Characterization of a Large Format HgCdTe on Silicon Focal Plane Array

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Presentation transcript:

Characterization of a Large Format HgCdTe on Silicon Focal Plane Array B. Hanold, J. Lee, D. Figer – Rochester Institute of Technology L. Mears, J. Bangs, E. Corrales, J. Getty, C. Keasler, M. Mitani – Raytheon Vision Systems

Outline Project overview Device design Test setup Characterization results Going forward

Project Overview HgCdTe detector cost can be reduced by using Si substrate instead of CZT Project will develop low cost infrared detectors for astronomy with long term goal of producing larger arrays enabled by using larger Si wafer Project goal is to fabricate 2K x 2K MBE HgCdTe/Si detectors with competitive performance Work is being funded by NSF and NASA to develop large format HgCdTe/Si detectors in collaboration with Raytheon Vision Systems (RVS)

Device Design Drivers Dark current and quantum efficiency identified as drivers for HgCdTe/Si design improvements Multiple pixel designs need to be tested Large amount of testing required to select optimal design

Variable Unit Cell (VUC) Devices 4 1K x 1K variable unit cell detector die 1K x 1K die fabricated with 4 unit cell designs Design allows direct comparison of detector characteristics VUC detector speeds design selection and allows more time for optimization

Detectors To Date CfD received 4 detectors from RVS: SN: 9A, 14, V1, and V2 All bonded to Virgo ROICs Current progress: Characterization of 2K x 2K HgCdTe/Si (SN: 14) Characterization of 1K x 1K HgCdTe/Si (SN: V1)

Rochester Imaging Detector Laboratory (RIDL) in The Center for Detectors (CfD) Test Results for an Array-Based GM_APD Detector Before and After Irradiation K. Kolb’s Poster L10 3 cryogenic test systems Computing cluster for data acquisition and reduction running automated test suite Test systems integrate with telescope for on-sky evaluation of detectors Test systems have been designed and used for radiation testing

Cryostat Detail Outer Case Detector Enclosure Cold Plate Filter Wheel Electrical Connectors

Detector Control Electronics ARC Gen III controller used to operate the detectors Mezzanine current source board designed for output buffer current supply ~7e- CDS noise - includes cabling Noise not increased significantly with addition of current source circuit Potentiometer SMT JFET Through Hole JFET SMT resistor

Virgo-14 Read Noise 18 e- read noise CDS 5.5 e- read noise Fowler-16 Noise may be improved with bias noise reduction

Virgo-14 Well Depth, Non-linearity, and Gain Well depth: 126 K e- Non-linearity terms: a = 1.712E-6 b = -1.59E-11

Virgo-14 Crosstalk H2RG-015-5.0µm VIRGO-14-4.9µm SB304-008-5.0µm Asymmetric crosstalk due to incomplete settling Crosstalk measured using cosmic rays in dark exposures 3 x 3 grid shows crosstalk in nearest neighbors around central hit Results given in percentage of hit signal

Virgo-14 Dark Current Virgo-14 produced for a previous RVS project .02 e-/s/pixel Virgo-14 produced for a previous RVS project Device being used as benchmark to compare future devices against Currently measuring QE and validating 4.9 µm cut-off

Going Forward Project Milestones: Characterize VUC detectors Characterize substrate removed VUC detectors Select pixel design using VUC detector performance Fabricate and characterize 2K x 2K substrate removed MBE HgCdTe/Si device Long term goals for MBE HgCdTe/Si process: Scale design to 4K x 4K and 8K x 8K Reduce pixel pitch

CfD Personnel Don Figer Joong Lee Brandon Hanold Iain Marcuson P.I. Don Figer Joong Lee Engineer Brandon Hanold Engineer Engineer Iain Marcuson PhD, IS Kim Kolb Matt Davis MS, EE BS, Physics Mike Every MS, EE Jon Zimmermann BS, EE Zach Mink BS, ME Kenneth Bean Mike Shaw BS, EET 15

Thank you for your attention. Questions?