Reliability-Oriented Broadcast Electrode- Addressing for Pin-Constrained Digital Microfluidic Biochips Department of Computer Science and Information Engineering.

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Reliability-Oriented Broadcast Electrode- Addressing for Pin-Constrained Digital Microfluidic Biochips Department of Computer Science and Information Engineering National Cheng Kung University, Tainan Taiwan Tsung-Wei Huang, Tsung-Yi Ho, and Krishnendu Chakrabarty Department of Electrical and Computer Engineering Duke University, Durham, NC

IEEE/ACM ICCAD 2011 Outline ․ Introduction ․ Problems ․ Algorithm ․ Experimental results ․ Conclusion 2

IEEE/ACM ICCAD 2011 Outline ․ Introduction ․ Problems ․ Algorithm ․ Experimental results ․ Conclusion 3

IEEE/ACM ICCAD 2011 ․ Digital Microfluidic Biochips  Droplets: biological sample carrier; basic units to perform the laboratory procedures on DMFBs  2D microfluidic array: set of electrodes for biological reactions  Reservoirs/dispensing ports: for droplet generation  Optical detectors: detection of reaction result Digital Microfluidic Biochips (DMFBs) Schematic view of a DMFB (Duke Univ.) Reservoirs/Dispensing ports Optical detector Droplets Electrodes 2D microfluidic array 4

IEEE/ACM ICCAD 2011 Droplet Movement on DMFBs Side view Top view Droplet Bottom plate Top plate Ground electrode Control electrodes (cells) Hydrophobic insulation Droplet Spacing High voltage to generate an electric field Reservoir/Dispensing port Droplets Control electrodes 5 ․ Droplet movements are controlled by electrical manipulation

IEEE/ACM ICCAD 2011 Pin Assignment for Droplet Control ․ Direct-addressing method  Dedicated control pin for each electrode  Maximum freedom of droplets  High demanded control pins 6 ․ For large arrays (e.g., > 100 x 100 electrodes)  Too many control pins  high fabrication cost  Wiring plan is not available PCB design: 250 um via hole, 500 um x 500 um electrode Via Holes Wires Control pins: 24 Dedicated pin to identify the control signal

IEEE/ACM ICCAD 2011 Pin-Constrained DMFBs (PDMFBs) ․ Broadcast-addressing algorithm *[1]  A control pin is shared by multiple electrodes  Control signal/pin sharing  Flexible for pin-constrained DMFBs (PDMFBs)  Feasible for large design  Low pin-count demand reduces product cost Control pins: 24 -> 15 *[1]: T. Xu and K. Chakrabarty, DAC’08 Control signal sharing 7 A fabricated PDMFB for PCR *[2] - over 1000 electrodes - only 64 signal ports *[2] Advanced Liquid Logic, inc.

IEEE/ACM ICCAD 2011 Broadcast Electrode Addressing (1/2) ․ Broadcast-addressing  Droplet-controlling information is stored in the form of electrode actuation sequences: “1” – actuated “0” – de-actuated “X” – can be either “0” or “1” Example: A droplet routed counterclockwise on a loop of electrodes Actuation sequence 8

IEEE/ACM ICCAD 2011 Broadcast Electrode Addressing (2/2) ․ By carefully replacing these don’t care terms “X” with “1”, or “0”, multiple actuation sequences can be merged to an identical outcome ․ Assign a single control pin to multiple electrodes Actuation sequence pins compatible Compatible graph Minimum Clique Partition

IEEE/ACM ICCAD 2011 Problem of Broadcast Addressing 10 ․ Additionally shared actuations  Replacement of don’t care “X” with “1”  Different addressing results lead to different actuation demands Result 1 Result 2 Low actuation demand High actuation demand Uncareful broadcast addressing may cause excessive electrode actuations !

IEEE/ACM ICCAD 2011 ․ Faults and Errors  Irreversible charge concentration  Electrode malfunction  Stuck droplet  Erroneous assay outcome Influence of Excessive Actuations (1/2) – Trapped Charge 11 ․ Trapped-charge problem (TC problem)  A possibility for each actuation that charge becomes trapped in the insulator  A high number of actuations substantially intensifies the TC problem  Electrowetting force is proportional to (V a - V t ) 2 System/Chip reliability degradation Resolution: Minimize the number of actuations of each electrode Insulator Electrode VaVa VtVt + + Trapped charge

IEEE/ACM ICCAD ․ Residual-charge problem (RC problem)  A possibility for each actuation that charge accumulates in electrodes  Excessive actuations may lead to prolonged actuation durations  Prolonged actuations of electrodes incur the RC problem ․ Faults and errors  Ambiguous droplet movements  Unstable droplet controls  Undesirable splitting  Erroneous assay outcome Influence of Excessive Actuations (2/2) – Residual Charge System/Chip reliability degradation Resolution: Lengthen the grounding time after a long actuation duration Droplet - - Residual charge ? Unexpected movement (e.g., split or stuck)

IEEE/ACM ICCAD 2011 p2p XX011XX 0XX110XX RC problem GV insertions (a) Sequence matrix (10 time steps) e1e1 e2e2 e3e3 p1p1 p1p1 p2p2 p1p1 p1p1 p2p2 (b) f(4) = 2 (c) 2 pins (13 time steps) Avoidance of RC Problem by Grounding Vectors (GV) ․ Grounding vectors (GVs)  A control signal grounding all electrodes by additional one time step  GV function f(r): every maximally “r” actuations should be followed by at least “f(r)” grounding time steps No GV insertion p1p p1p1 p2p2 p1p1 (d) 2 pins (10 time steps) Solution of (d) is more desirable (less impact on assay time-to-response)

