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MODULE QUALIFICATION STATUS AT LIVERPOOL

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Presentation on theme: "MODULE QUALIFICATION STATUS AT LIVERPOOL"— Presentation transcript:

1 MODULE QUALIFICATION STATUS AT LIVERPOOL
Results from Liverpool Future Plans 6th June 2003 UK SCT MB Meeting Neil Jackson

2 CURRENT STATUS Liverpool has received 5 qualification modules from Manchester 4 have been surveyed at Liverpool – generally good agreement with Manchester All 5 qualification modules have been bonded, tested for (initial) I / V, thermally cycled X10 from –30C to 35C 4 of these have also undergone metrology,the long term test + characterisation The 5th is currently undergoing the long term test 6th June 2003 UK SCT MB Meeting Neil Jackson

3 RESULTS FROM LIVERPOOL
Box for thermal cycling Test box Enclosure with 4 test Boxes (soon to be 6) 6th June 2003 UK SCT MB Meeting Neil Jackson

4 Earthing techniques have been developed further
Earth connection from kapton to cooling pipe allows the use of thermal pads and works well Improved earthing on test boxes removes the need for this connection Metrology results for modules M O 42, M O 43, M O 45 and M O 46 are all within specification although the Z measurements for M O 043 are at the limit See Steve Snow’s talk 6th June 2003 UK SCT MB Meeting Neil Jackson

5 Testing the module M O 042 Visual inspection picked up some flattened bonds on the hybrid of the first module .. Also seen at RAL The confirmation test was passed successfully Following bonding the module was characterised and IV tested Metrology was performed both before and after thermal cycling -- Checked with Steve Snow Long term test with IV and characterisation Needs repeating Electrical results show ‘stuck channels’ which appear and disappear at random 6th June 2003 UK SCT MB Meeting Neil Jackson

6   Results for M O 042 Digital Tests: All electrical tests passed except for the FullBypassTest. The module failed as VDD is varied from 4.0V down to 3.5V. It failed at 3.8V, when using Select = 0. This is not a module problem. It is an issue with reading out thru the opto chips. This has now been resolved with revised values for AERO configuration. FullBypassTest redone on 09/06/2003, no problems encountered. Bad Channels: 42 #DEAD or STUCK 181 #DEAD or STUCK 356 #DEAD or STUCK 465 #DEAD or STUCK 617 #DEAD or STUCK 769 #DEAD or STUCK 1010 #DEAD or STUCK 1123    #DEAD or STUCK 6th June 2003 UK SCT MB Meeting Neil Jackson

7 1210 #Low Gain 1366 #NOISY 1416 #DEAD or STUCK ‘Stuck’ Channels are showing up on the LongTerm test at: 42, 1123 & 1416 These channels are supposedly masked. Module Performance: Gain Offset Input Noise Noise Occ. 56.74mV/fC 39.54mV 1392e 5.22E-5 IV Curve: Module IV taken up to 500V before thermal cycling Module IV taken up to 500V after thermal cycling 6th June 2003 UK SCT MB Meeting Neil Jackson

8 End-Cap Module M O 042 HOT channels which are not picked up by SCTDAQ:
Stuck Channels? Results in high occupancy 6th June 2003 UK SCT MB Meeting Neil Jackson

9 End-Cap Module M O 042 But they can go away: No Stuck Channels!
Noise Occ <4E-5 6th June 2003 UK SCT MB Meeting Neil Jackson

10 Initial long term test for M O 042 6th June 2003 UK SCT MB Meeting
Neil Jackson

11 Repeated test 6th June 2003 UK SCT MB Meeting Neil Jackson

12 I / V for M O O42 6th June 2003 UK SCT MB Meeting Neil Jackson

13 ISSUES with M O 042 Intermittent stuck channels come and go randomly
Power cycling has no effect Not related to how long the module has been biased The mask file is the same whether the channels are stuck or not The channels cannot be masked manually Two ‘gaps’ in initial Term Test but OK when test was repeated 6th June 2003 UK SCT MB Meeting Neil Jackson

