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Detailed Characterization of Vacuum Chamber Surface Properties Using Measurements of the Time Dependence of Electron Cloud Development Jim Crittenden.

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Presentation on theme: "Detailed Characterization of Vacuum Chamber Surface Properties Using Measurements of the Time Dependence of Electron Cloud Development Jim Crittenden."— Presentation transcript:

1 Detailed Characterization of Vacuum Chamber Surface Properties Using Measurements of the Time Dependence of Electron Cloud Development Jim Crittenden Cornell Laboratory for Accelerator-Based Sciences and Education CESRTA Advisory Committee Rehearsal 7 September 2012

2 EC Buildup Detectors at CESRTA
L3 Electron cloud experimental region PEP-II EC Hardware: Chicane, SEY station Four time-resolved RFA's Drift and quadrupole diagnostic chambers New electron cloud experimental regions in arcs (after 6 wigglers moved to L0 straight) Locations for collaborator experimental vacuum chambers equipped with shielded pickup detectors 15E 15W Custom vacuum chambers with shielded pickup detectors Uncoated aluminum, and TiN, amorphous carbon, diamond-like carbon coatings 30 RFA's in drift regions, dipoles, quadrupoles, and wigglers

3 Shielded Pickup Design and Readout
10 kW Bias +50 V 0.76 mm diameter 8-bit digitizing oscilloscope 2 mm X 100 0.1 µF 50 W Detail The pickup electrodes are shielded by the vacuum chamber hole pattern against the beam-induced signal. The positive bias ensures that secondaries produced on the electrode do not escape.

4 Witness Bunch Method for Constraining Model Parameters
Example : 5/9/ GeV e+ 3 mA/bunch Al v.c. 15W Shielded pickup scope trace for two bunches 44 ns apart Superposition of 15 such traces illustrating the sensitivity to cloud lifetime Leading bunch signal from photoelectrons produced on the bottom of the vacuum chamber Witness bunch signal includes in addition cloud electrons, mostly secondaries, accelerated into the detector by the beam. The single bunch signal arises from photoelectrons produced on the bottom of the vacuum chamber. Its shape is closely related to the photoelectron kinetic energy distribution and the beam kick. The witness bunch signal includes the single-bunch signal as well as the that produced by cloud particles accelerated into the shielded pickup by the kick from the witness bunch. The witness signal is therefore sensitive to SEY.

5 Electron cloud buildup modeling code ECLOUD
* Originated at CERN in the late 1990's * Widespread application for PS, SPS, LHC, KEK, RHIC, ILC ... * Under active development at Cornell since 2008 * Successful modeling of CESRTA tune shift measurements * Interactive shielded pickup model implemented in 2010 * Full POSINST SEY functions added as option * Flexible photoelectron energy distributions added 2011 * Synrad3D photon absorption distribution added 2011 Modeled Signal Counting signal macroparticles in each time slice gives the statistical uncertainty Generation of photoelectrons Production energy, angle Azimuthal distribution (v.c. reflectivity) Time-sliced cloud dynamics Cloud space charge force Beam kick Magnetic fields Secondary yield model True secondaries (yields > 1!) Rediffused secondaries (high energy) Elastic reflection (dominates at low energy) Shielded pickup model Acceptance vs incident angle, energy Signal charge removed from cloud Non-signal charge creates secondaries

6 Modeled photoelectron kinetic energy distribution
The shape of the signal from the leading bunch is determined by the photoelectron production energy distribution. Two Power-Law Contributions F(E) = E P1 / ( 1 + E/E0 ) P2 E0 = Epeak (P2-P1)/P1 This level of modeling accuracy was achieved with the photoelectron energy distribution shown below, using a sum of two power law distributions. Epeak= 80 eV P1= 4 P2= 8.4 The high-energy component (22%) has a peak energy of 80 eV and an asymptotic power of Its contribution to the signal is shown as yellow circles in the lower left plot. Epeak= 4 eV P1= 4 P2= 6 The low-energy component (78%) has a peak energy of 4 eV and an asymptotic power of 2. It's contribution to the signal is shown as pink triangles. Electron Cloud Buildup Models and Plans at CESRTA JAC et al, LCWS11 Recent Developments in Modeling Time-resolved Shielded-pickup Measurements of Electron Cloud Buildup at CESRTA JAC et al, IPAC11

7 Constraints on the energy distribution of “true” secondary electrons f(Esec) ~ Esec exp (-Esec/ESEY ) The time development of the cloud is directly dependent on secondary kinetic energies and therefore on the relative probabilities of the three secondary production processes: 1) True secondaries dominate at high incident energy and are produced at low energy 2) Rediffused secondaries are produced at energies ranging up to the incident energy 3) Elastic scattering dominates at low incident energy The CESRTA Test Accelerator Electron Cloud Research Program Phase 1 Report M.A.Palmer et al, August, 2012 Recent Developments in Modeling Time-resolved Shielded-pickup Measurements of Electron Cloud Buildup at CESRTA JAC et al, IPAC11 Electron Cloud Buildup Models and Plans at CESRTA JAC et al, LCWS11 The pulse shape for the 14-ns witness bunch signal sets a lower bound on the model parameter ESEY.