IEEE/ACM ICCAD Preservation of Critical Operations ․ Critical operations  Operations that require precise timing control  Operations that are highly-sensitive to timing condition  Operations that have been associated a specific/certain number of time steps for reliable execution  E.g., incubation*, PCR looping, and dispensing Incubation* *R. Sista et al., LOC’08 Grounding vectors (GVs) cannot be inserted within critical operations Antibody Magnetic bead magnet Incubation by shuttling the droplet from t 1 ~t 2 Well-mixed blood cell and magnetic bead 630 time steps

IEEE/ACM ICCAD 2011 Problem Formulation 15 ․ Input  A set of electrodes with the corresponding actuation sequences and specifications of P max and f(r) ․ Constraints  Pin constraint: Resulted pin count cannot exceed P max  Broadcast-addressing (BA) constraint: A set of electrodes can be addressed together iff their corresponding actuation sequences are mutually compatible  Residual-charge-avoidance (RCA) constraint Every r maximally continuous actuations should be followed by f(r) GVs  Critical-operation-preservation (COP) constraint GVs cannot be inserted within critical operations ․ Objective  Minimize the number of actuations of each electrode  Minimize the number of inserted GV

IEEE/ACM ICCAD 2011 Outline ․ Introduction ․ Problems ․ Algorithm ․ Experimental results ․ Conclusion 16

IEEE/ACM ICCAD Algorithm - Motivation ․ Motivation  Let L denotes the length of actuation sequences  An obvious observation that AU max * is within 0 ~ L ․ Algorithm flow  Transform the original optimization problem into a deterministic problem  Iteratively search AU max from 0 ~ L to examine the feasibility *AU max : maximum value among all numbers of actuations of each electrode

IEEE/ACM ICCAD Concept of the Proposed Algorithm (1/5) ․ Solving the deterministic problem  Decompose the original problem into several manageable subproblems  Progressively solve all subproblems * *Huang et al., ICCAD’10

IEEE/ACM ICCAD 2011 Concept of the Proposed Algorithm (2/5) ․ Progressive addressing framework  Reduces the design complexity by deriving several addressing subproblems  Iteratively selects a maximum non-compatible electrode group (from unaddressed electrode set) Facilitates the matching formulation  Minimizes the pin count 1.Maximizes the number of using existing pins for addressing  maximum matching value 2.Minimizes the numbers of required AUs and inserted GVs  minimum matching cost Minimum-Weight Maximum- Bipartite Matching 19 * Progressively includes a unaddressed electrode group for addressing * Iterations end until all electrodes are addressed Objective in each subproblem iteration: Unaddressed electrodes Existing pins

IEEE/ACM ICCAD Concept of the Proposed Algorithm (3/5) ․ Solving the subproblem  Each subproblem corresponds to a matching problem  Select a mutually-incompatible electrode group from unaddressed electrodes  Addressing can be formulated to a bipartite-matching problem Randomly selected electrode set Difficult problem formulation Solution: Select mutually-incompatible electrodes Simple bipartite-matching formulation No intra-compatibility edge

IEEE/ACM ICCAD Concept of the Proposed Algorithm (4/5) ․ Matching graph construction  Insert an edge if it meets all the following constraints: Deterministic constraint Broadcast-addressing (BA) constraint Residual-charge-avoidance (RCA) constraint Critical-operation-preservation (COP) constraint e 2 with p 3  (AU > AU max (5)) e 1 with p 1  (COP constraint violation)

IEEE/ACM ICCAD Concept of the Proposed Algorithm (5/5) ․ Minimum-Weight Maximum-Bipartite (MWMB) Matching  Construct a weighted bipartite graph to solve the problem  Key ideas Minimize the number of pins by matching value Minimize AU k and the number of inserted grounding vectors by cost

IEEE/ACM ICCAD 2011 Outline ․ Introduction ․ Problems ․ Algorithm ․ Experimental results ․ Conclusion 23

IEEE/ACM ICCAD 2011 Experimental results (1/2) ․ DNA sample preparation  86 electrodes  Limited number of 32 signal ports 24 Rarely actuated Hot actuated

IEEE/ACM ICCAD 2011 Experimental results (2/2) ․ n-plex immunoassay  1140 electrodes  Limited number of 64 control pins 25

IEEE/ACM ICCAD 2011 Experimental results (2/2) ․ Routing region ․ Reaction region 26 Excessively actuated Controlled together

IEEE/ACM ICCAD 2011 Experimental results (2/2) 27

IEEE/ACM ICCAD 2011 Outline ․ Introduction ․ Problems ․ Algorithm ․ Experimental results ․ Conclusion 28

IEEE/ACM ICCAD 2011 Conclusion ․ We have presented a novel matching-based broadcast electrode- addressing algorithm for PDMFBs to deal with the involved reliability problem in pin-constrained designs. ․ We have identified the causes of reliability degradation and introduced a new and practical formulation of reliability-oriented electrode-addressing. ․ Two commercial PDMFBs of point-of-care testing have been used to evaluate the effectiveness of our addressing algorithm on preventing pin-constrained design from reliability degradation. 29

IEEE/ACM ICCAD