1. Database requirements from ITk-Strips for DAQ loads
Jiri Kroll, on behalf of ITK strips community

2. Contents Breakdown of components for Strips Upgrade
Max numbers of parts in the Build
DAQ loads
Summary
Meeting on ITk production databases

3. Strip Tracker Components
I act as the contact from the strips to the production database designers at Unicorn College
This talk has is an update to the presentation Andy Blue gave last year at the production database meeting in Prague
It has
Updated layout
More components (power boards, HV switches etc)
Will use this info as the input to you
Meeting on ITk production databases

4. Strip Tracker ‘Parts’ Very simplistic outline for just now Stave/
Petal Cores
Glues
HV Mutiplexing
Tapes
Eos
Staves/Petals
Sensors
ABC ASICs
Modules
Hybrids
HCCs
Will work this way
Power boards
Hybrid Panels
Meeting on ITk production databases

5. Strip Tracker Components
From LOI CERN-LHCC ; LHCC-I-023
Meeting on ITk production databases

6. Strip Tracker Components
HCC
Multiplexing ASIC
Sensor
Hybrid
LV Powering Board (Liverpool, RAL & BNL)
ABC ASIC
Barrel Module: Composed of 2 Hybrids and 1 sensor
Each Hybrid has
10 x ABC130 readout chips
1 x HCC multiplexing chip
1 x LV Powering board
Meeting on ITk production databases

7. Strip Tracker Components
R5 module
R4 module
R3 module
R2 module
R1 module
R0 module S0 S1 H0 H1 H2 H3
Petal: Composed of 5 different modules with 13 Hybrid variants
7-12 x ABC130 readout chips /Hybrid
~1 x HCC multiplexing chi/Hybrid
~1 x LV Powering board
Meeting on ITk production databases

8. And Finally Endcap Totals Modules 8064 Hybrids 11648 ABC ASICs 107832
HCCs
Barrel
Totals
Modules
10976
Hybrids
14784
ABC ASICs
147840
HCCs
Meeting on ITk production databases

9. Present day WE have approximately 20 sites ready to test DAQ loads
DAQ loads contain
hybrid
HCC
ABC130
mini sensor
Frame
Plan for 40 DAQ loads
Each DAQ load has an identification code
Meeting on ITk production databases

10. What do we want We want to compare
ASIC (ABC130 and HCC) tests before and after they are assembled into the DAQ loads
DAQ load tests from 20 institutes from around the world for comparison plots
Meeting on ITk production databases

11. What do we want to record? – DAQ loads
Item
Data Type
Comments
DAQ load
eps & txt
3 Point Gain
Threshold
Noise Occupancy
# dead, masked channels
ABC + HCC ASICs
Wafer map, .dat, txt. .eps
Wafer tests
Meeting on ITk production databases

12. DAQ loads
From tests we produce output (txt) files that have for each channel the
Channel no.
Gain
Offset
noise
Meeting on ITk production databases

13. ASICs #
Information on the ASICS (ABC130 and HCC) are recorded when they are wafer probed
We want the database to link the results from the wafer probing to the DAQ load tests
ABCn25 data (per asic)
#chan code vt50 gain offset innse
Meeting on ITk production databases

14. Time frames
Is it possible to have a timeframe on when we should have such a database for these comparison tests?
Do we need write the application to allow us to upload the files to the database?
Meeting on ITk production databases