1. 1 Mission Impossible ? Develop and deliver a test strategy for a single product line with over 6 million units per annum. 4030 ILS High Speed Flying Probe Tester 3030 ILS Bed of Nail ICT Testr System 4060 ILS Advanced Capability Flying Probe Testers

2. Goepel Tech Day March - 2013 -

3. The challenge

4. Goepel Tech Day March - 2013 - Test 6 million boards on one line Beat rate of 8 Secs Conventional Test coverage of 49% 1 BScan Device Mission Impossible?

5. Goepel Tech Day March - 2013 - Hand Held Medical FDA Approval Consumer Product

6. Goepel Tech Day March - 2013 - BScan device is “pass through” only 230 parts Panel of Boards SMT Top & Bottom 0201 devices Micro Controller, Flash & Eprom

7. Goepel Tech Day March - 2013 - Reusable Line 100% Procession Validation FDA Approval Remote Line Management Reduction of Current Test Stages

8. Clients Current Solutions

9. Goepel Tech Day March - 2013 - ICT BoN with 56% Coverage Test time 15 Secs CAL & FTE Programming Custom Test S/W “Rack & Stack” Test Instruments Test Time 190 Secs FTE Programming Custom Test S/W “Rack & Stack” Test Test Time 140 Secs Programming Customisation Test Time 60 Secs

10. Goepel Tech Day March - 2013 - ICT Poor Coverage Slow Cycle time. Poor Process Validation Inspection Used to Compensate CAL & BLF Programming Overhead for Test Code 3-6 Month S/W development projects High failure rate due to ICT escapes Significant Overhead Caused by ICT Shortfall FTE Additional Test Code Programming 3-6 Month S/W development Rerunning of Previous Tests Additional Manual Switch & LCD test No Evidence of Damage due to Previous Process Programming Regionalisation Further LCD tests Low to No Fallout

11. New Solutions

12. Goepel Tech Day March - 2013 - ICT, PROG & CAL SPEA 4030 FPT with BoN Goepel VarioTAP ICT, PROG & CAL SPEA 4030 FPT with BoN Goepel VarioTAP FTE SPEA 3030 Vision Switch Test

13. Goepel Tech Day March - 2013 - SPEA 4030 ILS Flying Probe Tester Ultra Fast Top Side Flying Probe BoN for Simultaneous Conventional Access Full Parametric ICT NZT Goepel VarioTAP Quad Board Programming Fast Changeover

14. Goepel Tech Day March - 2013 - Goepel Boundary Scan High Speed Device Programming VarioTAP CAL Test Setup Using VarioTAP Goepel FMC VarioTAP Development

15. Goepel Tech Day March - 2013 - SPEA 3030 ILS FTE Test System Configurable Platform Open Architecture SPEA VRAD Programming LabView Compatible Colour Vision System High Speed Parallel Test Button Actuation

16. Goepel Tech Day March - 2013 - ICT 100% Test Coverage Parallel FPT & BoN Test Full Process Feedback Test time 8 Secs PROG & CAL Reduced CAL No BLF Quad Parallel Test VarioTAP Programming & CAL Tests Self Contained Instruments Test Time 40 Secs FTE Quad Parallel Test No Programming Needed Automated LCD & Button Pushing Test Time 10 Secs

17. Goepel Tech Day March - 2013 - Pros Flexibility Scalability High Speed Full Coverage Quicker Time to Market Cons Higher Cost

18. 18 For more infomation www.flyingtest.co.uk SPEA CompTest Trim RF300 SPEA 40404 Multimode SBL SPEA 3030 Test Platform Full Automtaion CableTest MPT 1000 Active Backplane t RF Functional Test Services