8 Beam conditioning effects on an amorphous carbon coating
Recent Developments in Modeling Time-resolved Shielded-pickup Measurements of Electron Cloud Buildup at CESRTA JAC et al, IPAC11 Time-resolved Shielded-pickup Measurements and Modeling of Beam Conditioning Effects on Electron Cloud Buildup at CESRTA JAC et al, IPAC12 The beam conditioning effect for an amorphous carbon coating is primarily in quantum efficiency in both the early and late conditioning processes.

9 Witness Bunch Study for Uncoated Aluminum 5/17/2010
15W 5.3 GeV 3 mA/bunch e+ 4-ns spacing 2010 model now updated to use Synrad3D results and vacuum chamber profile with vertical side walls The later witness bunches provide sensitivity to the value for elastic yield.

10 Discriminating between the true and rediffused
secondary yield processes The rediffused secondary yield process determines the trailing edge of the signal from a single bunch. This trailing edge is insensitive to d0 . The late witness bunch signal used to determine d0 is also sensitive to the rediffused yield process. The witness bunch method provides discriminating power between the true and rediffused processes.

11 Witness Bunch Study for TiN-coated Aluminum
Compare recent measurements to those of 6/18/2011 15W 5.3 GeV 5 mA/bunch e+ 14-ns spacing Present best model for 6/18/11 Same model with 8/23/12 measurements on unconditioned TiN Initial indication is the quantum efficiency is similar, but there is much more cloud due to SEY.

12 Two amorphous-carbon coatings Diamond-like carbon coating
Shielded-pickup Witness Bunch Measurement Program present 2.1, 4.0, and 5.3 GeV e+ and e- beams 1-10 mA/bunch Uncoated aluminum TiN-coated aluminum Two amorphous-carbon coatings Diamond-like carbon coating Unconditioned uncoated aluminum Unconditioned TiN coating Unconditioned a-carbon coating 4-ns, 14-ns bunch spacings up to 140 ns Analysis program continues

13 Summary The witness bunch technique using the time-resolved measurements provided by shielded-pickup detectors provides remarkable discriminating power for the various contributions to electron cloud buildup. Photoelectron production characteristics are clearly distinguished from secondary electron yield processes. The secondary yield values for the true, rediffused and elastic processes can be independently constrained with good accuracy. Much work remains to take advantage of the data obtained with solenoidal magnetic field and the transverse segmentation of the time-resolved RFA's.

14 Vacuum Chamber Comparison Under Same Beam Conditions
5.3 GeV Positron Beam Witness bunch with 28-ns spacing 15W 15E 5 mA/bunch The a-carbon coating suppresses high-energy photoelectrons compared to the TiN coating. The results for the second a-carbon-coated chamber corroborate the high-energy photoelectron suppression relative to TiN observed with the first a-carbon-coated chamber. The quantum efficiency for reflected photons and the SEY are both much smaller for the TiN coating compared to uncoated aluminum. 3 mA/bunch The second carbon-coated chamber shows conditioning effects between 5/17/10 and 12/24/10 , primarily for the quantum efficiency.

15 Electron cloud buildup modeling code ECLOUD
* Originated at CERN in the late 1990's * Widespread application for PS, SPS, LHC, KEK, RHIC, ILC ... * Under active development at Cornell since 2008 * Successful modeling of CESRTA tune shift measurements * Interactive shielded pickup model implemented in 2010 * Full POSINST SEY functions added as option * Flexible photoelectron energy distributions added 2011 * Synrad3D photon absorption distribution added 2011 Cloud snapshot after 14 ns Generation of photoelectrons Production energy, angle Azimuthal distribution (v.c. reflectivity) Time-sliced cloud dynamics Cloud space charge force Beam kick Magnetic fields Secondary yield model True secondaries (yields > 1!) Rediffused secondaries (high energy) Elastic reflection (dominates at low energy) Shielded pickup model Acceptance vs incident angle, energy Signal charge removed from cloud Non-signal charge creates secondaries

16 Modeled secondary electron kinetic energy distributions
Probabilistic Model for the Simulation of Secondary Electron Emission M.A.Furman and M.F.F.Pivi, Phys. Rev. ST-AB 5, (2002) Can Low-Energy electrons Affect High-Energy Particle Accelerators? R.Cimino, et al, Physical Review Letters, Vol. 93, Nr. 1, (2004) The time development of the cloud is directly dependent on secondary kinetic energies and therefore on the relative probabilities of the three secondary production processes.

17 Evolution of cloud profile prior to each bunch passage
Prior to 14-ns bunch Prior to 28-ns bunch Prior to 84-ns bunch Determines the shielded-pickup signal shape and size.

18 Vacuum Chamber Comparison Under Same Beam Conditions
5.3 GeV Positron Beam Witness bunch with 14-ns spacing Both the quantum efficiency and secondary yield for the TiN coating is remarkably stable over this range of beam conditioning. Note also that the reproducibility of the measurement is at the level of a few percent after two months.

19 Witness Bunch Study for TiN-coated Aluminum
Compare recent measurements to those of 6/18/2011 15W 5.3 GeV 5 mA/bunch e+ 28-ns spacing

20 Electron and positron beams 1-10 mA/bunch Uncoated aluminum
Shielded-pickup Witness Bunch Measurement Program present 2.1, 4.0, and 5.3 GeV Electron and positron beams 1-10 mA/bunch Uncoated aluminum TiN-coated aluminum Two amorphous-carbon coatings Diamond-like carbon coating Unconditioned uncoated aluminum Unconditioned TiN coating Unconditioned a-carbon coating 4-ns, 14-ns bunch spacings up to 140 ns

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