14 RESULTS FROM MO 045 Digital Tests: All electrical tests passed except for the FullBypassTest. The module failed as VDD is varied from 4.0V down to 3.5V. It failed at 3.8V This is not a module problem. It is an issue with reading out thru the opto chips. This has now been resolved with revised values for AERO configuration. Bad Channels: No Masked Channels. Module Performance: Gain Offset Input Noise Noise Occ. 55.57mV/fC 38.97mV 1403e 5.22E-5 IV Curve: Module IV taken up to 500V before thermal cycling. Module shows breakdown at 175V after thermal cycling. HV power supply trips after 175V. 6th June 2003 UK SCT MB Meeting Neil Jackson

15 All tests satisfactory except that final I/V test fails at 175V
With slow conditioning using an SMU 350V is possible 6th June 2003 UK SCT MB Meeting Neil Jackson

16 Long term test for M O 045 6th June 2003 UK SCT MB Meeting
Neil Jackson

17 RESULTS FROM M O 043 Digital Tests: All electrical tests passed except for the FullBypassTest. The module failed as VDD is varied from 4.0V down to 3.5V. It failed at 3.8V This is not a module problem. It is an issue with reading out thru the opto chips. This has now been resolved with revised values for AERO configuration. Bad Channels: #DEAD or STUCK 357 #DEAD or STUCK 483 #DEAD or STUCK 620 #DEAD or STUCK 678 #DEAD or STUCK 881 #DEAD or STUCK 970 #DEAD or STUCK 1117 #DEAD or STUCK 1187 #DEAD or STUCK 1350 #DEAD or STUCK 1470 #DEAD or STUCK 6th June 2003 UK SCT MB Meeting Neil Jackson

18 Gain Offset Input Noise Noise Occ. 55.97mV/fC 37.84mV 1454e 4.86E-5
Module Performance: Gain Offset Input Noise Noise Occ. 55.97mV/fC 37.84mV 1454e 4.86E-5 IV Curve: Module IV taken up to 500V before thermal cycling Module IV taken up to 350V after thermal cycling - this was done as there was an issue with Module M-O-045 which is shows breakdown at ~175V. It was thus decided not to take up to 500V. This final step will now be done this week 6th June 2003 UK SCT MB Meeting Neil Jackson

19 and before the long term test.
Plot taken after Thermal cycling and before the long term test. 6th June 2003 UK SCT MB Meeting Neil Jackson

20 Final Noise Occupancy for M O 043
6th June 2003 UK SCT MB Meeting Neil Jackson

21 Long term test 6th June 2003 UK SCT MB Meeting Neil Jackson

22 Results for M O 046 Digital Tests: All electrical tests passed.
Bad Channels: #DEAD or STUCK 249 #DEAD or STUCK 346 #DEAD or STUCK 455 #DEAD or STUCK 525 #DEAD or STUCK 694 #DEAD or STUCK 828 #DEAD or STUCK 996 #DEAD or STUCK 1211 #DEAD or STUCK 1294 #DEAD or STUCK 1483 #DEAD or STUCK 6th June 2003 UK SCT MB Meeting Neil Jackson

23 Gain Offset Input Noise Noise Occ. 56.30mV/fC 37.27mV 1380e 7.36E-6
Module Performance: Gain Offset Input Noise Noise Occ. 56.30mV/fC 37.27mV 1380e 7.36E-6 IV Curve: Module IV taken up to 500V before thermal cycling Module IV taken up to 500V after thermal cycling 6th June 2003 UK SCT MB Meeting Neil Jackson

24 Noise Occupancy for M O 046 6th June 2003 UK SCT MB Meeting
Neil Jackson

25 Long Term test for M O 046 6th June 2003 UK SCT MB Meeting
Neil Jackson

26 I / V plot for M O 046 6th June 2003 UK SCT MB Meeting Neil Jackson

27 Status of Module M O 049 Bonding and initial I/V to 500 V completed successfully Thermal cycling completed Long Term Test and Characterisation underway but Problem with SCTDAQ Picks up a trim file which is not set up for 1 fC Causes an offset for the noise occupancy Problem is under study Good news is that the shape of the noise occupancy looks OK 6th June 2003 UK SCT MB Meeting Neil Jackson

28 Future Plans Complete I / V plot for M O 043 up to 500V
Solve current problem with SCTDAQ Complete testing of M O 049 Upload all data to the database Go for qualification Run multi - modules simultaneously So far we have run 2 simultaneously Check out DAQ and cooling 6th June 2003 UK SCT MB Meeting Neil Jackson

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