4. INTRODUCTION TESTING

5. INTRODUCTION….. contd Testing at different levels of ABSTRACTION Complexity of a circuit is related to level of ABSTRACTION in information processing by a Digital System

6. INTRODUCTION …contd Testing cover different activities & environments: Errors and Faults Incorrect operation of the system is an (observed) Error which can be due to Design, Fabrication defects or Physical failures. Examples of Design Error

7. INTRODUCTION …contd Reasons of Fabrication Errors Wrong Components Incorrect Wiring Shorts caused by improper soldering Physical Failures occur during lifetime of a system due to aging and environmental factors. Physical Faults can be: Physical faults do not allow a direct mathematical treatment for testing or diagnosis.

8. INTRODUCTION… contd Test Evaluation To determine the effectiveness or quality of a test Test Evaluation is carried out via Fault Simulation (observation of response of a circuit in the presence of faults) Fault Coverage Ratio of faults detected and total # of Faults

9. Types of Testing

10. Types of Testing… contd

12. TERMENOLOGY Off-line Testing On-Line Testing

13. TERMENOLOGY… contd In-Circuit Emulation Guided-probe Testing

14. TERMENOLOGY… contd In-Circuit Testing Algorithmic Testing

15. TERMENOLOGY … contd Test Generation Test Generation (TG) is the process of determining the stimuli necessary to test a digital system. TG depends primarily on the testing method employed On-line testing do not require TG TG can be fault oriented (tries to generate tests that will detect specific faults) or function oriented (tries to generate a test that shows that the system performs its specific function) Design for Testability (DFT) Introducing testability criteria early in the design stage.

16. Diagnosis & Repair The term Diagnosis & Repair apply both to Physical Faults and Design Errors Two approaches for Fault Diagnosis: Cause-effect Analysis Enumerates all possible faults (causes) which exists in a fault model and determines all their corresponding responses (effects) to a given applied test. Effect-cause Analysis Processes the actual response of the DUT (the effect) and tries to determine directly only the faults (causes) that could produce that response.

53. Automatic Test Equipment (ATE) Assignment 1, Q2: Some salient features of ATE equipment produced by above companies. Teradyne, ……….etc.

54. T6682 Specifications & Features