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Reliability and Safety Analysis

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Presentation on theme: "Reliability and Safety Analysis"— Presentation transcript:

1 Reliability and Safety Analysis
Digi-Brush Reliability and Safety Analysis Presenter: Josh Long Team Members: Katie Schremser Caleb Ayew-ew

2 Components to Analyze FPGA Microcontroller Power Supply Memory VDAC

3 FPGA Parameter name Description Value
Comments regarding choice of parameter value, especially if you had to make assumptions. C1 Die complexity .29 30,001 to 60,000 Digital MOS gates πT Temperature coeff. .71 Linear, temp of 50°C C2 Package Failure Rate 240 Functional Pins, Nonhermatic πE Environment Factor 2 Ground Fixed πQ Quality Factor 10 Commercially manufactured component πL Learning Factor 1 More than 2 years in production λP Part Failure Rate Failures/106 hours MTTF Hours = Years

4 Microcontroller Parameter name Description Value
Comments regarding choice of parameter value, especially if you had to make assumptions. C1 Die complexity .28 16 bit MOS gates πT Temperature coeff. .71 Linear, temp of 50°C C2 Package Failure Rate 112 Functional Pins, Nonhermatic πE Environment Factor 2 Ground Fixed πQ Quality Factor 10 Commercially manufactured component πL Learning Factor 1 More than 2 years in production λP Part Failure Rate Failures/106 hours MTTF Hours = Years

5 Power Supply Parameter name Description Value
Comments regarding choice of parameter value, especially if you had to make assumptions. C1 Die complexity .01 1 to 100 Linear MOS gates πT Temperature coeff. .71 Linear, temp of 50°C C2 Package Failure Rate 5 Functional Pins, Nonhermetic πE Environment Factor 2 Ground Fixed πQ Quality Factor 10 Commercially manufactured component πL Learning Factor 1 More than 2 years in production λP Part Failure Rate .11194 Failures/106 hours MTTF Hours = Years

6 FMECA Functional Blocks FPGA Microcontroller Power Supply
FPGA Peripherals Microcontroller Micro Peripherals Power Supply

7 FPGA

8 FPGA Peripherals

9 FPGA Circuitry Failure No. Failure Mode Possible Causes
Failure Effects Method of Detection Criticality Remarks B1 No clock Signal Failure of U10 or C14 Device does not functions Observation Low B2 Corrupted Data Store Software, Failure of U3 Unpredictable graphical display Medium B3 No Video Output Software, Failure of U5 No display on LCD monitor B4 Code does not load Failure of U6 B5 No file saved to SD card Software, Short/Open circuit No file on SD card

10 Microcontroller

11 Micro Peripherals

12 Microcontroller Circuitry
Failure No. Failure Mode Possible Causes Failure Effects Method of Detection Criticality Remarks C1 Touch Panel does not work Software, Short/Open circuit User touch is no recorded Observation Medium C2 Color pots do not work User unable to select colors C3 Pushbuttons do not work Software, Short/Open circuit, Failure of R3, R4 User unable to save or clear screen Low C4 LED Driver does not work Software, Failure of U4 LED does not illuminate C5 SPI communication does not work Software, Failure of U13 No communication between FPGA and Micro

13 Power Supply

14 Power Supply Circuitry
Failure No. Failure Mode Possible Causes Failure Effects Method of Detection Criticality Remarks A1 5V output = 0V Failure of U16, C66, D3, C65, L3, External Short Device does not functions Observation Low A2 5V output > 5V Failure of U16, R36, R32, R25 Possible damage to rest of circuitry Medium A3 5V output out of tolerance Failure of C66, C65, R32, R36, U16 Unpredictable operation A4 3.3V output = 0V Failure of U11, C64, D2, C63, L2, External Short A5 3.3V output > 3V Failure of U11, R24, R23, R22 A6 3.3V output out of tolerance Failure of C64, C63, R23, R24, U11 A7 1.25V output = 0V Failure of U15, C62, C61, D1, L1, External Short A8 1.25V output > 1.25V Failure of U15, R18 A9 1.25V output out of tolerance Failure of U15, C62, C61, R18

15 Questions / Discussion


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