1 ME 381R Lecture Semiconductor Devices and Thermal Issues Dr. Li Shi Department of Mechanical Engineering The University of Texas at Austin Austin, TX Reading: & Ch. 7 in Tien et al.
2 p-n Junction w/o Bias Depletion Region
3 Biased p-n Junction
4 Metal-Oxide-Semiconductor (MOS) Capacitor : Electron Affinity Work Function Energy Band Diagram before making contact n-type
5 MOS Capacitor W/O Bias (Special Case: M = S ) Energy Band Diagram after making contact
6 Accumulation and Depletion of Majority Carriers VGVG ViVi eV G VSVS Block Charge Diagram Very thin
7 Inversion Layer: C majority carrier >C minority carrier
8 Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET)
9 Ideal MOSFET V G >0
10 Pinch-Off & IV
11 Thermal Circuit Particle transport theory Fourier ’ s law of heat conduction
12 Joule Heating in High-Field Devices Localized heat generation near the pinch-off point
13 X-Y-Z Actuator Thermometry of Nanoelectronics Sample Temperature Sensor Laser Atomic Force Microscope (AFM) + Thermal Probe Cantilever Deflection Sensing Thermal X T Topographic X Z Scanning Thermal Microscope:
14 Microfabricated Probes Pt-Cr Junction Shi, Kwon, Miner, Majumdar, J. MicroElectroMechanical Sys., 10, p. 370 (2001) 10 m Pt Line Cr Line Tip Laser Reflector SiN x Cantilever
15 Self Heating Effect on I-V
16 Optical Phonon Emission at High Field
17 Heat Transfer Path
18 Governing Equations for Electro-Thermal Simulation of Devices
19 Example
20 Computation Scheme
21 Results
22 Electric Field
23 Electron Temperature
24 Phonon Temperature