7/2/2003Ivan Hruska,Francisca Calheiros1 Radiation test of components for LV power supply design  Test done in PSI 1-3.2.2003 verification and selection.

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Presentation transcript:

7/2/2003Ivan Hruska,Francisca Calheiros1 Radiation test of components for LV power supply design  Test done in PSI verification and selection of components PSI OPTIS line 60MeV beam with flux 5E8p/cm^2/s test performed during Sunday allocated 8 hours for the test Extended setup from June 2002 by second V - meter & pulse generator

7/2/2003Ivan Hruska,Francisca Calheiros2 Radiation test of components for LV power supply design  List of tests Lateral SEE test of IRFP9N60 - primary FET Basic SEE test of SUM110N05 - secondary FET (new) Basic SEE test of IR2110 & IR2213 TID/SEE test of LS373 & ALS573 TID test of 6N137 TID test of LM317 TID test of transil SMCJ15CA & SMCJ5.0CA

7/2/2003Ivan Hruska,Francisca Calheiros3 Radiation test of components for LV power supply design  Lateral SEE test of IRFS9N60A repeat of test from June 2002 in lateral direction Conditions: 200VDC Result: No SEU to 40krad Test continued with double dose till 80 krad Result : No SEU but possible SEL burn out of one resistor We have to repeat test with another setup

7/2/2003Ivan Hruska,Francisca Calheiros4 Radiation test of components for LV power supply design  Old setup OK for SEU only can’t see slow edge can’t see SEL  New MOSFET setup static design Schmitt trigger LED + counter V-meter steering

7/2/2003Ivan Hruska,Francisca Calheiros5 Radiation test of components for LV power supply design  Basic SEE test of SUM110N06 new MOSFET for rectifier ( 90% efficiency of brick !!) Conditions 40VDC ( Ubr = 60V) Result : SEE in most of channels We have replaced all MOSFETs by new pieces and tested again on 30VDC Result : No SEE !! Real working voltage <20V!

7/2/2003Ivan Hruska,Francisca Calheiros6 Radiation test of components for LV power supply design Verification of functionality of high- side driver & low-side driver Technically most difficult test 2 versions - IR2110S (600V) & IR2213S (1200V) Conditions : 200VDC, pulses going through low side & high side, capacitive load 2 x IR2110S didn’t work since start Result: No latch-up visible till 40krad, degradation of input observed, but can be used  Basic SEE test of IR2110S & IR2213S

7/2/2003Ivan Hruska,Francisca Calheiros7 Radiation test of components for LV power supply design Test setup without remote control First spot to 4 x LS373, second spot to 4x ALS573 2 pieces in Log0, 2 pieces in Log I After irradiation status & functionality tested Result for LS373: OK Result for ALS573: 1SEU ! Bipolar logic!  TID/SEE test of LS373 & ALS573

7/2/2003Ivan Hruska,Francisca Calheiros8 Radiation test of components for LV power supply design  TID test of optocoupler 6N137 8 pieces measured Visible shift of input current needed to switch output Result : Possible to use

7/2/2003Ivan Hruska,Francisca Calheiros9 Radiation test of components for LV power supply design  TID test of LM317 2 types tested 10 pieces in total/spot Output voltage and input current measured Result: EMP type is OK for the design Saving the costs by ~ 35CHF/brick (20%)

7/2/2003Ivan Hruska,Francisca Calheiros10 Radiation test of components for LV power supply design  TID test of transil SMCJ15CA & SMCJ5CA Result: No change with radiation

7/2/2003Ivan Hruska,Francisca Calheiros11 Radiation test of components for LV power supply design  Conclusion IRFS9N60 must be re-tested with new static setup New MOSFET will be tested as a spare components worse parameters than 9N60 Re-test of SUM110N06 for sure + lateral test Selected LM317EMP as a replacement of L4913 in brick design Confirmed TID & SEE parameters of other components  To do NIEL test - in preparation Re-test of MOSFETs TID test of basic chipset - statistics Brick test Preparation of production tests in radiation